Abstract
Single crystals of AxBa8-xAl14Si 31 (A = Sr, Eu) were grown using a molten Al flux technique. Single-crystal X-ray diffraction confirms that AxBa 8-xAl14Si31 (A = Sr, Eu) crystallize with the type I clathrate structure, and phase purity was determined with powder X-ray diffraction. Stoichiometry was determined to be Sr0.7Ba 7.3Al14Si31 and Eu0.3Ba 7.7-Al14Si31 by electron microprobe analysis. These AxBa8-xAl14Si31 phases can be described as framework-deficient clathrate type I structures with the general formula, AxBa8-xAlySi42-3y/4[] 4-1/4y. DSC measurements indicate that these phases melt congruently at 1413 and 1415 K for Sr0.7Ba7.3Al14Si 31 and Eu0.3Ba7.7Al14Si 31, respectively. Temperature-dependent resistivity indicates metallic behavior, and the negative Seebeck coefficient indicates transport processes dominated by electrons as carriers. Thermal conductivity of these phases remains low with Sr0.7Ba7.3-Al14Si 31 having the lowest values.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 2556-2562 |
| Number of pages | 7 |
| Journal | Inorganic Chemistry |
| Volume | 46 |
| Issue number | 7 |
| DOIs | |
| State | Published - Apr 2 2007 |
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- Inorganic Chemistry
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Structure and thermoelectric characterization of AxBa 8-xAl14Si31 (A = Sr, Eu) single crystals. / Condron, Cathie L.; Kauzlarich, Susan M.; Nolas, G. S.
In: Inorganic Chemistry, Vol. 46, No. 7, 02.04.2007, p. 2556-2562.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Structure and thermoelectric characterization of AxBa 8-xAl14Si31 (A = Sr, Eu) single crystals
AU - Condron, Cathie L.
AU - Kauzlarich, Susan M.
AU - Nolas, G. S.
PY - 2007/4/2
Y1 - 2007/4/2
N2 - Single crystals of AxBa8-xAl14Si 31 (A = Sr, Eu) were grown using a molten Al flux technique. Single-crystal X-ray diffraction confirms that AxBa 8-xAl14Si31 (A = Sr, Eu) crystallize with the type I clathrate structure, and phase purity was determined with powder X-ray diffraction. Stoichiometry was determined to be Sr0.7Ba 7.3Al14Si31 and Eu0.3Ba 7.7-Al14Si31 by electron microprobe analysis. These AxBa8-xAl14Si31 phases can be described as framework-deficient clathrate type I structures with the general formula, AxBa8-xAlySi42-3y/4[] 4-1/4y. DSC measurements indicate that these phases melt congruently at 1413 and 1415 K for Sr0.7Ba7.3Al14Si 31 and Eu0.3Ba7.7Al14Si 31, respectively. Temperature-dependent resistivity indicates metallic behavior, and the negative Seebeck coefficient indicates transport processes dominated by electrons as carriers. Thermal conductivity of these phases remains low with Sr0.7Ba7.3-Al14Si 31 having the lowest values.
AB - Single crystals of AxBa8-xAl14Si 31 (A = Sr, Eu) were grown using a molten Al flux technique. Single-crystal X-ray diffraction confirms that AxBa 8-xAl14Si31 (A = Sr, Eu) crystallize with the type I clathrate structure, and phase purity was determined with powder X-ray diffraction. Stoichiometry was determined to be Sr0.7Ba 7.3Al14Si31 and Eu0.3Ba 7.7-Al14Si31 by electron microprobe analysis. These AxBa8-xAl14Si31 phases can be described as framework-deficient clathrate type I structures with the general formula, AxBa8-xAlySi42-3y/4[] 4-1/4y. DSC measurements indicate that these phases melt congruently at 1413 and 1415 K for Sr0.7Ba7.3Al14Si 31 and Eu0.3Ba7.7Al14Si 31, respectively. Temperature-dependent resistivity indicates metallic behavior, and the negative Seebeck coefficient indicates transport processes dominated by electrons as carriers. Thermal conductivity of these phases remains low with Sr0.7Ba7.3-Al14Si 31 having the lowest values.
UR - http://www.scopus.com/inward/record.url?scp=34247127764&partnerID=8YFLogxK
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U2 - 10.1021/ic062115v
DO - 10.1021/ic062115v
M3 - Article
C2 - 17284029
AN - SCOPUS:34247127764
VL - 46
SP - 2556
EP - 2562
JO - Inorganic Chemistry
JF - Inorganic Chemistry
SN - 0020-1669
IS - 7
ER -