X-ray spectroscopy from variable, Z laser-produced plasmas

R. L. Kauffman, R. W. Lee, Dennis L Matthews, J. D. Kilkenny

Research output: Contribution to journalArticle

5 Scopus citations

Abstract

We have investigated the sensitivity of X-ray line intensities as a laser-plasma diagnostic by seeding Si in CH and PbO plasmas. The Si K X-ray spectrum is measured using both time-integrating and time-resolving spectrographs to investigate the effect of time averaging on the line intensities. The measured intensities are compared with theoretical estimates for an isothermal, isodensity plasma. Si line intensities vary with the Z of the plasma, as expected from simple scaling models, indicating the Si lines can be a good plasma diagnostic. The line intensities do not predict a unique temperature and density, but, instead, the inferred temperature and density vary, depending on the line ratio used. These variations are attributed to large spatial gradients of temperature and density in the plasmas. Problems in interpretation are discussed, as well as possible directions for future experiments.

Original languageEnglish (US)
Pages (from-to)335-342
Number of pages8
JournalJournal of Quantitative Spectroscopy and Radiative Transfer
Volume32
Issue number4
DOIs
StatePublished - 1984
Externally publishedYes

ASJC Scopus subject areas

  • Spectroscopy
  • Atomic and Molecular Physics, and Optics

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