Structural identification of recombinant HEV VLP C-terminus

C. Y J Wang, L. Xing, T. C. Li, N. Takeda, Y. Yasutomi, D. J. Schofield, S. U. Emerson, R. H. Purcell, T. Miyamura, R. H. Cheng

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)416-417
Number of pages2
JournalMicroscopy and Microanalysis
Volume12
Issue numberSUPPL. 2
DOIs
StatePublished - Aug 2006

ASJC Scopus subject areas

  • Instrumentation

Cite this

Wang, C. Y. J., Xing, L., Li, T. C., Takeda, N., Yasutomi, Y., Schofield, D. J., Emerson, S. U., Purcell, R. H., Miyamura, T., & Cheng, R. H. (2006). Structural identification of recombinant HEV VLP C-terminus. Microscopy and Microanalysis, 12(SUPPL. 2), 416-417. https://doi.org/10.1017/S1431927606060521