Abstract
Refractive index changes have been induced inside bulk fused silica by using femtosecond (fs) laser pulses tightly focused inside the material. Waveguides have been fabricated inside the glass by scanning the glass with respect to the focal point of the laser beam. The refractive index change is estimated to be ∼ 10 -4. Other more complex three-dimensional structures have also been fabricated (curved waveguides, splitters, and interferometers). We also report on fluorescence spectroscopy of the fs-modified fused silica using a confocal microscopy setup. Using a 488 nm excitation source, a fluorescence at 630 nm is observed from the modified glass, which is attributed to the presence of non-bridging oxygen hole center (NBOHC) defects created by the fs pulses. The fluorescence decays with prolonged exposure to the 488 nm light, indicating that the defects are being photobleached by the excitation light.
| Original language | English (US) |
|---|---|
| Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
| Editors | Y.S. Sidorin, A. Tervonen |
| Pages | 129-136 |
| Number of pages | 8 |
| Volume | 4640 |
| DOIs | |
| State | Published - 2002 |
| Event | Intergrated Optics: Devices, Materials, and Technologies VI - San Jose, CA, United States Duration: Jan 21 2002 → Jan 23 2002 |
Other
| Other | Intergrated Optics: Devices, Materials, and Technologies VI |
|---|---|
| Country | United States |
| City | San Jose, CA |
| Period | 1/21/02 → 1/23/02 |
Fingerprint
Keywords
- Confocal microscopy
- Femtosecond lasers
- Fused silica
- Laser microfabrication
- Optical device fabrication
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics
Cite this
Waveguide fabrication in fused silica using tightly focused femtosecond laser pulses. / Chan, James W; Huser, Thomas R; Risbud, Subhash H.; Krol, Denise M.
Proceedings of SPIE - The International Society for Optical Engineering. ed. / Y.S. Sidorin; A. Tervonen. Vol. 4640 2002. p. 129-136.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Waveguide fabrication in fused silica using tightly focused femtosecond laser pulses
AU - Chan, James W
AU - Huser, Thomas R
AU - Risbud, Subhash H.
AU - Krol, Denise M.
PY - 2002
Y1 - 2002
N2 - Refractive index changes have been induced inside bulk fused silica by using femtosecond (fs) laser pulses tightly focused inside the material. Waveguides have been fabricated inside the glass by scanning the glass with respect to the focal point of the laser beam. The refractive index change is estimated to be ∼ 10 -4. Other more complex three-dimensional structures have also been fabricated (curved waveguides, splitters, and interferometers). We also report on fluorescence spectroscopy of the fs-modified fused silica using a confocal microscopy setup. Using a 488 nm excitation source, a fluorescence at 630 nm is observed from the modified glass, which is attributed to the presence of non-bridging oxygen hole center (NBOHC) defects created by the fs pulses. The fluorescence decays with prolonged exposure to the 488 nm light, indicating that the defects are being photobleached by the excitation light.
AB - Refractive index changes have been induced inside bulk fused silica by using femtosecond (fs) laser pulses tightly focused inside the material. Waveguides have been fabricated inside the glass by scanning the glass with respect to the focal point of the laser beam. The refractive index change is estimated to be ∼ 10 -4. Other more complex three-dimensional structures have also been fabricated (curved waveguides, splitters, and interferometers). We also report on fluorescence spectroscopy of the fs-modified fused silica using a confocal microscopy setup. Using a 488 nm excitation source, a fluorescence at 630 nm is observed from the modified glass, which is attributed to the presence of non-bridging oxygen hole center (NBOHC) defects created by the fs pulses. The fluorescence decays with prolonged exposure to the 488 nm light, indicating that the defects are being photobleached by the excitation light.
KW - Confocal microscopy
KW - Femtosecond lasers
KW - Fused silica
KW - Laser microfabrication
KW - Optical device fabrication
UR - http://www.scopus.com/inward/record.url?scp=0036028476&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0036028476&partnerID=8YFLogxK
U2 - 10.1117/12.431872
DO - 10.1117/12.431872
M3 - Conference contribution
VL - 4640
SP - 129
EP - 136
BT - Proceedings of SPIE - The International Society for Optical Engineering
A2 - Sidorin, Y.S.
A2 - Tervonen, A.
ER -