Abstract
We report a scheme to achieve resolution beyond the diffraction limit in spatial light interference microscopy (SLIM). By adding a grating to the optical path, the structured illumination technique can be used to improve the resolution by a factor of 2. We show that a direct application of the structured illumination technique, however, has proved to be unsuccessful. Through two crucial modifications, namel y, one to the pupil plane of the objective and the other to the demodulation procedure, faithful phase information of the object is recovered and the resolution is improved by a factor of 2.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 344-351 |
| Number of pages | 8 |
| Journal | Journal of the Optical Society of America A: Optics and Image Science, and Vision |
| Volume | 29 |
| Issue number | 3 |
| DOIs | |
| State | Published - 2012 |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Electronic, Optical and Magnetic Materials
- Computer Vision and Pattern Recognition
- Medicine(all)
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Chu, K., Smith, Z. J., Wachsmann-Hogiu, S., & Lane, S. (2012). Super-resolved spatial light interference microscopy. Journal of the Optical Society of America A: Optics and Image Science, and Vision, 29(3), 344-351. https://doi.org/10.1364/JOSAA.29.000344