Abstract
A previously reported semi-analytical expression for calculating the point spread function (PSF) of singly scattered x-ray radiation is shown to exhibit excellent correspondence with Monte Carlo-determined PSFs where only single scatter was allowed to occur. A neural network was trained to transform the semi-analytic single scatter PSF to the PSF for both single and multiple scatter. Using comparisons between the semi-analytic/neural network generated and the Monte Carlo generated PSFs, excellent agreement was found. The technique proposed here appears to be an accurate method for rapidly calculating the scatter PSF from three physical parameters, and such a formulism should be useful in algorithms designed to correct for scattered radiation effects in digital images.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 220-231 |
| Number of pages | 12 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 1092 |
| DOIs | |
| State | Published - May 25 1989 |
| Event | Medical Imaging III: Image Processing 1989 - Newport Beach, United States Duration: Jan 29 1989 → Feb 3 1989 |
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ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering
Cite this
Semi-analytical model of the point spread function of scattered radiation including a multiple scattering term. / Boone, John M.; Seibert, James A.
In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 1092, 25.05.1989, p. 220-231.Research output: Contribution to journal › Conference article
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TY - JOUR
T1 - Semi-analytical model of the point spread function of scattered radiation including a multiple scattering term
AU - Boone, John M.
AU - Seibert, James A.
PY - 1989/5/25
Y1 - 1989/5/25
N2 - A previously reported semi-analytical expression for calculating the point spread function (PSF) of singly scattered x-ray radiation is shown to exhibit excellent correspondence with Monte Carlo-determined PSFs where only single scatter was allowed to occur. A neural network was trained to transform the semi-analytic single scatter PSF to the PSF for both single and multiple scatter. Using comparisons between the semi-analytic/neural network generated and the Monte Carlo generated PSFs, excellent agreement was found. The technique proposed here appears to be an accurate method for rapidly calculating the scatter PSF from three physical parameters, and such a formulism should be useful in algorithms designed to correct for scattered radiation effects in digital images.
AB - A previously reported semi-analytical expression for calculating the point spread function (PSF) of singly scattered x-ray radiation is shown to exhibit excellent correspondence with Monte Carlo-determined PSFs where only single scatter was allowed to occur. A neural network was trained to transform the semi-analytic single scatter PSF to the PSF for both single and multiple scatter. Using comparisons between the semi-analytic/neural network generated and the Monte Carlo generated PSFs, excellent agreement was found. The technique proposed here appears to be an accurate method for rapidly calculating the scatter PSF from three physical parameters, and such a formulism should be useful in algorithms designed to correct for scattered radiation effects in digital images.
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UR - http://www.scopus.com/inward/citedby.url?scp=85076959070&partnerID=8YFLogxK
U2 - 10.1117/12.953263
DO - 10.1117/12.953263
M3 - Conference article
AN - SCOPUS:85076959070
VL - 1092
SP - 220
EP - 231
JO - Proceedings of SPIE - The International Society for Optical Engineering
JF - Proceedings of SPIE - The International Society for Optical Engineering
SN - 0277-786X
ER -