Abstract
Profiling structured beams produced by X-ray free-electron lasers (FELs) is crucial to both maximizing signal intensity for weakly scattering targets and interpreting their scattering patterns. Earlier ablative imprint studies describe how to infer the X-ray beam profile from the damage that an attenuated beam inflicts on a substrate. However, the beams in-situ profile is not directly accessible with imprint studies because the damage profile could be different from the actual beam profile. On the other hand, although a Shack-Hartmann sensor is capable of in-situ profiling, its lenses may be quickly damaged at the intense focus of hard X-ray FEL beams. We describe a new approach that probes the in-situ morphology of the intense FEL focus. By studying the translations in diffraction patterns from an ensemble of randomly injected sub-micron latex spheres, we were able to determine the non-Gaussian nature of the intense FEL beam at the Linac Coherent Light Source (SLAC National Laboratory) near the FEL focus. We discuss an experimental application of such a beam-profiling technique, and the limitations we need to overcome before it can be widely applied.
| Original language | English (US) |
|---|---|
| Title of host publication | X-Ray Free-Electron Lasers |
| Subtitle of host publication | Beam Diagnostics, Beamline Instrumentation, and Applications |
| Volume | 8504 |
| DOIs | |
| State | Published - Dec 1 2012 |
| Externally published | Yes |
| Event | X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications - San Diego, CA, United States Duration: Aug 13 2012 → Aug 16 2012 |
Other
| Other | X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications |
|---|---|
| Country | United States |
| City | San Diego, CA |
| Period | 8/13/12 → 8/16/12 |
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Keywords
- Aerosols
- Beam diagnostics
- Beam profiling
- Diffraction
- Hartmann sensor
- Imaging
- LCLS
- X-ray freeelectron laser
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering
Cite this
Profiling structured beams using injected aerosols. / Duane Loh, N.; Starodub, Dmitri; Lomb, Lukas; Hampton, Christina Y.; Martin, Andrew V.; Sierra, Raymond G.; Barty, Anton; Aquila, Andrew; Schulz, Joachim; Steinbrener, Jan; Shoeman, Robert L.; Kassemeyer, Stephan; Bostedt, Christoph; Bozek, John; Epp, Sascha W.; Erk, Benjamin; Hartmann, Robert; Rolles, Daniel; Rudenko, Artem; Rudek, Benedikt; Foucar, Lutz; Kimmel, Nils; Weidenspointner, Georg; Hauser, Guenter; Holl, Peter; Pedersoli, Emanuele; Liang, Mengning; Hunter, Mark S.; Gumprecht, Lars; Coppola, Nicola; Wunderer, Cornelia; Graafsma, Heinz; Maia, Filipe R.N.C.; Ekeberg, Tomas; Hantke, Max; Fleckenstein, Holger; Hirsemann, Helmut; Nass, Karol; White, Thomas A.; Tobias, Herbert J.; Farquar, George R.; Henry Benner, W.; Hau-Riege, Stefan; Reich, Christian; Hartmann, Andreas; Soltau, Heike; Marchesini, Stefano; Bajt, Sasa; Barthelmess, Miriam; Strueder, Lothar; Ullrich, Joachim; Bucksbaum, Philip; Hodgson, Keith O.; Frank, Matthias; Schlichting, Ilme; Chapman, Henry N.; Bogan, Michael J.
X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications. Vol. 8504 2012. 850403.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Profiling structured beams using injected aerosols
AU - Duane Loh, N.
AU - Starodub, Dmitri
AU - Lomb, Lukas
AU - Hampton, Christina Y.
AU - Martin, Andrew V.
AU - Sierra, Raymond G.
AU - Barty, Anton
AU - Aquila, Andrew
AU - Schulz, Joachim
AU - Steinbrener, Jan
AU - Shoeman, Robert L.
AU - Kassemeyer, Stephan
AU - Bostedt, Christoph
AU - Bozek, John
AU - Epp, Sascha W.
AU - Erk, Benjamin
AU - Hartmann, Robert
AU - Rolles, Daniel
AU - Rudenko, Artem
AU - Rudek, Benedikt
AU - Foucar, Lutz
AU - Kimmel, Nils
AU - Weidenspointner, Georg
AU - Hauser, Guenter
AU - Holl, Peter
AU - Pedersoli, Emanuele
AU - Liang, Mengning
AU - Hunter, Mark S.
AU - Gumprecht, Lars
AU - Coppola, Nicola
AU - Wunderer, Cornelia
AU - Graafsma, Heinz
AU - Maia, Filipe R.N.C.
AU - Ekeberg, Tomas
AU - Hantke, Max
AU - Fleckenstein, Holger
AU - Hirsemann, Helmut
AU - Nass, Karol
AU - White, Thomas A.
AU - Tobias, Herbert J.
AU - Farquar, George R.
AU - Henry Benner, W.
AU - Hau-Riege, Stefan
AU - Reich, Christian
AU - Hartmann, Andreas
AU - Soltau, Heike
AU - Marchesini, Stefano
AU - Bajt, Sasa
AU - Barthelmess, Miriam
AU - Strueder, Lothar
AU - Ullrich, Joachim
AU - Bucksbaum, Philip
AU - Hodgson, Keith O.
AU - Frank, Matthias
AU - Schlichting, Ilme
AU - Chapman, Henry N.
AU - Bogan, Michael J.
PY - 2012/12/1
Y1 - 2012/12/1
N2 - Profiling structured beams produced by X-ray free-electron lasers (FELs) is crucial to both maximizing signal intensity for weakly scattering targets and interpreting their scattering patterns. Earlier ablative imprint studies describe how to infer the X-ray beam profile from the damage that an attenuated beam inflicts on a substrate. However, the beams in-situ profile is not directly accessible with imprint studies because the damage profile could be different from the actual beam profile. On the other hand, although a Shack-Hartmann sensor is capable of in-situ profiling, its lenses may be quickly damaged at the intense focus of hard X-ray FEL beams. We describe a new approach that probes the in-situ morphology of the intense FEL focus. By studying the translations in diffraction patterns from an ensemble of randomly injected sub-micron latex spheres, we were able to determine the non-Gaussian nature of the intense FEL beam at the Linac Coherent Light Source (SLAC National Laboratory) near the FEL focus. We discuss an experimental application of such a beam-profiling technique, and the limitations we need to overcome before it can be widely applied.
AB - Profiling structured beams produced by X-ray free-electron lasers (FELs) is crucial to both maximizing signal intensity for weakly scattering targets and interpreting their scattering patterns. Earlier ablative imprint studies describe how to infer the X-ray beam profile from the damage that an attenuated beam inflicts on a substrate. However, the beams in-situ profile is not directly accessible with imprint studies because the damage profile could be different from the actual beam profile. On the other hand, although a Shack-Hartmann sensor is capable of in-situ profiling, its lenses may be quickly damaged at the intense focus of hard X-ray FEL beams. We describe a new approach that probes the in-situ morphology of the intense FEL focus. By studying the translations in diffraction patterns from an ensemble of randomly injected sub-micron latex spheres, we were able to determine the non-Gaussian nature of the intense FEL beam at the Linac Coherent Light Source (SLAC National Laboratory) near the FEL focus. We discuss an experimental application of such a beam-profiling technique, and the limitations we need to overcome before it can be widely applied.
KW - Aerosols
KW - Beam diagnostics
KW - Beam profiling
KW - Diffraction
KW - Hartmann sensor
KW - Imaging
KW - LCLS
KW - X-ray freeelectron laser
UR - http://www.scopus.com/inward/record.url?scp=84872545157&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84872545157&partnerID=8YFLogxK
U2 - 10.1117/12.930075
DO - 10.1117/12.930075
M3 - Conference contribution
AN - SCOPUS:84872545157
SN - 9780819492210
VL - 8504
BT - X-Ray Free-Electron Lasers
ER -