Simple: Structured illumination based point localization estimator with enhanced precision

Loïc Reymond, Johannes Ziegler, Christian Knapp, Fung Chen Wang, Thomas Huser, Verena Ruprecht, Stefan Wieser

Research output: Contribution to journalArticle

1 Scopus citations

Abstract

We present a structured illumination microscopy based point localization estimator (SIMPLE) that achieves a 2-fold increase in single molecule localization precision compared to conventional centroid estimation methods. SIMPLE advances the recently introduced MINFLUX concept by using precisely phase-shifted sinusoidal wave patterns as nanometric rulers for simultaneous particle localization based on photon count variation over a 20 µm field of view. We validate SIMPLE in silico and experimentally on a TIRF-SIM setup using a digital micro-mirror device (DMD) as a spatial light modulator.

Original languageEnglish (US)
Pages (from-to)24578-24590
Number of pages13
JournalOptics Express
Volume27
Issue number17
DOIs
StatePublished - Aug 19 2019
Externally publishedYes

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Reymond, L., Ziegler, J., Knapp, C., Wang, F. C., Huser, T., Ruprecht, V., & Wieser, S. (2019). Simple: Structured illumination based point localization estimator with enhanced precision. Optics Express, 27(17), 24578-24590. https://doi.org/10.1364/OE.27.024578