Proximity effect and hot-electron diffusion in ag/al2o3/al tunnel junctions

H. Netel, J. Jochum, Simon E. Labov, C. A. Mears, Matthias Frank

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

We have fabricated Ag/AhOs/Al tunnel junctions on Si substrates using a new process. This process was developed to fabricate superconducting tunnel junctions (STJs) on the surface of a superconductor. These junctions allow us to study the proximity effect of a superconducting Al film on a normal metal trapping layer. In addition these devices allow us to measure the hot-electron diffusion constant using a single junction. Lastly these devices will help us optimize the design and fabrication of tunnel junctions on the surface of high-Z ultra-pure superconducting crystals.

Original languageEnglish (US)
Pages (from-to)3379-3382
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Volume7
Issue number2 PART 3
StatePublished - Dec 1 1997
Externally publishedYes

Fingerprint

electron diffusion
Tunnel junctions
Hot electrons
hot electrons
tunnel junctions
Superconducting films
superconducting films
Superconducting materials
Metals
trapping
Fabrication
Crystals
fabrication
Substrates
metals
crystals

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

Proximity effect and hot-electron diffusion in ag/al2o3/al tunnel junctions. / Netel, H.; Jochum, J.; Labov, Simon E.; Mears, C. A.; Frank, Matthias.

In: IEEE Transactions on Applied Superconductivity, Vol. 7, No. 2 PART 3, 01.12.1997, p. 3379-3382.

Research output: Contribution to journalArticle

Netel, H, Jochum, J, Labov, SE, Mears, CA & Frank, M 1997, 'Proximity effect and hot-electron diffusion in ag/al2o3/al tunnel junctions', IEEE Transactions on Applied Superconductivity, vol. 7, no. 2 PART 3, pp. 3379-3382.
Netel, H. ; Jochum, J. ; Labov, Simon E. ; Mears, C. A. ; Frank, Matthias. / Proximity effect and hot-electron diffusion in ag/al2o3/al tunnel junctions. In: IEEE Transactions on Applied Superconductivity. 1997 ; Vol. 7, No. 2 PART 3. pp. 3379-3382.
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