X-ray laser interferometry for probing high-density plasmas

Alan S. Wan, Luiz B. Da Silva, Troy W. Barbee, Robert C. Cauble, Peter Celliers, Stephen B. Libby, Richard A. London, Juan C. Moreno, James E. Trebes, Franz A. Weber

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

Collisionally pumped soft x-ray lasers now operate over a wavelength range extending from 4 - 40 nm. With the recent advances in the development of multilayer mirrors and beamsplitters in the soft x-ray regime, we can utilize the unique properties of x-ray lasers to study large, rapidly evolving laser-driven plasmas with high electron densities. Using a neon-like yttrium x-ray laser which operates at a wavelength of 15.5 nm, we have performed a series of x-ray laser interferometry experiments to characterize plasmas relevant to inertial confinement fusion. In this paper we describe experiments using a soft x-ray laser interferometer, operated in the Mach-Zehnder configuration, to study CH plasmas and exploding foil targets commonly used for x-ray laser targets. The two-dimensional density profiles obtained from the interferograms allow us to validate and benchmark our numerical models used to study the physics of laser-plasma interactions.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Pages268-278
Number of pages11
Volume2520
StatePublished - 1995
Externally publishedYes
EventSoft X-Ray Lasers and Applications - San Diego, CA, USA
Duration: Jul 10 1995Jul 11 1995

Other

OtherSoft X-Ray Lasers and Applications
CitySan Diego, CA, USA
Period7/10/957/11/95

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

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  • Cite this

    Wan, A. S., Da Silva, L. B., Barbee, T. W., Cauble, R. C., Celliers, P., Libby, S. B., London, R. A., Moreno, J. C., Trebes, J. E., & Weber, F. A. (1995). X-ray laser interferometry for probing high-density plasmas. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 2520, pp. 268-278)