Profiling structured beams using injected aerosols

N. Duane Loh, Dmitri Starodub, Lukas Lomb, Christina Y. Hampton, Andrew V. Martin, Raymond G. Sierra, Anton Barty, Andrew Aquila, Joachim Schulz, Jan Steinbrener, Robert L. Shoeman, Stephan Kassemeyer, Christoph Bostedt, John Bozek, Sascha W. Epp, Benjamin Erk, Robert Hartmann, Daniel Rolles, Artem Rudenko, Benedikt RudekLutz Foucar, Nils Kimmel, Georg Weidenspointner, Guenter Hauser, Peter Holl, Emanuele Pedersoli, Mengning Liang, Mark S. Hunter, Lars Gumprecht, Nicola Coppola, Cornelia Wunderer, Heinz Graafsma, Filipe R.N.C. Maia, Tomas Ekeberg, Max Hantke, Holger Fleckenstein, Helmut Hirsemann, Karol Nass, Thomas A. White, Herbert J. Tobias, George R. Farquar, W. Henry Benner, Stefan Hau-Riege, Christian Reich, Andreas Hartmann, Heike Soltau, Stefano Marchesini, Sasa Bajt, Miriam Barthelmess, Lothar Strueder, Joachim Ullrich, Philip Bucksbaum, Keith O. Hodgson, Matthias Frank, Ilme Schlichting, Henry N. Chapman, Michael J. Bogan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Profiling structured beams produced by X-ray free-electron lasers (FELs) is crucial to both maximizing signal intensity for weakly scattering targets and interpreting their scattering patterns. Earlier ablative imprint studies describe how to infer the X-ray beam profile from the damage that an attenuated beam inflicts on a substrate. However, the beams in-situ profile is not directly accessible with imprint studies because the damage profile could be different from the actual beam profile. On the other hand, although a Shack-Hartmann sensor is capable of in-situ profiling, its lenses may be quickly damaged at the intense focus of hard X-ray FEL beams. We describe a new approach that probes the in-situ morphology of the intense FEL focus. By studying the translations in diffraction patterns from an ensemble of randomly injected sub-micron latex spheres, we were able to determine the non-Gaussian nature of the intense FEL beam at the Linac Coherent Light Source (SLAC National Laboratory) near the FEL focus. We discuss an experimental application of such a beam-profiling technique, and the limitations we need to overcome before it can be widely applied.

Original languageEnglish (US)
Title of host publicationX-Ray Free-Electron Lasers
Subtitle of host publicationBeam Diagnostics, Beamline Instrumentation, and Applications
Volume8504
DOIs
StatePublished - Dec 1 2012
Externally publishedYes
EventX-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications - San Diego, CA, United States
Duration: Aug 13 2012Aug 16 2012

Other

OtherX-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
CountryUnited States
CitySan Diego, CA
Period8/13/128/16/12

Fingerprint

Free electron lasers
Aerosol
Free Electron Laser
Profiling
Aerosols
aerosols
free electron lasers
X ray lasers
X-ray Laser
Laser beams
Electron Beam
profiles
Laser Beam
Scattering
Damage
laser beams
electron beams
damage
Latex
Hard X-ray

Keywords

  • Aerosols
  • Beam diagnostics
  • Beam profiling
  • Diffraction
  • Hartmann sensor
  • Imaging
  • LCLS
  • X-ray freeelectron laser

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Duane Loh, N., Starodub, D., Lomb, L., Hampton, C. Y., Martin, A. V., Sierra, R. G., ... Bogan, M. J. (2012). Profiling structured beams using injected aerosols. In X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications (Vol. 8504). [850403] https://doi.org/10.1117/12.930075

Profiling structured beams using injected aerosols. / Duane Loh, N.; Starodub, Dmitri; Lomb, Lukas; Hampton, Christina Y.; Martin, Andrew V.; Sierra, Raymond G.; Barty, Anton; Aquila, Andrew; Schulz, Joachim; Steinbrener, Jan; Shoeman, Robert L.; Kassemeyer, Stephan; Bostedt, Christoph; Bozek, John; Epp, Sascha W.; Erk, Benjamin; Hartmann, Robert; Rolles, Daniel; Rudenko, Artem; Rudek, Benedikt; Foucar, Lutz; Kimmel, Nils; Weidenspointner, Georg; Hauser, Guenter; Holl, Peter; Pedersoli, Emanuele; Liang, Mengning; Hunter, Mark S.; Gumprecht, Lars; Coppola, Nicola; Wunderer, Cornelia; Graafsma, Heinz; Maia, Filipe R.N.C.; Ekeberg, Tomas; Hantke, Max; Fleckenstein, Holger; Hirsemann, Helmut; Nass, Karol; White, Thomas A.; Tobias, Herbert J.; Farquar, George R.; Henry Benner, W.; Hau-Riege, Stefan; Reich, Christian; Hartmann, Andreas; Soltau, Heike; Marchesini, Stefano; Bajt, Sasa; Barthelmess, Miriam; Strueder, Lothar; Ullrich, Joachim; Bucksbaum, Philip; Hodgson, Keith O.; Frank, Matthias; Schlichting, Ilme; Chapman, Henry N.; Bogan, Michael J.

X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications. Vol. 8504 2012. 850403.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Duane Loh, N, Starodub, D, Lomb, L, Hampton, CY, Martin, AV, Sierra, RG, Barty, A, Aquila, A, Schulz, J, Steinbrener, J, Shoeman, RL, Kassemeyer, S, Bostedt, C, Bozek, J, Epp, SW, Erk, B, Hartmann, R, Rolles, D, Rudenko, A, Rudek, B, Foucar, L, Kimmel, N, Weidenspointner, G, Hauser, G, Holl, P, Pedersoli, E, Liang, M, Hunter, MS, Gumprecht, L, Coppola, N, Wunderer, C, Graafsma, H, Maia, FRNC, Ekeberg, T, Hantke, M, Fleckenstein, H, Hirsemann, H, Nass, K, White, TA, Tobias, HJ, Farquar, GR, Henry Benner, W, Hau-Riege, S, Reich, C, Hartmann, A, Soltau, H, Marchesini, S, Bajt, S, Barthelmess, M, Strueder, L, Ullrich, J, Bucksbaum, P, Hodgson, KO, Frank, M, Schlichting, I, Chapman, HN & Bogan, MJ 2012, Profiling structured beams using injected aerosols. in X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications. vol. 8504, 850403, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, San Diego, CA, United States, 8/13/12. https://doi.org/10.1117/12.930075
Duane Loh N, Starodub D, Lomb L, Hampton CY, Martin AV, Sierra RG et al. Profiling structured beams using injected aerosols. In X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications. Vol. 8504. 2012. 850403 https://doi.org/10.1117/12.930075
Duane Loh, N. ; Starodub, Dmitri ; Lomb, Lukas ; Hampton, Christina Y. ; Martin, Andrew V. ; Sierra, Raymond G. ; Barty, Anton ; Aquila, Andrew ; Schulz, Joachim ; Steinbrener, Jan ; Shoeman, Robert L. ; Kassemeyer, Stephan ; Bostedt, Christoph ; Bozek, John ; Epp, Sascha W. ; Erk, Benjamin ; Hartmann, Robert ; Rolles, Daniel ; Rudenko, Artem ; Rudek, Benedikt ; Foucar, Lutz ; Kimmel, Nils ; Weidenspointner, Georg ; Hauser, Guenter ; Holl, Peter ; Pedersoli, Emanuele ; Liang, Mengning ; Hunter, Mark S. ; Gumprecht, Lars ; Coppola, Nicola ; Wunderer, Cornelia ; Graafsma, Heinz ; Maia, Filipe R.N.C. ; Ekeberg, Tomas ; Hantke, Max ; Fleckenstein, Holger ; Hirsemann, Helmut ; Nass, Karol ; White, Thomas A. ; Tobias, Herbert J. ; Farquar, George R. ; Henry Benner, W. ; Hau-Riege, Stefan ; Reich, Christian ; Hartmann, Andreas ; Soltau, Heike ; Marchesini, Stefano ; Bajt, Sasa ; Barthelmess, Miriam ; Strueder, Lothar ; Ullrich, Joachim ; Bucksbaum, Philip ; Hodgson, Keith O. ; Frank, Matthias ; Schlichting, Ilme ; Chapman, Henry N. ; Bogan, Michael J. / Profiling structured beams using injected aerosols. X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications. Vol. 8504 2012.
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AU - Martin, Andrew V.

AU - Sierra, Raymond G.

AU - Barty, Anton

AU - Aquila, Andrew

AU - Schulz, Joachim

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AU - Holl, Peter

AU - Pedersoli, Emanuele

AU - Liang, Mengning

AU - Hunter, Mark S.

AU - Gumprecht, Lars

AU - Coppola, Nicola

AU - Wunderer, Cornelia

AU - Graafsma, Heinz

AU - Maia, Filipe R.N.C.

AU - Ekeberg, Tomas

AU - Hantke, Max

AU - Fleckenstein, Holger

AU - Hirsemann, Helmut

AU - Nass, Karol

AU - White, Thomas A.

AU - Tobias, Herbert J.

AU - Farquar, George R.

AU - Henry Benner, W.

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KW - Hartmann sensor

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