Plasmon transmissivity and reflectivity of narrow grooves in a silver film

A. Bouhelier, Thomas R Huser, J. M. Freyland, H. J. Güntherodt, D. W. Pohl

Research output: Contribution to journalArticle

23 Scopus citations

Abstract

Surface plasmon (SP) reflectivity and transmissivity of narrow grooves in silver films are studied. The SP source is the probe of a scanning near- field optical microscope. Locally detected leakage radiation from the SP provides detailed information on the paths of SP propagation, in particular the influence of perturbations. Global detection provides representative average data on the SP properties of a given metal film and its structures. A groove of 200 nm width, for instance, reflects/transmits about 15%/80% of 'blue-green' SP radiation at normal incidence.

Original languageEnglish (US)
Pages (from-to)571-573
Number of pages3
JournalJournal of Microscopy
Volume194
Issue number2-3
DOIs
StatePublished - 1999
Externally publishedYes

Keywords

  • Integrated plasmon optics
  • Near-field optics
  • Reflectivity of grooves
  • Structured silver films
  • Surface plasmon
  • Transmissivity

ASJC Scopus subject areas

  • Instrumentation

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  • Cite this

    Bouhelier, A., Huser, T. R., Freyland, J. M., Güntherodt, H. J., & Pohl, D. W. (1999). Plasmon transmissivity and reflectivity of narrow grooves in a silver film. Journal of Microscopy, 194(2-3), 571-573. https://doi.org/10.1046/j.1365-2818.1999.00500.x