Towards better scanning near-field optical microscopy probes - Progress and new developments

H. Heinzelmann, J. M. Freyland, R. Eckert, Thomas R Huser, G. Schürmann, W. Noell, U. Staufers, N. F. De Rooij

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

Several approaches are described with the aim of producing near-field optical probes with improved properties. Focused ion beam milling allows the fabrication of small apertures in a controlled fashion, resulting in probes with excellent polarization properties and increased transmission. Microfabrication processes are described that allow the production of apertures of 30-50 nm, facilitating the mass-fabrication of apertured tip structures that can be used in a combined force/near-field optical microscope. Finally, possible future developments are outlined.

Original languageEnglish (US)
Pages (from-to)365-368
Number of pages4
JournalJournal of Microscopy
Volume194
Issue number2-3
DOIs
StatePublished - 1999
Externally publishedYes

Fingerprint

Microtechnology
Near field scanning optical microscopy
Microscopy
near fields
apertures
Ions
microscopy
Fabrication
fabrication
scanning
probes
Microfabrication
Focused ion beams
optical microscopes
Microscopes
ion beams
Polarization
polarization

Keywords

  • Aperture formation
  • Focused ion beam milling
  • Microfabricated tips
  • Near- field optical probes
  • Polarization contrast

ASJC Scopus subject areas

  • Instrumentation

Cite this

Heinzelmann, H., Freyland, J. M., Eckert, R., Huser, T. R., Schürmann, G., Noell, W., ... De Rooij, N. F. (1999). Towards better scanning near-field optical microscopy probes - Progress and new developments. Journal of Microscopy, 194(2-3), 365-368. https://doi.org/10.1046/j.1365-2818.1999.00567.x

Towards better scanning near-field optical microscopy probes - Progress and new developments. / Heinzelmann, H.; Freyland, J. M.; Eckert, R.; Huser, Thomas R; Schürmann, G.; Noell, W.; Staufers, U.; De Rooij, N. F.

In: Journal of Microscopy, Vol. 194, No. 2-3, 1999, p. 365-368.

Research output: Contribution to journalArticle

Heinzelmann, H, Freyland, JM, Eckert, R, Huser, TR, Schürmann, G, Noell, W, Staufers, U & De Rooij, NF 1999, 'Towards better scanning near-field optical microscopy probes - Progress and new developments', Journal of Microscopy, vol. 194, no. 2-3, pp. 365-368. https://doi.org/10.1046/j.1365-2818.1999.00567.x
Heinzelmann, H. ; Freyland, J. M. ; Eckert, R. ; Huser, Thomas R ; Schürmann, G. ; Noell, W. ; Staufers, U. ; De Rooij, N. F. / Towards better scanning near-field optical microscopy probes - Progress and new developments. In: Journal of Microscopy. 1999 ; Vol. 194, No. 2-3. pp. 365-368.
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