Time-resolved spectroscopic investigation of emission observed during damage in the bulk of fused silica and DKDP crystals

C. W. Carr, H. B. Radousky, M. Staggs, A. M. Rubenchik, M. D. Feit, S. G. Demos

Research output: Chapter in Book/Report/Conference proceedingConference contribution

11 Citations (Scopus)

Abstract

We have investigated the flash of light that accompanies laser damage using time-resolved spectroscopy. Damage events were initiated in the bulk of both fused silica and DKDP crystals with 355-nm 3-ns pulsed radiation. Spectra from the accompanying flash were recorded in the 200-500 nm wavelength range with 5-ns temporal resolution. Ten ns following damage initiation, the spectra were found to be roughly blackbody with temperatures on the order of 5000 K to 7000 K, depending on the material studied and excitation energy used. The observed temperatures and cooling rates can be related to the size and electron density of the plasma "fireball" that initiates the damage event.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsG.J. Exarhos, A.H. Guenter, K.L. Lewis, M.J. Soileau, C.J. Stolz
Pages360-367
Number of pages8
Volume4679
DOIs
StatePublished - 2002
EventLaser-Induced Damage in Optical Materials: 2001 - Boulder, CO, United States
Duration: Oct 1 2001Oct 2 2001

Other

OtherLaser-Induced Damage in Optical Materials: 2001
CountryUnited States
CityBoulder, CO
Period10/1/0110/2/01

Fingerprint

Fused silica
silicon dioxide
damage
Laser damage
Crystals
flash
Excitation energy
pulsed radiation
crystals
Carrier concentration
laser damage
fireballs
Spectroscopy
Cooling
temporal resolution
Plasmas
Radiation
Wavelength
Temperature
cooling

Keywords

  • DKDP crystals
  • Fused silica
  • Spectroscopic investigation

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Carr, C. W., Radousky, H. B., Staggs, M., Rubenchik, A. M., Feit, M. D., & Demos, S. G. (2002). Time-resolved spectroscopic investigation of emission observed during damage in the bulk of fused silica and DKDP crystals. In G. J. Exarhos, A. H. Guenter, K. L. Lewis, M. J. Soileau, & C. J. Stolz (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 4679, pp. 360-367) https://doi.org/10.1117/12.461714

Time-resolved spectroscopic investigation of emission observed during damage in the bulk of fused silica and DKDP crystals. / Carr, C. W.; Radousky, H. B.; Staggs, M.; Rubenchik, A. M.; Feit, M. D.; Demos, S. G.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / G.J. Exarhos; A.H. Guenter; K.L. Lewis; M.J. Soileau; C.J. Stolz. Vol. 4679 2002. p. 360-367.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Carr, CW, Radousky, HB, Staggs, M, Rubenchik, AM, Feit, MD & Demos, SG 2002, Time-resolved spectroscopic investigation of emission observed during damage in the bulk of fused silica and DKDP crystals. in GJ Exarhos, AH Guenter, KL Lewis, MJ Soileau & CJ Stolz (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 4679, pp. 360-367, Laser-Induced Damage in Optical Materials: 2001, Boulder, CO, United States, 10/1/01. https://doi.org/10.1117/12.461714
Carr CW, Radousky HB, Staggs M, Rubenchik AM, Feit MD, Demos SG. Time-resolved spectroscopic investigation of emission observed during damage in the bulk of fused silica and DKDP crystals. In Exarhos GJ, Guenter AH, Lewis KL, Soileau MJ, Stolz CJ, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 4679. 2002. p. 360-367 https://doi.org/10.1117/12.461714
Carr, C. W. ; Radousky, H. B. ; Staggs, M. ; Rubenchik, A. M. ; Feit, M. D. ; Demos, S. G. / Time-resolved spectroscopic investigation of emission observed during damage in the bulk of fused silica and DKDP crystals. Proceedings of SPIE - The International Society for Optical Engineering. editor / G.J. Exarhos ; A.H. Guenter ; K.L. Lewis ; M.J. Soileau ; C.J. Stolz. Vol. 4679 2002. pp. 360-367
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