X-ray image reconstruction from a diffraction pattern alone

S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, Aleksandr Noy, M. R. Howells, U. Weierstall, J. C H Spence

Research output: Contribution to journalArticle

500 Citations (Scopus)

Abstract

A solution to the inversion problem of scattering would offer aberration-free diffraction-limited three-dimensional images without the resolution and depth-of-field limitations of lens-based tomographic systems. Powerful algorithms are increasingly being used to act as lenses to form such images. Current image reconstruction methods, however, require the knowledge of the shape of the object and the low spatial frequencies unavoidably lost in experiments. Diffractive imaging has thus previously been used to increase the resolution of images obtained by other means. Here we experimentally demonstrate an inversion method, which reconstructs the image of the obiect without the need for any such prior knowledge.

Original languageEnglish (US)
Article number140101
Pages (from-to)1401011-1401014
Number of pages4
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume68
Issue number14
StatePublished - Oct 2003
Externally publishedYes

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image reconstruction
Image reconstruction
Diffraction patterns
Lenses
diffraction patterns
X rays
Aberrations
x rays
Diffraction
lenses
Scattering
inversions
Imaging techniques
aberration
Experiments
scattering
diffraction

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Marchesini, S., He, H., Chapman, H. N., Hau-Riege, S. P., Noy, A., Howells, M. R., ... Spence, J. C. H. (2003). X-ray image reconstruction from a diffraction pattern alone. Physical Review B - Condensed Matter and Materials Physics, 68(14), 1401011-1401014. [140101].

X-ray image reconstruction from a diffraction pattern alone. / Marchesini, S.; He, H.; Chapman, H. N.; Hau-Riege, S. P.; Noy, Aleksandr; Howells, M. R.; Weierstall, U.; Spence, J. C H.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 68, No. 14, 140101, 10.2003, p. 1401011-1401014.

Research output: Contribution to journalArticle

Marchesini, S, He, H, Chapman, HN, Hau-Riege, SP, Noy, A, Howells, MR, Weierstall, U & Spence, JCH 2003, 'X-ray image reconstruction from a diffraction pattern alone', Physical Review B - Condensed Matter and Materials Physics, vol. 68, no. 14, 140101, pp. 1401011-1401014.
Marchesini S, He H, Chapman HN, Hau-Riege SP, Noy A, Howells MR et al. X-ray image reconstruction from a diffraction pattern alone. Physical Review B - Condensed Matter and Materials Physics. 2003 Oct;68(14):1401011-1401014. 140101.
Marchesini, S. ; He, H. ; Chapman, H. N. ; Hau-Riege, S. P. ; Noy, Aleksandr ; Howells, M. R. ; Weierstall, U. ; Spence, J. C H. / X-ray image reconstruction from a diffraction pattern alone. In: Physical Review B - Condensed Matter and Materials Physics. 2003 ; Vol. 68, No. 14. pp. 1401011-1401014.
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