Single particle X-ray diffractive imaging

Michael J. Bogan, W. Henry Benner, Sébastien Boulet, Urs Rohner, Matthias Frank, Anton Barty, M. Marvin Seibert, Filipe Maia, Stefano Marchesini, Saša Bajt, Bruce Woods, Vincent Riot, Stefan P. Hau-Riege, Martin Svenda, Erik Marklund, Eberhard Spiller, Janos Hajdu, Henry N. Chapman

Research output: Contribution to journalArticle

186 Scopus citations

Abstract

In nanotechnology, strategies for the creation and manipulation of nanoparticles in the gas phase are critically important for surface modification and substrate-free characterization. Recent coherent diffractive imaging with intense femtosecond X-ray pulses has verified the capability of single-shot imaging of nanoscale objects at suboptical resolutions beyond the radiation-induced damage threshold. By intercepting electrospraygenerated particles with a single 15 femtosecond soft-X-ray pulse, we demonstrate diffractive imaging of a nanoscale specimen in free flight for the first time, an important step toward imaging uncrystaliized biomolecules.

Original languageEnglish (US)
Pages (from-to)310-316
Number of pages7
JournalNano Letters
Volume8
Issue number1
DOIs
StatePublished - Jan 1 2008
Externally publishedYes

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ASJC Scopus subject areas

  • Bioengineering
  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanical Engineering

Cite this

Bogan, M. J., Benner, W. H., Boulet, S., Rohner, U., Frank, M., Barty, A., Marvin Seibert, M., Maia, F., Marchesini, S., Bajt, S., Woods, B., Riot, V., Hau-Riege, S. P., Svenda, M., Marklund, E., Spiller, E., Hajdu, J., & Chapman, H. N. (2008). Single particle X-ray diffractive imaging. Nano Letters, 8(1), 310-316. https://doi.org/10.1021/nl072728k