Structure and thermoelectric characterization of AxBa 8-xAl14Si31 (A = Sr, Eu) single crystals

Cathie L. Condron, Susan M. Kauzlarich, G. S. Nolas

Research output: Contribution to journalArticlepeer-review

40 Scopus citations


Single crystals of AxBa8-xAl14Si 31 (A = Sr, Eu) were grown using a molten Al flux technique. Single-crystal X-ray diffraction confirms that AxBa 8-xAl14Si31 (A = Sr, Eu) crystallize with the type I clathrate structure, and phase purity was determined with powder X-ray diffraction. Stoichiometry was determined to be Sr0.7Ba 7.3Al14Si31 and Eu0.3Ba 7.7-Al14Si31 by electron microprobe analysis. These AxBa8-xAl14Si31 phases can be described as framework-deficient clathrate type I structures with the general formula, AxBa8-xAlySi42-3y/4[] 4-1/4y. DSC measurements indicate that these phases melt congruently at 1413 and 1415 K for Sr0.7Ba7.3Al14Si 31 and Eu0.3Ba7.7Al14Si 31, respectively. Temperature-dependent resistivity indicates metallic behavior, and the negative Seebeck coefficient indicates transport processes dominated by electrons as carriers. Thermal conductivity of these phases remains low with Sr0.7Ba7.3-Al14Si 31 having the lowest values.

Original languageEnglish (US)
Pages (from-to)2556-2562
Number of pages7
JournalInorganic Chemistry
Issue number7
StatePublished - Apr 2 2007

ASJC Scopus subject areas

  • Inorganic Chemistry


Dive into the research topics of 'Structure and thermoelectric characterization of AxBa 8-xAl14Si31 (A = Sr, Eu) single crystals'. Together they form a unique fingerprint.

Cite this