Thickness of a metallic film, in addition to its roughness, plays a significant role in SERS activity

Changwon Lee; Christopher S. Robertson; An H. Nguyen; Mehmet Kahraman; Sebastian Wachsmann-Hogiu

doi:10.1038/srep11644

Thickness of a metallic film, in addition to its roughness, plays a significant role in SERS activity

Changwon Lee, Christopher S. Robertson, An H. Nguyen, Mehmet Kahraman, Sebastian Wachsmann-Hogiu

Pathology and Laboratory Medicine

Research output: Contribution to journal › Article › peer-review

49 Scopus citations

Abstract

In this paper we evaluate the effect of roughness and thickness of silver film substrates, fabricated on glass and polydimethylsiloxane (PDMS) templates, on surface-enhanced Raman Spectroscopy (SERS) activity. While the silver substrates obtained on glass templates exhibit nm-scale roughness, the silver substrates on PDMS templates show larger roughness, on the order of 10â €‰s of nm. These roughness values do not change significantly with the thickness of the silver film. The SERS intensities of 4-Aminothiophenol (ATP) deposited on these substrates strongly depend on both roughness and thickness, with more significant contribution from the roughness on thinner films. FEM simulations of the electric field intensities on surfaces of different thicknesses for rough and flat surfaces suggest higher localized plamons on thinner, rough surfaces. This study indicates that, besides roughness, the thickness of the metallic layer plays a significant role in the SERS activity.

Original language	English (US)
Article number	11644
Journal	Scientific Reports
Volume	5
DOIs	https://doi.org/10.1038/srep11644
State	Published - Jun 29 2015

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10.1038/srep11644

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title = "Thickness of a metallic film, in addition to its roughness, plays a significant role in SERS activity",

abstract = "In this paper we evaluate the effect of roughness and thickness of silver film substrates, fabricated on glass and polydimethylsiloxane (PDMS) templates, on surface-enhanced Raman Spectroscopy (SERS) activity. While the silver substrates obtained on glass templates exhibit nm-scale roughness, the silver substrates on PDMS templates show larger roughness, on the order of 10{\^a} €‰s of nm. These roughness values do not change significantly with the thickness of the silver film. The SERS intensities of 4-Aminothiophenol (ATP) deposited on these substrates strongly depend on both roughness and thickness, with more significant contribution from the roughness on thinner films. FEM simulations of the electric field intensities on surfaces of different thicknesses for rough and flat surfaces suggest higher localized plamons on thinner, rough surfaces. This study indicates that, besides roughness, the thickness of the metallic layer plays a significant role in the SERS activity.",

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AU - Lee, Changwon

AU - Robertson, Christopher S.

AU - Nguyen, An H.

AU - Kahraman, Mehmet

AU - Wachsmann-Hogiu, Sebastian

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N2 - In this paper we evaluate the effect of roughness and thickness of silver film substrates, fabricated on glass and polydimethylsiloxane (PDMS) templates, on surface-enhanced Raman Spectroscopy (SERS) activity. While the silver substrates obtained on glass templates exhibit nm-scale roughness, the silver substrates on PDMS templates show larger roughness, on the order of 10â €‰s of nm. These roughness values do not change significantly with the thickness of the silver film. The SERS intensities of 4-Aminothiophenol (ATP) deposited on these substrates strongly depend on both roughness and thickness, with more significant contribution from the roughness on thinner films. FEM simulations of the electric field intensities on surfaces of different thicknesses for rough and flat surfaces suggest higher localized plamons on thinner, rough surfaces. This study indicates that, besides roughness, the thickness of the metallic layer plays a significant role in the SERS activity.

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