Prospects for single-particle imaging at XFELs

H. N. Chapman, S. P. Hau-Riege, R. A. London, S. Marchesini, Aleksandr Noy, A. Szoke, H. Szoke, E. Ingerman, J. Hajdu, G. Huldt, M. R. Howells, H. He, J. C H Spence, U. Weierstall

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

X-ray free-electron lasers will produce pulses of x-rays that are 10 orders of magnitude brighter than today's undulator sources at synchrotrons. This may enable atomic resolution imaging of single macromolecules.

Original languageEnglish (US)
Title of host publicationLEOS Summer Topical Meeting
Pages1-2
Number of pages2
StatePublished - 2004
Externally publishedYes
Event2004 Digest of the LEOS Summer Topical Meetings - San Diego, CA, United States
Duration: Jul 28 2004Jul 30 2004

Other

Other2004 Digest of the LEOS Summer Topical Meetings
CountryUnited States
CitySan Diego, CA
Period7/28/047/30/04

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Chapman, H. N., Hau-Riege, S. P., London, R. A., Marchesini, S., Noy, A., Szoke, A., Szoke, H., Ingerman, E., Hajdu, J., Huldt, G., Howells, M. R., He, H., Spence, J. C. H., & Weierstall, U. (2004). Prospects for single-particle imaging at XFELs. In LEOS Summer Topical Meeting (pp. 1-2)