Prospective monitoring of early fetal loss and clinical spontaneous abortion among female semiconductor workers

B. Eskenazi, Ellen B Gold, B. L. Lasley, S. J. Samuels, S. K. Hammond, S. Wight, M. O. Rasor, C. J. Hines, Marc B Schenker

Research output: Contribution to journalArticlepeer-review

43 Scopus citations

Abstract

Women who work in silicon wafer fabrication rooms (fabs) have been reported to have an increased risk of spontaneous abortion (SAB). Although previous studies have included only clinically recognized SABs, more than two-thirds of SABs may be clinically unrecognized. To determine whether fab work is associated with SAB, we recruited 152 fab and 251 nonfab workers, who collected urine samples for a 6-month period. Samples were analyzed by immunoradiometric assay for the presence of human chorionic gonadotropin to detect early fetal losses. Approximately 63% of fab and 46% of nonfab pregnancies ended in SAB [adjusted relative risk (RR) = 1.25; 95% confidence interval (CI) = 0.63-1.76]. Similar RR were seen for women who worked in dopant and thin-film processes (adjusted RR = 1.30; 95% CI = 0.51-1.96) or in masking (adjusted RR = 1.30; 95% CI = 0.59-1.84). The four pregnancies among women who worked with ethylene-based glycol ethers ended in SAB.

Original languageEnglish (US)
Pages (from-to)833-846
Number of pages14
JournalAmerican Journal of Industrial Medicine
Volume28
Issue number6
StatePublished - 1995

Keywords

  • glycol ethers
  • miscarriage
  • occult pregnancy
  • semiconductor manufacturing
  • subclinical pregnancy
  • wafer fabrication

ASJC Scopus subject areas

  • Public Health, Environmental and Occupational Health

Fingerprint Dive into the research topics of 'Prospective monitoring of early fetal loss and clinical spontaneous abortion among female semiconductor workers'. Together they form a unique fingerprint.

Cite this