Toward a 2-eV microcalorimeter X-ray spectrometer for Constellation-X

C. K. Stahle, S. R. Bandler, T. Barbee, J. Beeman, R. P. Brekosky, B. Cabrera, M. Cunningham, S. Deiker, E. Figueroa-Feliciano, F. M. Finkbeiner, Matthias Frank, K. C. Gendreau, E. E. Haller, G. C. Hilton, K. D. Irwin, al et al

Research output: Contribution to journalConference article

12 Citations (Scopus)

Abstract

Constellation-X is a cluster of identical observatories that together constitute a promising concept for a next-generation, high-throughout, high-resolution, astrophysical x-ray spectroscopy mission. The heart of the Constellation-X mission concept is a high-quantum-efficiency imaging spectrometer with 2 eV resolution at 6 keV. Collectively across the cluster, this imaging spectrometer will have twenty times the collecting efficiency of XRS on Astro-E and better than 0.25 arc minute imaging resolution. The spectrometer on each satellite will be able to handle count rates of up to 1000 counts per second per imaging pixel for a point source and 30 counts per second per pixel for an extended source filling the array. Focal plane coverage of at least 2.5 arc minutes × 2.5 arc minutes, comparable to XRS but with a factor of thirty more pixels, is required. This paper will present the technologies that have the potential to meet all these requirements. It will identify the ones chosen for development for Constellation-X and explain why those were considered closer to realization, and it will summarize the results of the development work thus far.

Original languageEnglish (US)
Pages (from-to)82-93
Number of pages12
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3765
StatePublished - Dec 1 1999
Externally publishedYes
EventProceedings of the 1999 EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X - Denver, CO, USA
Duration: Jul 21 1999Jul 23 1999

Fingerprint

Constellation-X
X ray spectrometers
Spectrometer
calorimeters
Imaging Spectrometer
Count
Arc of a curve
arcs
Pixel
pixels
imaging spectrometers
spectrometers
Imaging techniques
Spectrometers
Pixels
Imaging
High Resolution Spectroscopy
x rays
X-ray Spectroscopy
Quantum Efficiency

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Stahle, C. K., Bandler, S. R., Barbee, T., Beeman, J., Brekosky, R. P., Cabrera, B., ... et al, A. (1999). Toward a 2-eV microcalorimeter X-ray spectrometer for Constellation-X. Proceedings of SPIE - The International Society for Optical Engineering, 3765, 82-93.

Toward a 2-eV microcalorimeter X-ray spectrometer for Constellation-X. / Stahle, C. K.; Bandler, S. R.; Barbee, T.; Beeman, J.; Brekosky, R. P.; Cabrera, B.; Cunningham, M.; Deiker, S.; Figueroa-Feliciano, E.; Finkbeiner, F. M.; Frank, Matthias; Gendreau, K. C.; Haller, E. E.; Hilton, G. C.; Irwin, K. D.; et al, al.

In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 3765, 01.12.1999, p. 82-93.

Research output: Contribution to journalConference article

Stahle, CK, Bandler, SR, Barbee, T, Beeman, J, Brekosky, RP, Cabrera, B, Cunningham, M, Deiker, S, Figueroa-Feliciano, E, Finkbeiner, FM, Frank, M, Gendreau, KC, Haller, EE, Hilton, GC, Irwin, KD & et al, A 1999, 'Toward a 2-eV microcalorimeter X-ray spectrometer for Constellation-X', Proceedings of SPIE - The International Society for Optical Engineering, vol. 3765, pp. 82-93.
Stahle CK, Bandler SR, Barbee T, Beeman J, Brekosky RP, Cabrera B et al. Toward a 2-eV microcalorimeter X-ray spectrometer for Constellation-X. Proceedings of SPIE - The International Society for Optical Engineering. 1999 Dec 1;3765:82-93.
Stahle, C. K. ; Bandler, S. R. ; Barbee, T. ; Beeman, J. ; Brekosky, R. P. ; Cabrera, B. ; Cunningham, M. ; Deiker, S. ; Figueroa-Feliciano, E. ; Finkbeiner, F. M. ; Frank, Matthias ; Gendreau, K. C. ; Haller, E. E. ; Hilton, G. C. ; Irwin, K. D. ; et al, al. / Toward a 2-eV microcalorimeter X-ray spectrometer for Constellation-X. In: Proceedings of SPIE - The International Society for Optical Engineering. 1999 ; Vol. 3765. pp. 82-93.
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