Time-dependent degradation of an ion-focused ATA beam

W. M. Fawley, J. K. Boyd, George J Caporaso, F. W. Chambers, Y. P. Chong, J. S. Hildum, P. Lee, T. J. Orzechowski, D. R. Rogers, K. W. Struve, J. T. Weir

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Detailed measurements of the time-dependent beam quality of an ATA (Advanced Test Accelerator) pulse transported on a KrF laser-photoionized benzene channel were performed. It was found that the tail portion (τ ≥ 20-30 ns) of the pulse becomes severely degraded both at high currents (I > 3 kA) and at long transport distances. Nonaxisymmetric channel ion motion is suspected as the predominant source of the problem. The authors discuss various experiments which varied laser properties (timing, fluence, profiles), background ion pressure, and electron beam current in order to study the physics behind this degradation.

Original languageEnglish (US)
Title of host publicationProc 1989 IEEE Part Accel Conf
EditorsFloyd Bennett, Joyce Kopta
Place of PublicationPiscataway, NJ, United States
PublisherPubl by IEEE
Pages1489-1491
Number of pages3
StatePublished - 1989
Externally publishedYes
EventProceedings of the 1989 IEEE Particle Accelerator Conference - Chicago, IL, USA
Duration: Mar 20 1989Mar 23 1989

Other

OtherProceedings of the 1989 IEEE Particle Accelerator Conference
CityChicago, IL, USA
Period3/20/893/23/89

Fingerprint

Particle accelerators
Degradation
Beam quality
Lasers
Ions
Electron beams
Laser pulses
Benzene
Physics
Experiments

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Fawley, W. M., Boyd, J. K., Caporaso, G. J., Chambers, F. W., Chong, Y. P., Hildum, J. S., ... Weir, J. T. (1989). Time-dependent degradation of an ion-focused ATA beam. In F. Bennett, & J. Kopta (Eds.), Proc 1989 IEEE Part Accel Conf (pp. 1489-1491). Piscataway, NJ, United States: Publ by IEEE.

Time-dependent degradation of an ion-focused ATA beam. / Fawley, W. M.; Boyd, J. K.; Caporaso, George J; Chambers, F. W.; Chong, Y. P.; Hildum, J. S.; Lee, P.; Orzechowski, T. J.; Rogers, D. R.; Struve, K. W.; Weir, J. T.

Proc 1989 IEEE Part Accel Conf. ed. / Floyd Bennett; Joyce Kopta. Piscataway, NJ, United States : Publ by IEEE, 1989. p. 1489-1491.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fawley, WM, Boyd, JK, Caporaso, GJ, Chambers, FW, Chong, YP, Hildum, JS, Lee, P, Orzechowski, TJ, Rogers, DR, Struve, KW & Weir, JT 1989, Time-dependent degradation of an ion-focused ATA beam. in F Bennett & J Kopta (eds), Proc 1989 IEEE Part Accel Conf. Publ by IEEE, Piscataway, NJ, United States, pp. 1489-1491, Proceedings of the 1989 IEEE Particle Accelerator Conference, Chicago, IL, USA, 3/20/89.
Fawley WM, Boyd JK, Caporaso GJ, Chambers FW, Chong YP, Hildum JS et al. Time-dependent degradation of an ion-focused ATA beam. In Bennett F, Kopta J, editors, Proc 1989 IEEE Part Accel Conf. Piscataway, NJ, United States: Publ by IEEE. 1989. p. 1489-1491
Fawley, W. M. ; Boyd, J. K. ; Caporaso, George J ; Chambers, F. W. ; Chong, Y. P. ; Hildum, J. S. ; Lee, P. ; Orzechowski, T. J. ; Rogers, D. R. ; Struve, K. W. ; Weir, J. T. / Time-dependent degradation of an ion-focused ATA beam. Proc 1989 IEEE Part Accel Conf. editor / Floyd Bennett ; Joyce Kopta. Piscataway, NJ, United States : Publ by IEEE, 1989. pp. 1489-1491
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