Time-resolved spectroscopic investigation of emission observed during damage in the bulk of fused silica and DKDP crystals

C. W. Carr; H. B. Radousky; M. Staggs; A. M. Rubenchik; M. D. Feit; S. G. Demos

doi:10.1117/12.461714

Time-resolved spectroscopic investigation of emission observed during damage in the bulk of fused silica and DKDP crystals

C. W. Carr, H. B. Radousky, M. Staggs, A. M. Rubenchik, M. D. Feit, S. G. Demos

Condensed Matter and Materials

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

11 Scopus citations

Abstract

We have investigated the flash of light that accompanies laser damage using time-resolved spectroscopy. Damage events were initiated in the bulk of both fused silica and DKDP crystals with 355-nm 3-ns pulsed radiation. Spectra from the accompanying flash were recorded in the 200-500 nm wavelength range with 5-ns temporal resolution. Ten ns following damage initiation, the spectra were found to be roughly blackbody with temperatures on the order of 5000 K to 7000 K, depending on the material studied and excitation energy used. The observed temperatures and cooling rates can be related to the size and electron density of the plasma "fireball" that initiates the damage event.

Original language	English (US)
Title of host publication	Proceedings of SPIE - The International Society for Optical Engineering
Editors	G.J. Exarhos, A.H. Guenter, K.L. Lewis, M.J. Soileau, C.J. Stolz
Pages	360-367
Number of pages	8
Volume	4679
DOIs	https://doi.org/10.1117/12.461714
State	Published - 2002
Event	Laser-Induced Damage in Optical Materials: 2001 - Boulder, CO, United States Duration: Oct 1 2001 → Oct 2 2001

Other

Other	Laser-Induced Damage in Optical Materials: 2001
Country	United States
City	Boulder, CO
Period	10/1/01 → 10/2/01

Keywords

DKDP crystals
Fused silica
Spectroscopic investigation

ASJC Scopus subject areas

Electrical and Electronic Engineering
Condensed Matter Physics

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10.1117/12.461714

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Carr, C. W., Radousky, H. B., Staggs, M., Rubenchik, A. M., Feit, M. D., & Demos, S. G. (2002). Time-resolved spectroscopic investigation of emission observed during damage in the bulk of fused silica and DKDP crystals. In G. J. Exarhos, A. H. Guenter, K. L. Lewis, M. J. Soileau, & C. J. Stolz (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 4679, pp. 360-367) https://doi.org/10.1117/12.461714

Time-resolved spectroscopic investigation of emission observed during damage in the bulk of fused silica and DKDP crystals. / Carr, C. W.; Radousky, H. B.; Staggs, M.; Rubenchik, A. M.; Feit, M. D.; Demos, S. G.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / G.J. Exarhos; A.H. Guenter; K.L. Lewis; M.J. Soileau; C.J. Stolz. Vol. 4679 2002. p. 360-367.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Carr, CW, Radousky, HB, Staggs, M, Rubenchik, AM, Feit, MD & Demos, SG 2002, Time-resolved spectroscopic investigation of emission observed during damage in the bulk of fused silica and DKDP crystals. in GJ Exarhos, AH Guenter, KL Lewis, MJ Soileau & CJ Stolz (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 4679, pp. 360-367, Laser-Induced Damage in Optical Materials: 2001, Boulder, CO, United States, 10/1/01. https://doi.org/10.1117/12.461714

Carr CW, Radousky HB, Staggs M, Rubenchik AM, Feit MD, Demos SG. Time-resolved spectroscopic investigation of emission observed during damage in the bulk of fused silica and DKDP crystals. In Exarhos GJ, Guenter AH, Lewis KL, Soileau MJ, Stolz CJ, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 4679. 2002. p. 360-367 https://doi.org/10.1117/12.461714

Carr, C. W. ; Radousky, H. B. ; Staggs, M. ; Rubenchik, A. M. ; Feit, M. D. ; Demos, S. G. / Time-resolved spectroscopic investigation of emission observed during damage in the bulk of fused silica and DKDP crystals. Proceedings of SPIE - The International Society for Optical Engineering. editor / G.J. Exarhos ; A.H. Guenter ; K.L. Lewis ; M.J. Soileau ; C.J. Stolz. Vol. 4679 2002. pp. 360-367

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