Abstract
Instruments that combine either transmission or reflection gratings in combination with X-ray streak cameras or microchannel plate intensifiers, respectively, have been developed. Diagnostics based on conventional X-ray diffraction crystals with X-ray streak cameras as detectors have also been used. The diagnostics provide measurements of X-ray lasing output and plasma ionization kinetics for long cylindrical plasmas under the conditions necessary to produce an X-ray amplifier.
| Original language | English (US) |
|---|---|
| Title of host publication | IEEE Int Conf Plasma Sci 1988 |
| Place of Publication | Piscataway, NJ, United States |
| Publisher | Publ by IEEE |
| Pages | 63 |
| Number of pages | 1 |
| State | Published - 1988 |
| Externally published | Yes |
| Event | IEEE International Conference on Plasma Science - 1988 - Seattle, WA, USA Duration: Jun 6 1988 → Jun 8 1988 |
Other
| Other | IEEE International Conference on Plasma Science - 1988 |
|---|---|
| City | Seattle, WA, USA |
| Period | 6/6/88 → 6/8/88 |
ASJC Scopus subject areas
- Engineering(all)
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Cite this
Naccach, D., Bourgade, J. L., Combis, P., Louis-Jacquet, M., Keane, C., MacGowan, B., & Matthews, D. L. (1988). X and UV time resolving diagnostics for X-ray laser experiments. In IEEE Int Conf Plasma Sci 1988 (pp. 63). Publ by IEEE.