Structural defects in self-assembled organic monolayers via combined atomic beam and x-ray diffraction

N. Camillone, C. E D Chidsey, P. Eisenberger, P. Fenter, J. Li, K. S. Liang, Gang-yu Liu, G. Scoles

Research output: Contribution to journalArticle

129 Citations (Scopus)

Abstract

We present the results of a combined He atom and x-ray diffraction study of CH3 (CH2)n-1SH monolayers self assembled on Au(111) surfaces. By combining these two complementary probes, we have characterized both the surface and the interior structure of the monolayers. In both cases, we find the same structure containing four molecules per unit mesh. However, we demonstrate that there are significant differences in both the diffraction linewidths and the dependence of the linewidth upon chain length for these two techniques.

Original languageEnglish (US)
Pages (from-to)744-747
Number of pages4
JournalThe Journal of Chemical Physics
Volume99
Issue number1
StatePublished - 1993
Externally publishedYes

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Atomic beams
atomic beams
Linewidth
Monolayers
x ray diffraction
Diffraction
X rays
Defects
defects
Self assembled monolayers
Chain length
mesh
Atoms
Molecules
probes
diffraction
atoms
molecules

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Camillone, N., Chidsey, C. E. D., Eisenberger, P., Fenter, P., Li, J., Liang, K. S., ... Scoles, G. (1993). Structural defects in self-assembled organic monolayers via combined atomic beam and x-ray diffraction. The Journal of Chemical Physics, 99(1), 744-747.

Structural defects in self-assembled organic monolayers via combined atomic beam and x-ray diffraction. / Camillone, N.; Chidsey, C. E D; Eisenberger, P.; Fenter, P.; Li, J.; Liang, K. S.; Liu, Gang-yu; Scoles, G.

In: The Journal of Chemical Physics, Vol. 99, No. 1, 1993, p. 744-747.

Research output: Contribution to journalArticle

Camillone, N, Chidsey, CED, Eisenberger, P, Fenter, P, Li, J, Liang, KS, Liu, G & Scoles, G 1993, 'Structural defects in self-assembled organic monolayers via combined atomic beam and x-ray diffraction', The Journal of Chemical Physics, vol. 99, no. 1, pp. 744-747.
Camillone N, Chidsey CED, Eisenberger P, Fenter P, Li J, Liang KS et al. Structural defects in self-assembled organic monolayers via combined atomic beam and x-ray diffraction. The Journal of Chemical Physics. 1993;99(1):744-747.
Camillone, N. ; Chidsey, C. E D ; Eisenberger, P. ; Fenter, P. ; Li, J. ; Liang, K. S. ; Liu, Gang-yu ; Scoles, G. / Structural defects in self-assembled organic monolayers via combined atomic beam and x-ray diffraction. In: The Journal of Chemical Physics. 1993 ; Vol. 99, No. 1. pp. 744-747.
@article{cec68726e4304aab9811af17dcab38be,
title = "Structural defects in self-assembled organic monolayers via combined atomic beam and x-ray diffraction",
abstract = "We present the results of a combined He atom and x-ray diffraction study of CH3 (CH2)n-1SH monolayers self assembled on Au(111) surfaces. By combining these two complementary probes, we have characterized both the surface and the interior structure of the monolayers. In both cases, we find the same structure containing four molecules per unit mesh. However, we demonstrate that there are significant differences in both the diffraction linewidths and the dependence of the linewidth upon chain length for these two techniques.",
author = "N. Camillone and Chidsey, {C. E D} and P. Eisenberger and P. Fenter and J. Li and Liang, {K. S.} and Gang-yu Liu and G. Scoles",
year = "1993",
language = "English (US)",
volume = "99",
pages = "744--747",
journal = "Journal of Chemical Physics",
issn = "0021-9606",
publisher = "American Institute of Physics Publising LLC",
number = "1",

}

TY - JOUR

T1 - Structural defects in self-assembled organic monolayers via combined atomic beam and x-ray diffraction

AU - Camillone, N.

AU - Chidsey, C. E D

AU - Eisenberger, P.

AU - Fenter, P.

AU - Li, J.

AU - Liang, K. S.

AU - Liu, Gang-yu

AU - Scoles, G.

PY - 1993

Y1 - 1993

N2 - We present the results of a combined He atom and x-ray diffraction study of CH3 (CH2)n-1SH monolayers self assembled on Au(111) surfaces. By combining these two complementary probes, we have characterized both the surface and the interior structure of the monolayers. In both cases, we find the same structure containing four molecules per unit mesh. However, we demonstrate that there are significant differences in both the diffraction linewidths and the dependence of the linewidth upon chain length for these two techniques.

AB - We present the results of a combined He atom and x-ray diffraction study of CH3 (CH2)n-1SH monolayers self assembled on Au(111) surfaces. By combining these two complementary probes, we have characterized both the surface and the interior structure of the monolayers. In both cases, we find the same structure containing four molecules per unit mesh. However, we demonstrate that there are significant differences in both the diffraction linewidths and the dependence of the linewidth upon chain length for these two techniques.

UR - http://www.scopus.com/inward/record.url?scp=0041536605&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0041536605&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0041536605

VL - 99

SP - 744

EP - 747

JO - Journal of Chemical Physics

JF - Journal of Chemical Physics

SN - 0021-9606

IS - 1

ER -