Substrate topography guides pore morphology evolution in nanoporous gold thin films

Christopher A.R. Chapman, Pallavi Daggumati, Shannon C. Gott, Masaru P. Rao, Erkin Seker

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

This paper illustrates the effect of substrate topography on morphology evolution in nanoporous gold (np-Au) thin films. One micron-high silicon ridges with widths varying between 150 nm and 50 μm were fabricated and coated with 500 nm-thick np-Au films obtained by dealloying sputtered gold-silver alloy films. Analysis of scanning electron micrographs of the np-Au films following dealloying and thermal annealing revealed two distinct regimes where the ratio of film thickness to ridge width determines the morphological evolution of np-Au films.

Original languageEnglish (US)
Pages (from-to)33-36
Number of pages4
JournalScripta Materialia
Volume110
DOIs
StatePublished - Jan 1 2016

Fingerprint

Gold
Topography
topography
gold
porosity
Thin films
Substrates
thin films
ridges
Silver alloys
Gold alloys
silver alloys
gold alloys
Silicon
Film thickness
film thickness
Annealing
Scanning
annealing
scanning

Keywords

  • Annealing
  • Dealloying
  • Fracture
  • Microfabrication
  • Nanoporous material

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics

Cite this

Substrate topography guides pore morphology evolution in nanoporous gold thin films. / Chapman, Christopher A.R.; Daggumati, Pallavi; Gott, Shannon C.; Rao, Masaru P.; Seker, Erkin.

In: Scripta Materialia, Vol. 110, 01.01.2016, p. 33-36.

Research output: Contribution to journalArticle

Chapman, Christopher A.R. ; Daggumati, Pallavi ; Gott, Shannon C. ; Rao, Masaru P. ; Seker, Erkin. / Substrate topography guides pore morphology evolution in nanoporous gold thin films. In: Scripta Materialia. 2016 ; Vol. 110. pp. 33-36.
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