Simple: Structured illumination based point localization estimator with enhanced precision

Loïc Reymond, Johannes Ziegler, Christian Knapp, Fung Chen Wang, Thomas R Huser, Verena Ruprecht, Stefan Wieser

Research output: Contribution to journalArticle

Abstract

We present a structured illumination microscopy based point localization estimator (SIMPLE) that achieves a 2-fold increase in single molecule localization precision compared to conventional centroid estimation methods. SIMPLE advances the recently introduced MINFLUX concept by using precisely phase-shifted sinusoidal wave patterns as nanometric rulers for simultaneous particle localization based on photon count variation over a 20 µm field of view. We validate SIMPLE in silico and experimentally on a TIRF-SIM setup using a digital micro-mirror device (DMD) as a spatial light modulator.

Original languageEnglish (US)
Pages (from-to)24578-24590
Number of pages13
JournalOptics Express
Volume27
Issue number17
DOIs
StatePublished - Aug 19 2019

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estimators
illumination
microscopy
SIM
light modulators
centroids
field of view
mirrors
photons
molecules

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Reymond, L., Ziegler, J., Knapp, C., Wang, F. C., Huser, T. R., Ruprecht, V., & Wieser, S. (2019). Simple: Structured illumination based point localization estimator with enhanced precision. Optics Express, 27(17), 24578-24590. https://doi.org/10.1364/OE.27.024578

Simple : Structured illumination based point localization estimator with enhanced precision. / Reymond, Loïc; Ziegler, Johannes; Knapp, Christian; Wang, Fung Chen; Huser, Thomas R; Ruprecht, Verena; Wieser, Stefan.

In: Optics Express, Vol. 27, No. 17, 19.08.2019, p. 24578-24590.

Research output: Contribution to journalArticle

Reymond, L, Ziegler, J, Knapp, C, Wang, FC, Huser, TR, Ruprecht, V & Wieser, S 2019, 'Simple: Structured illumination based point localization estimator with enhanced precision', Optics Express, vol. 27, no. 17, pp. 24578-24590. https://doi.org/10.1364/OE.27.024578
Reymond L, Ziegler J, Knapp C, Wang FC, Huser TR, Ruprecht V et al. Simple: Structured illumination based point localization estimator with enhanced precision. Optics Express. 2019 Aug 19;27(17):24578-24590. https://doi.org/10.1364/OE.27.024578
Reymond, Loïc ; Ziegler, Johannes ; Knapp, Christian ; Wang, Fung Chen ; Huser, Thomas R ; Ruprecht, Verena ; Wieser, Stefan. / Simple : Structured illumination based point localization estimator with enhanced precision. In: Optics Express. 2019 ; Vol. 27, No. 17. pp. 24578-24590.
@article{89b81c6b0c8946e686c729996679789a,
title = "Simple: Structured illumination based point localization estimator with enhanced precision",
abstract = "We present a structured illumination microscopy based point localization estimator (SIMPLE) that achieves a 2-fold increase in single molecule localization precision compared to conventional centroid estimation methods. SIMPLE advances the recently introduced MINFLUX concept by using precisely phase-shifted sinusoidal wave patterns as nanometric rulers for simultaneous particle localization based on photon count variation over a 20 µm field of view. We validate SIMPLE in silico and experimentally on a TIRF-SIM setup using a digital micro-mirror device (DMD) as a spatial light modulator.",
author = "Lo{\"i}c Reymond and Johannes Ziegler and Christian Knapp and Wang, {Fung Chen} and Huser, {Thomas R} and Verena Ruprecht and Stefan Wieser",
year = "2019",
month = "8",
day = "19",
doi = "10.1364/OE.27.024578",
language = "English (US)",
volume = "27",
pages = "24578--24590",
journal = "Optics Express",
issn = "1094-4087",
publisher = "The Optical Society",
number = "17",

}

TY - JOUR

T1 - Simple

T2 - Structured illumination based point localization estimator with enhanced precision

AU - Reymond, Loïc

AU - Ziegler, Johannes

AU - Knapp, Christian

AU - Wang, Fung Chen

AU - Huser, Thomas R

AU - Ruprecht, Verena

AU - Wieser, Stefan

PY - 2019/8/19

Y1 - 2019/8/19

N2 - We present a structured illumination microscopy based point localization estimator (SIMPLE) that achieves a 2-fold increase in single molecule localization precision compared to conventional centroid estimation methods. SIMPLE advances the recently introduced MINFLUX concept by using precisely phase-shifted sinusoidal wave patterns as nanometric rulers for simultaneous particle localization based on photon count variation over a 20 µm field of view. We validate SIMPLE in silico and experimentally on a TIRF-SIM setup using a digital micro-mirror device (DMD) as a spatial light modulator.

AB - We present a structured illumination microscopy based point localization estimator (SIMPLE) that achieves a 2-fold increase in single molecule localization precision compared to conventional centroid estimation methods. SIMPLE advances the recently introduced MINFLUX concept by using precisely phase-shifted sinusoidal wave patterns as nanometric rulers for simultaneous particle localization based on photon count variation over a 20 µm field of view. We validate SIMPLE in silico and experimentally on a TIRF-SIM setup using a digital micro-mirror device (DMD) as a spatial light modulator.

UR - http://www.scopus.com/inward/record.url?scp=85071083671&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85071083671&partnerID=8YFLogxK

U2 - 10.1364/OE.27.024578

DO - 10.1364/OE.27.024578

M3 - Article

AN - SCOPUS:85071083671

VL - 27

SP - 24578

EP - 24590

JO - Optics Express

JF - Optics Express

SN - 1094-4087

IS - 17

ER -