Towards better scanning near-field optical microscopy probes - Progress and new developments

H. Heinzelmann, J. M. Freyland, R. Eckert, Thomas R Huser, G. Schürmann, W. Noell, U. Staufers, N. F. De Rooij

Research output: Contribution to journalArticle

5 Scopus citations

Abstract

Several approaches are described with the aim of producing near-field optical probes with improved properties. Focused ion beam milling allows the fabrication of small apertures in a controlled fashion, resulting in probes with excellent polarization properties and increased transmission. Microfabrication processes are described that allow the production of apertures of 30-50 nm, facilitating the mass-fabrication of apertured tip structures that can be used in a combined force/near-field optical microscope. Finally, possible future developments are outlined.

Original languageEnglish (US)
Pages (from-to)365-368
Number of pages4
JournalJournal of Microscopy
Volume194
Issue number2-3
DOIs
StatePublished - 1999
Externally publishedYes

Keywords

  • Aperture formation
  • Focused ion beam milling
  • Microfabricated tips
  • Near- field optical probes
  • Polarization contrast

ASJC Scopus subject areas

  • Instrumentation

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  • Cite this

    Heinzelmann, H., Freyland, J. M., Eckert, R., Huser, T. R., Schürmann, G., Noell, W., Staufers, U., & De Rooij, N. F. (1999). Towards better scanning near-field optical microscopy probes - Progress and new developments. Journal of Microscopy, 194(2-3), 365-368. https://doi.org/10.1046/j.1365-2818.1999.00567.x