Wavelength dependent damage threshold measurements to determine initiation mechanisms

C. W. Carr, H. B. Radousky, S. G. Demos

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The laser damage threshold of KD 2PO 4, a 7.2 eV dielectric, is measured as a function of wavelength. Steps in the damage threshold at photon energies near fractions of the band gap suggesting defect assisted multi-photon damage initiation.

Original languageEnglish (US)
Title of host publicationOSA Trends in Optics and Photonics Series
PublisherOptical Society of American (OSA)
Pages2052-2053
Number of pages2
Volume88
StatePublished - 2003
Externally publishedYes
EventConference on Lasers and Electro-Optics (CLEO); Postconference Digest - Baltimore, MD, United States
Duration: Jun 1 2003Jun 6 2003

Other

OtherConference on Lasers and Electro-Optics (CLEO); Postconference Digest
CountryUnited States
CityBaltimore, MD
Period6/1/036/6/03

ASJC Scopus subject areas

  • Engineering(all)

Fingerprint Dive into the research topics of 'Wavelength dependent damage threshold measurements to determine initiation mechanisms'. Together they form a unique fingerprint.

  • Cite this

    Carr, C. W., Radousky, H. B., & Demos, S. G. (2003). Wavelength dependent damage threshold measurements to determine initiation mechanisms. In OSA Trends in Optics and Photonics Series (Vol. 88, pp. 2052-2053). Optical Society of American (OSA).