Scanning near-field optical microscopy (SNOM) and its application in mineralogy

W. Gutmannsbauer, Thomas R Huser, T. Lacoste, H. Heinzelmann, H. J. Guntherodt

Research output: Contribution to journalArticlepeer-review

6 Scopus citations


Scanning near-field optical microscopy (SNOM) is a member of the family of scanning probe microscopes. It combines the high three-dimensional resolution of a scanning force microscope with the contrast mechanisms of an optical microscope. An optical resolution beyond the diffraction limit can be achieved. We show the first application of this technique in the field of mineralogy, and we point out its future potential. -Authors

Original languageEnglish (US)
Pages (from-to)259-264
Number of pages6
JournalSchweizerische Mineralogische und Petrographische Mitteilungen
Issue number2
StatePublished - 1995
Externally publishedYes

ASJC Scopus subject areas

  • Geochemistry and Petrology
  • Geology


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