Profiling structured beams using injected aerosols

N. Duane Loh; Dmitri Starodub; Lukas Lomb; Christina Y. Hampton; Andrew V. Martin; Raymond G. Sierra; Anton Barty; Andrew Aquila; Joachim Schulz; Jan Steinbrener; Robert L. Shoeman; Stephan Kassemeyer; Christoph Bostedt; John Bozek; Sascha W. Epp; Benjamin Erk; Robert Hartmann; Daniel Rolles; Artem Rudenko; Benedikt Rudek; Lutz Foucar; Nils Kimmel; Georg Weidenspointner; Guenter Hauser; Peter Holl; Emanuele Pedersoli; Mengning Liang; Mark S. Hunter; Lars Gumprecht; Nicola Coppola; Cornelia Wunderer; Heinz Graafsma; Filipe R.N.C. Maia; Tomas Ekeberg; Max Hantke; Holger Fleckenstein; Helmut Hirsemann; Karol Nass; Thomas A. White; Herbert J. Tobias; George R. Farquar; W. Henry Benner; Stefan Hau-Riege; Christian Reich; Andreas Hartmann; Heike Soltau; Stefano Marchesini; Sasa Bajt; Miriam Barthelmess; Lothar Strueder; Joachim Ullrich; Philip Bucksbaum; Keith O. Hodgson; Matthias Frank; Ilme Schlichting; Henry N. Chapman; Michael J. Bogan

doi:10.1117/12.930075

Profiling structured beams using injected aerosols

N. Duane Loh, Dmitri Starodub, Lukas Lomb, Christina Y. Hampton, Andrew V. Martin, Raymond G. Sierra, Anton Barty, Andrew Aquila, Joachim Schulz, Jan Steinbrener, Robert L. Shoeman, Stephan Kassemeyer, Christoph Bostedt, John Bozek, Sascha W. Epp, Benjamin Erk, Robert Hartmann, Daniel Rolles, Artem Rudenko, Benedikt RudekLutz Foucar, Nils Kimmel, Georg Weidenspointner, Guenter Hauser, Peter Holl, Emanuele Pedersoli, Mengning Liang, Mark S. Hunter, Lars Gumprecht, Nicola Coppola, Cornelia Wunderer, Heinz Graafsma, Filipe R.N.C. Maia, Tomas Ekeberg, Max Hantke, Holger Fleckenstein, Helmut Hirsemann, Karol Nass, Thomas A. White, Herbert J. Tobias, George R. Farquar, W. Henry Benner, Stefan Hau-Riege, Christian Reich, Andreas Hartmann, Heike Soltau, Stefano Marchesini, Sasa Bajt, Miriam Barthelmess, Lothar Strueder, Joachim Ullrich, Philip Bucksbaum, Keith O. Hodgson, Matthias Frank, Ilme Schlichting, Henry N. Chapman, Michael J. Bogan

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

Profiling structured beams produced by X-ray free-electron lasers (FELs) is crucial to both maximizing signal intensity for weakly scattering targets and interpreting their scattering patterns. Earlier ablative imprint studies describe how to infer the X-ray beam profile from the damage that an attenuated beam inflicts on a substrate. However, the beams in-situ profile is not directly accessible with imprint studies because the damage profile could be different from the actual beam profile. On the other hand, although a Shack-Hartmann sensor is capable of in-situ profiling, its lenses may be quickly damaged at the intense focus of hard X-ray FEL beams. We describe a new approach that probes the in-situ morphology of the intense FEL focus. By studying the translations in diffraction patterns from an ensemble of randomly injected sub-micron latex spheres, we were able to determine the non-Gaussian nature of the intense FEL beam at the Linac Coherent Light Source (SLAC National Laboratory) near the FEL focus. We discuss an experimental application of such a beam-profiling technique, and the limitations we need to overcome before it can be widely applied.

Original language	English (US)
Title of host publication	X-Ray Free-Electron Lasers
Subtitle of host publication	Beam Diagnostics, Beamline Instrumentation, and Applications
Volume	8504
DOIs	https://doi.org/10.1117/12.930075
State	Published - Dec 1 2012
Externally published	Yes
Event	X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications - San Diego, CA, United States Duration: Aug 13 2012 → Aug 16 2012

Other

Other	X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
Country	United States
City	San Diego, CA
Period	8/13/12 → 8/16/12

Keywords

Aerosols
Beam diagnostics
Beam profiling
Diffraction
Hartmann sensor
Imaging
LCLS
X-ray freeelectron laser

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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10.1117/12.930075

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Duane Loh, N., Starodub, D., Lomb, L., Hampton, C. Y., Martin, A. V., Sierra, R. G., Barty, A., Aquila, A., Schulz, J., Steinbrener, J., Shoeman, R. L., Kassemeyer, S., Bostedt, C., Bozek, J., Epp, S. W., Erk, B., Hartmann, R., Rolles, D., Rudenko, A., ... Bogan, M. J. (2012). Profiling structured beams using injected aerosols. In X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications (Vol. 8504). [850403] https://doi.org/10.1117/12.930075

Profiling structured beams using injected aerosols. / Duane Loh, N.; Starodub, Dmitri; Lomb, Lukas; Hampton, Christina Y.; Martin, Andrew V.; Sierra, Raymond G.; Barty, Anton; Aquila, Andrew; Schulz, Joachim; Steinbrener, Jan; Shoeman, Robert L.; Kassemeyer, Stephan; Bostedt, Christoph; Bozek, John; Epp, Sascha W.; Erk, Benjamin; Hartmann, Robert; Rolles, Daniel; Rudenko, Artem; Rudek, Benedikt; Foucar, Lutz; Kimmel, Nils; Weidenspointner, Georg; Hauser, Guenter; Holl, Peter; Pedersoli, Emanuele; Liang, Mengning; Hunter, Mark S.; Gumprecht, Lars; Coppola, Nicola; Wunderer, Cornelia; Graafsma, Heinz; Maia, Filipe R.N.C.; Ekeberg, Tomas; Hantke, Max; Fleckenstein, Holger; Hirsemann, Helmut; Nass, Karol; White, Thomas A.; Tobias, Herbert J.; Farquar, George R.; Henry Benner, W.; Hau-Riege, Stefan; Reich, Christian; Hartmann, Andreas; Soltau, Heike; Marchesini, Stefano; Bajt, Sasa; Barthelmess, Miriam; Strueder, Lothar; Ullrich, Joachim; Bucksbaum, Philip; Hodgson, Keith O.; Frank, Matthias; Schlichting, Ilme; Chapman, Henry N.; Bogan, Michael J.

X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications. Vol. 8504 2012. 850403.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Duane Loh, N, Starodub, D, Lomb, L, Hampton, CY, Martin, AV, Sierra, RG, Barty, A, Aquila, A, Schulz, J, Steinbrener, J, Shoeman, RL, Kassemeyer, S, Bostedt, C, Bozek, J, Epp, SW, Erk, B, Hartmann, R, Rolles, D, Rudenko, A, Rudek, B, Foucar, L, Kimmel, N, Weidenspointner, G, Hauser, G, Holl, P, Pedersoli, E, Liang, M, Hunter, MS, Gumprecht, L, Coppola, N, Wunderer, C, Graafsma, H, Maia, FRNC, Ekeberg, T, Hantke, M, Fleckenstein, H, Hirsemann, H, Nass, K, White, TA, Tobias, HJ, Farquar, GR, Henry Benner, W, Hau-Riege, S, Reich, C, Hartmann, A, Soltau, H, Marchesini, S, Bajt, S, Barthelmess, M, Strueder, L, Ullrich, J, Bucksbaum, P, Hodgson, KO, Frank, M, Schlichting, I, Chapman, HN & Bogan, MJ 2012, Profiling structured beams using injected aerosols. in X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications. vol. 8504, 850403, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, San Diego, CA, United States, 8/13/12. https://doi.org/10.1117/12.930075

Duane Loh, N. ; Starodub, Dmitri ; Lomb, Lukas ; Hampton, Christina Y. ; Martin, Andrew V. ; Sierra, Raymond G. ; Barty, Anton ; Aquila, Andrew ; Schulz, Joachim ; Steinbrener, Jan ; Shoeman, Robert L. ; Kassemeyer, Stephan ; Bostedt, Christoph ; Bozek, John ; Epp, Sascha W. ; Erk, Benjamin ; Hartmann, Robert ; Rolles, Daniel ; Rudenko, Artem ; Rudek, Benedikt ; Foucar, Lutz ; Kimmel, Nils ; Weidenspointner, Georg ; Hauser, Guenter ; Holl, Peter ; Pedersoli, Emanuele ; Liang, Mengning ; Hunter, Mark S. ; Gumprecht, Lars ; Coppola, Nicola ; Wunderer, Cornelia ; Graafsma, Heinz ; Maia, Filipe R.N.C. ; Ekeberg, Tomas ; Hantke, Max ; Fleckenstein, Holger ; Hirsemann, Helmut ; Nass, Karol ; White, Thomas A. ; Tobias, Herbert J. ; Farquar, George R. ; Henry Benner, W. ; Hau-Riege, Stefan ; Reich, Christian ; Hartmann, Andreas ; Soltau, Heike ; Marchesini, Stefano ; Bajt, Sasa ; Barthelmess, Miriam ; Strueder, Lothar ; Ullrich, Joachim ; Bucksbaum, Philip ; Hodgson, Keith O. ; Frank, Matthias ; Schlichting, Ilme ; Chapman, Henry N. ; Bogan, Michael J. / Profiling structured beams using injected aerosols. X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications. Vol. 8504 2012.

@inproceedings{c903d856d89e4e23b4202783a041c4ee,

title = "Profiling structured beams using injected aerosols",

abstract = "Profiling structured beams produced by X-ray free-electron lasers (FELs) is crucial to both maximizing signal intensity for weakly scattering targets and interpreting their scattering patterns. Earlier ablative imprint studies describe how to infer the X-ray beam profile from the damage that an attenuated beam inflicts on a substrate. However, the beams in-situ profile is not directly accessible with imprint studies because the damage profile could be different from the actual beam profile. On the other hand, although a Shack-Hartmann sensor is capable of in-situ profiling, its lenses may be quickly damaged at the intense focus of hard X-ray FEL beams. We describe a new approach that probes the in-situ morphology of the intense FEL focus. By studying the translations in diffraction patterns from an ensemble of randomly injected sub-micron latex spheres, we were able to determine the non-Gaussian nature of the intense FEL beam at the Linac Coherent Light Source (SLAC National Laboratory) near the FEL focus. We discuss an experimental application of such a beam-profiling technique, and the limitations we need to overcome before it can be widely applied.",

keywords = "Aerosols, Beam diagnostics, Beam profiling, Diffraction, Hartmann sensor, Imaging, LCLS, X-ray freeelectron laser",

author = "{Duane Loh}, N. and Dmitri Starodub and Lukas Lomb and Hampton, {Christina Y.} and Martin, {Andrew V.} and Sierra, {Raymond G.} and Anton Barty and Andrew Aquila and Joachim Schulz and Jan Steinbrener and Shoeman, {Robert L.} and Stephan Kassemeyer and Christoph Bostedt and John Bozek and Epp, {Sascha W.} and Benjamin Erk and Robert Hartmann and Daniel Rolles and Artem Rudenko and Benedikt Rudek and Lutz Foucar and Nils Kimmel and Georg Weidenspointner and Guenter Hauser and Peter Holl and Emanuele Pedersoli and Mengning Liang and Hunter, {Mark S.} and Lars Gumprecht and Nicola Coppola and Cornelia Wunderer and Heinz Graafsma and Maia, {Filipe R.N.C.} and Tomas Ekeberg and Max Hantke and Holger Fleckenstein and Helmut Hirsemann and Karol Nass and White, {Thomas A.} and Tobias, {Herbert J.} and Farquar, {George R.} and {Henry Benner}, W. and Stefan Hau-Riege and Christian Reich and Andreas Hartmann and Heike Soltau and Stefano Marchesini and Sasa Bajt and Miriam Barthelmess and Lothar Strueder and Joachim Ullrich and Philip Bucksbaum and Hodgson, {Keith O.} and Matthias Frank and Ilme Schlichting and Chapman, {Henry N.} and Bogan, {Michael J.}",

year = "2012",

month = dec,

day = "1",

doi = "10.1117/12.930075",

language = "English (US)",

isbn = "9780819492210",

volume = "8504",

booktitle = "X-Ray Free-Electron Lasers",

note = "X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications ; Conference date: 13-08-2012 Through 16-08-2012",

}

TY - GEN

T1 - Profiling structured beams using injected aerosols

AU - Duane Loh, N.

AU - Starodub, Dmitri

AU - Lomb, Lukas

AU - Hampton, Christina Y.

AU - Martin, Andrew V.

AU - Sierra, Raymond G.

AU - Barty, Anton

AU - Aquila, Andrew

AU - Schulz, Joachim

AU - Steinbrener, Jan

AU - Shoeman, Robert L.

AU - Kassemeyer, Stephan

AU - Bostedt, Christoph

AU - Bozek, John

AU - Epp, Sascha W.

AU - Erk, Benjamin

AU - Hartmann, Robert

AU - Rolles, Daniel

AU - Rudenko, Artem

AU - Rudek, Benedikt

AU - Foucar, Lutz

AU - Kimmel, Nils

AU - Weidenspointner, Georg

AU - Hauser, Guenter

AU - Holl, Peter

AU - Pedersoli, Emanuele

AU - Liang, Mengning

AU - Hunter, Mark S.

AU - Gumprecht, Lars

AU - Coppola, Nicola

AU - Wunderer, Cornelia

AU - Graafsma, Heinz

AU - Maia, Filipe R.N.C.

AU - Ekeberg, Tomas

AU - Hantke, Max

AU - Fleckenstein, Holger

AU - Hirsemann, Helmut

AU - Nass, Karol

AU - White, Thomas A.

AU - Tobias, Herbert J.

AU - Farquar, George R.

AU - Henry Benner, W.

AU - Hau-Riege, Stefan

AU - Reich, Christian

AU - Hartmann, Andreas

AU - Soltau, Heike

AU - Marchesini, Stefano

AU - Bajt, Sasa

AU - Barthelmess, Miriam

AU - Strueder, Lothar

AU - Ullrich, Joachim

AU - Bucksbaum, Philip

AU - Hodgson, Keith O.

AU - Frank, Matthias

AU - Schlichting, Ilme

AU - Chapman, Henry N.

AU - Bogan, Michael J.

PY - 2012/12/1

Y1 - 2012/12/1

N2 - Profiling structured beams produced by X-ray free-electron lasers (FELs) is crucial to both maximizing signal intensity for weakly scattering targets and interpreting their scattering patterns. Earlier ablative imprint studies describe how to infer the X-ray beam profile from the damage that an attenuated beam inflicts on a substrate. However, the beams in-situ profile is not directly accessible with imprint studies because the damage profile could be different from the actual beam profile. On the other hand, although a Shack-Hartmann sensor is capable of in-situ profiling, its lenses may be quickly damaged at the intense focus of hard X-ray FEL beams. We describe a new approach that probes the in-situ morphology of the intense FEL focus. By studying the translations in diffraction patterns from an ensemble of randomly injected sub-micron latex spheres, we were able to determine the non-Gaussian nature of the intense FEL beam at the Linac Coherent Light Source (SLAC National Laboratory) near the FEL focus. We discuss an experimental application of such a beam-profiling technique, and the limitations we need to overcome before it can be widely applied.

AB - Profiling structured beams produced by X-ray free-electron lasers (FELs) is crucial to both maximizing signal intensity for weakly scattering targets and interpreting their scattering patterns. Earlier ablative imprint studies describe how to infer the X-ray beam profile from the damage that an attenuated beam inflicts on a substrate. However, the beams in-situ profile is not directly accessible with imprint studies because the damage profile could be different from the actual beam profile. On the other hand, although a Shack-Hartmann sensor is capable of in-situ profiling, its lenses may be quickly damaged at the intense focus of hard X-ray FEL beams. We describe a new approach that probes the in-situ morphology of the intense FEL focus. By studying the translations in diffraction patterns from an ensemble of randomly injected sub-micron latex spheres, we were able to determine the non-Gaussian nature of the intense FEL beam at the Linac Coherent Light Source (SLAC National Laboratory) near the FEL focus. We discuss an experimental application of such a beam-profiling technique, and the limitations we need to overcome before it can be widely applied.

KW - Aerosols

KW - Beam diagnostics

KW - Beam profiling

KW - Diffraction

KW - Hartmann sensor

KW - Imaging

KW - LCLS

KW - X-ray freeelectron laser

UR - http://www.scopus.com/inward/record.url?scp=84872545157&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84872545157&partnerID=8YFLogxK

U2 - 10.1117/12.930075

DO - 10.1117/12.930075

M3 - Conference contribution

AN - SCOPUS:84872545157

SN - 9780819492210

VL - 8504

BT - X-Ray Free-Electron Lasers

T2 - X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications

Y2 - 13 August 2012 through 16 August 2012

ER -

Profiling structured beams using injected aerosols

Abstract

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Keywords

ASJC Scopus subject areas

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