X and UV time resolving diagnostics for X-ray laser experiments

D. Naccach, J. L. Bourgade, P. Combis, M. Louis-Jacquet, C. Keane, B. MacGowan, Dennis L Matthews

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Instruments that combine either transmission or reflection gratings in combination with X-ray streak cameras or microchannel plate intensifiers, respectively, have been developed. Diagnostics based on conventional X-ray diffraction crystals with X-ray streak cameras as detectors have also been used. The diagnostics provide measurements of X-ray lasing output and plasma ionization kinetics for long cylindrical plasmas under the conditions necessary to produce an X-ray amplifier.

Original languageEnglish (US)
Title of host publicationIEEE Int Conf Plasma Sci 1988
Place of PublicationPiscataway, NJ, United States
PublisherPubl by IEEE
Pages63
Number of pages1
StatePublished - 1988
Externally publishedYes
EventIEEE International Conference on Plasma Science - 1988 - Seattle, WA, USA
Duration: Jun 6 1988Jun 8 1988

Other

OtherIEEE International Conference on Plasma Science - 1988
CitySeattle, WA, USA
Period6/6/886/8/88

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Naccach, D., Bourgade, J. L., Combis, P., Louis-Jacquet, M., Keane, C., MacGowan, B., & Matthews, D. L. (1988). X and UV time resolving diagnostics for X-ray laser experiments. In IEEE Int Conf Plasma Sci 1988 (pp. 63). Publ by IEEE.