Thermal imaging investigation of modified fused silica at surface damage sites for understanding the underlying mechanisms of damage growth

R. A. Negres, M. W. Burke, P. DeMange, S. B. Sutton, M. D. Feit, S. G. Demos

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

We use an infrared thermal imaging system in combination with a fluorescence microscope to map the dynamics of the local surface temperature and fluorescence intensity under cw, UV excitation of laser-modified fused silica within a damage site. Based on a thermal diffusion model, we estimate the energy deposited via linear absorption mechanisms and derive the linear absorption coefficient of the modified material. The results indicate that the damage growth mechanism is not entirely based on linear absorption. Specifically, the absorption cross-section derived above would prove insufficient to cause a significant increase in the temperature of the modified material under nanosecond, pulsed excitation (via linear absorption at ICF laser fluences). In addition, irreversible changes in the absorption cross-section following extended cw, UV laser exposure were observed.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume6403
DOIs
StatePublished - 2007
Externally publishedYes
Event37th Annual Boulder Damage Symposium - Laser-Induced Damage in Optical Materials: 2006 - Boulder, CO, United States
Duration: Sep 25 2006Sep 27 2006

Other

Other37th Annual Boulder Damage Symposium - Laser-Induced Damage in Optical Materials: 2006
CountryUnited States
CityBoulder, CO
Period9/25/069/27/06

Fingerprint

Infrared imaging
Fused silica
silicon dioxide
damage
absorption cross sections
Lasers
Fluorescence
fluorescence
Thermal diffusion
thermal diffusion
ultraviolet lasers
Imaging systems
surface temperature
excitation
lasers
absorptivity
fluence
Microscopes
microscopes
Temperature

Keywords

  • Fused silica
  • Optical absorption coefficients
  • Surface irradiation effects of UV radiation
  • Thermal and fluorescence imaging

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Negres, R. A., Burke, M. W., DeMange, P., Sutton, S. B., Feit, M. D., & Demos, S. G. (2007). Thermal imaging investigation of modified fused silica at surface damage sites for understanding the underlying mechanisms of damage growth. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 6403). [640306] https://doi.org/10.1117/12.695476

Thermal imaging investigation of modified fused silica at surface damage sites for understanding the underlying mechanisms of damage growth. / Negres, R. A.; Burke, M. W.; DeMange, P.; Sutton, S. B.; Feit, M. D.; Demos, S. G.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6403 2007. 640306.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Negres, RA, Burke, MW, DeMange, P, Sutton, SB, Feit, MD & Demos, SG 2007, Thermal imaging investigation of modified fused silica at surface damage sites for understanding the underlying mechanisms of damage growth. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 6403, 640306, 37th Annual Boulder Damage Symposium - Laser-Induced Damage in Optical Materials: 2006, Boulder, CO, United States, 9/25/06. https://doi.org/10.1117/12.695476
Negres RA, Burke MW, DeMange P, Sutton SB, Feit MD, Demos SG. Thermal imaging investigation of modified fused silica at surface damage sites for understanding the underlying mechanisms of damage growth. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6403. 2007. 640306 https://doi.org/10.1117/12.695476
Negres, R. A. ; Burke, M. W. ; DeMange, P. ; Sutton, S. B. ; Feit, M. D. ; Demos, S. G. / Thermal imaging investigation of modified fused silica at surface damage sites for understanding the underlying mechanisms of damage growth. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6403 2007.
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