Role of x-ray-induced damage in biological micro-imaging

Richard A. London, James E. Trebes, Chris J. Jacobsen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Citations (Scopus)

Abstract

Interactions of x rays with a sample are studied to determine the optimal wavelength, source energy, and exposure time for microscopy and holography. The optimal wavelength is influenced by two criteria: minimizing the required source energy and minimizing the absorbed dose and subsequent damage to the sample. The use of heavy element labels, such as colloidal gold, can significantly reduce the energy and dose. Limits to the exposure time due to natural motions, x-ray induced chemical damage, heat build-up, and hydrodynamic expansion are discussed.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Place of PublicationBellingham, WA, United States
PublisherPubl by Int Soc for Optical Engineering
Pages333-340
Number of pages8
Volume1741
ISBN (Print)0819409146
StatePublished - 1993
Externally publishedYes
EventSoft X-Ray Microscopy - San Diego, CA, USA
Duration: Jul 19 1992Jul 21 1992

Other

OtherSoft X-Ray Microscopy
CitySan Diego, CA, USA
Period7/19/927/21/92

Fingerprint

energy sources
damage
Imaging techniques
X rays
Wavelength
dosage
Holography
heavy elements
wavelengths
holography
Labels
Microscopic examination
x rays
Hydrodynamics
Gold
hydrodynamics
gold
microscopy
heat
expansion

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

London, R. A., Trebes, J. E., & Jacobsen, C. J. (1993). Role of x-ray-induced damage in biological micro-imaging. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 1741, pp. 333-340). Bellingham, WA, United States: Publ by Int Soc for Optical Engineering.

Role of x-ray-induced damage in biological micro-imaging. / London, Richard A.; Trebes, James E.; Jacobsen, Chris J.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 1741 Bellingham, WA, United States : Publ by Int Soc for Optical Engineering, 1993. p. 333-340.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

London, RA, Trebes, JE & Jacobsen, CJ 1993, Role of x-ray-induced damage in biological micro-imaging. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 1741, Publ by Int Soc for Optical Engineering, Bellingham, WA, United States, pp. 333-340, Soft X-Ray Microscopy, San Diego, CA, USA, 7/19/92.
London RA, Trebes JE, Jacobsen CJ. Role of x-ray-induced damage in biological micro-imaging. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 1741. Bellingham, WA, United States: Publ by Int Soc for Optical Engineering. 1993. p. 333-340
London, Richard A. ; Trebes, James E. ; Jacobsen, Chris J. / Role of x-ray-induced damage in biological micro-imaging. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 1741 Bellingham, WA, United States : Publ by Int Soc for Optical Engineering, 1993. pp. 333-340
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