Sacrificial tamper slows down sample explosion in FLASH dffraction eperiments

Stefan P. Hau-Riege, Sébastien Boutet, Anton Barty, Saša Bajt, Michael J. Bogan, Matthias Frank, Jakob Andreasson, Bianca Iwan, M. Marvin Seibert, Janos Hajdu, Anne Sakdinawat, Joachim Schulz, Rolf Treusch, Henry N. Chapman

Research output: Contribution to journalArticlepeer-review

42 Scopus citations


Intense and ultrashort x-ray pulses from free-electron lasers open up the possibility for near-atomic resolution imaging without the need for crystallization. Such experiments require high photon fluences and pulses shorter than the time to destroy the sample. We describe results with a new femtosecond pump-probe diffraction technique employing coherent 0.1 keV x rays from the FLASH soft x-ray free-electron laser. We show that the lifetime of a nanostructured sample can be extended to several picoseconds by a tamper layer to dampen and quench the sample explosion, making <1nm resolution imaging feasible.

Original languageEnglish (US)
Article number064801
JournalPhysical Review Letters
Issue number6
StatePublished - Feb 12 2010
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)


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