Time-resolved spectroscopic investigation of emission observed during damage in the bulk of fused silica and DKDP crystals

C. W. Carr, H. B. Radousky, M. Staggs, A. M. Rubenchik, M. D. Feit, S. G. Demos

Research output: Chapter in Book/Report/Conference proceedingConference contribution

11 Scopus citations

Abstract

We have investigated the flash of light that accompanies laser damage using time-resolved spectroscopy. Damage events were initiated in the bulk of both fused silica and DKDP crystals with 355-nm 3-ns pulsed radiation. Spectra from the accompanying flash were recorded in the 200-500 nm wavelength range with 5-ns temporal resolution. Ten ns following damage initiation, the spectra were found to be roughly blackbody with temperatures on the order of 5000 K to 7000 K, depending on the material studied and excitation energy used. The observed temperatures and cooling rates can be related to the size and electron density of the plasma "fireball" that initiates the damage event.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsG.J. Exarhos, A.H. Guenter, K.L. Lewis, M.J. Soileau, C.J. Stolz
Pages360-367
Number of pages8
Volume4679
DOIs
StatePublished - 2002
EventLaser-Induced Damage in Optical Materials: 2001 - Boulder, CO, United States
Duration: Oct 1 2001Oct 2 2001

Other

OtherLaser-Induced Damage in Optical Materials: 2001
CountryUnited States
CityBoulder, CO
Period10/1/0110/2/01

Keywords

  • DKDP crystals
  • Fused silica
  • Spectroscopic investigation

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

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    Carr, C. W., Radousky, H. B., Staggs, M., Rubenchik, A. M., Feit, M. D., & Demos, S. G. (2002). Time-resolved spectroscopic investigation of emission observed during damage in the bulk of fused silica and DKDP crystals. In G. J. Exarhos, A. H. Guenter, K. L. Lewis, M. J. Soileau, & C. J. Stolz (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 4679, pp. 360-367) https://doi.org/10.1117/12.461714