Temperature dependence of a superconducting tunnel junction x-ray detector

Lawrence J. Hiller, Simon E. Labov, Carl A. Mears, Andrew T. Barfknecht, Matthias Frank, Harrie Netel, Mark A. Lindeman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

Superconducting tunnel junctions can be used as part of a high-resolution, energy-dispersive x- ray detector. The energy of the absorbed x ray is used to break superconducting electron pairs, producing on the order of 10 6 excitations, called quasiparticles. The number of quasiparticles produced is proportional to the energy of the absorbed x ray. When a bias voltage is maintained across the barrier, these quasiparticles produce a net tunneling current. Either the peak tunneling current or the total tunneled charge may be measured to determine the energy of the absorbed x ray. The tunneling rate, and therefore the signal, is enhanced by the use of a quasiparticle trap near the tunnel barrier. The trapping efficiency is improved by decreasing the energy gap, though this reduces the maximum temperature at which the device may operate. In our niobium/aluminum configuration, we can very the energy gap in the trapping layer by varying its thickness. This paper examines the performance of two devices with 50 nm aluminum traps at temperatures ranging from 100 mK to 700 mK. We found that this device has a very good energy resolution of about 12 eV FWHM at 1 keV. This energy resolution is independent of temperature for much of this temperature range.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsOswald H. Siegmund, John V. Vallerga
Pages249-255
Number of pages7
Volume2518
StatePublished - Dec 1 1995
Externally publishedYes
EventEUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VI - San Diego, CA, USA
Duration: Jul 12 1995Jul 14 1995

Other

OtherEUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VI
CitySan Diego, CA, USA
Period7/12/957/14/95

Fingerprint

x ray detectors
Tunnel junctions
tunnel junctions
Detectors
X rays
temperature dependence
Energy gap
Aluminum
Temperature
energy
Bias voltage
Full width at half maximum
Niobium
trapping
traps
aluminum
Tunnels
x rays
temperature
niobium

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Hiller, L. J., Labov, S. E., Mears, C. A., Barfknecht, A. T., Frank, M., Netel, H., & Lindeman, M. A. (1995). Temperature dependence of a superconducting tunnel junction x-ray detector. In O. H. Siegmund, & J. V. Vallerga (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 2518, pp. 249-255)

Temperature dependence of a superconducting tunnel junction x-ray detector. / Hiller, Lawrence J.; Labov, Simon E.; Mears, Carl A.; Barfknecht, Andrew T.; Frank, Matthias; Netel, Harrie; Lindeman, Mark A.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / Oswald H. Siegmund; John V. Vallerga. Vol. 2518 1995. p. 249-255.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hiller, LJ, Labov, SE, Mears, CA, Barfknecht, AT, Frank, M, Netel, H & Lindeman, MA 1995, Temperature dependence of a superconducting tunnel junction x-ray detector. in OH Siegmund & JV Vallerga (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 2518, pp. 249-255, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VI, San Diego, CA, USA, 7/12/95.
Hiller LJ, Labov SE, Mears CA, Barfknecht AT, Frank M, Netel H et al. Temperature dependence of a superconducting tunnel junction x-ray detector. In Siegmund OH, Vallerga JV, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 2518. 1995. p. 249-255
Hiller, Lawrence J. ; Labov, Simon E. ; Mears, Carl A. ; Barfknecht, Andrew T. ; Frank, Matthias ; Netel, Harrie ; Lindeman, Mark A. / Temperature dependence of a superconducting tunnel junction x-ray detector. Proceedings of SPIE - The International Society for Optical Engineering. editor / Oswald H. Siegmund ; John V. Vallerga. Vol. 2518 1995. pp. 249-255
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