Plasmon transmissivity and reflectivity of narrow grooves in a silver film

A. Bouhelier, Thomas R Huser, J. M. Freyland, H. J. Güntherodt, D. W. Pohl

Research output: Contribution to journalArticle

23 Citations (Scopus)

Abstract

Surface plasmon (SP) reflectivity and transmissivity of narrow grooves in silver films are studied. The SP source is the probe of a scanning near- field optical microscope. Locally detected leakage radiation from the SP provides detailed information on the paths of SP propagation, in particular the influence of perturbations. Global detection provides representative average data on the SP properties of a given metal film and its structures. A groove of 200 nm width, for instance, reflects/transmits about 15%/80% of 'blue-green' SP radiation at normal incidence.

Original languageEnglish (US)
Pages (from-to)571-573
Number of pages3
JournalJournal of Microscopy
Volume194
Issue number2-3
DOIs
StatePublished - 1999
Externally publishedYes

Fingerprint

transmissivity
Silver
grooves
silver
Radiation
reflectance
Surface Properties
Metals
Incidence
radiation
optical microscopes
metal films
near fields
Microscopes
leakage
incidence
Scanning
perturbation
scanning
propagation

Keywords

  • Integrated plasmon optics
  • Near-field optics
  • Reflectivity of grooves
  • Structured silver films
  • Surface plasmon
  • Transmissivity

ASJC Scopus subject areas

  • Instrumentation

Cite this

Bouhelier, A., Huser, T. R., Freyland, J. M., Güntherodt, H. J., & Pohl, D. W. (1999). Plasmon transmissivity and reflectivity of narrow grooves in a silver film. Journal of Microscopy, 194(2-3), 571-573. https://doi.org/10.1046/j.1365-2818.1999.00500.x

Plasmon transmissivity and reflectivity of narrow grooves in a silver film. / Bouhelier, A.; Huser, Thomas R; Freyland, J. M.; Güntherodt, H. J.; Pohl, D. W.

In: Journal of Microscopy, Vol. 194, No. 2-3, 1999, p. 571-573.

Research output: Contribution to journalArticle

Bouhelier, A, Huser, TR, Freyland, JM, Güntherodt, HJ & Pohl, DW 1999, 'Plasmon transmissivity and reflectivity of narrow grooves in a silver film', Journal of Microscopy, vol. 194, no. 2-3, pp. 571-573. https://doi.org/10.1046/j.1365-2818.1999.00500.x
Bouhelier, A. ; Huser, Thomas R ; Freyland, J. M. ; Güntherodt, H. J. ; Pohl, D. W. / Plasmon transmissivity and reflectivity of narrow grooves in a silver film. In: Journal of Microscopy. 1999 ; Vol. 194, No. 2-3. pp. 571-573.
@article{dd89e79d1675421487262efa23005abe,
title = "Plasmon transmissivity and reflectivity of narrow grooves in a silver film",
abstract = "Surface plasmon (SP) reflectivity and transmissivity of narrow grooves in silver films are studied. The SP source is the probe of a scanning near- field optical microscope. Locally detected leakage radiation from the SP provides detailed information on the paths of SP propagation, in particular the influence of perturbations. Global detection provides representative average data on the SP properties of a given metal film and its structures. A groove of 200 nm width, for instance, reflects/transmits about 15{\%}/80{\%} of 'blue-green' SP radiation at normal incidence.",
keywords = "Integrated plasmon optics, Near-field optics, Reflectivity of grooves, Structured silver films, Surface plasmon, Transmissivity",
author = "A. Bouhelier and Huser, {Thomas R} and Freyland, {J. M.} and G{\"u}ntherodt, {H. J.} and Pohl, {D. W.}",
year = "1999",
doi = "10.1046/j.1365-2818.1999.00500.x",
language = "English (US)",
volume = "194",
pages = "571--573",
journal = "Journal of Microscopy",
issn = "0022-2720",
publisher = "Wiley-Blackwell",
number = "2-3",

}

TY - JOUR

T1 - Plasmon transmissivity and reflectivity of narrow grooves in a silver film

AU - Bouhelier, A.

AU - Huser, Thomas R

AU - Freyland, J. M.

AU - Güntherodt, H. J.

AU - Pohl, D. W.

PY - 1999

Y1 - 1999

N2 - Surface plasmon (SP) reflectivity and transmissivity of narrow grooves in silver films are studied. The SP source is the probe of a scanning near- field optical microscope. Locally detected leakage radiation from the SP provides detailed information on the paths of SP propagation, in particular the influence of perturbations. Global detection provides representative average data on the SP properties of a given metal film and its structures. A groove of 200 nm width, for instance, reflects/transmits about 15%/80% of 'blue-green' SP radiation at normal incidence.

AB - Surface plasmon (SP) reflectivity and transmissivity of narrow grooves in silver films are studied. The SP source is the probe of a scanning near- field optical microscope. Locally detected leakage radiation from the SP provides detailed information on the paths of SP propagation, in particular the influence of perturbations. Global detection provides representative average data on the SP properties of a given metal film and its structures. A groove of 200 nm width, for instance, reflects/transmits about 15%/80% of 'blue-green' SP radiation at normal incidence.

KW - Integrated plasmon optics

KW - Near-field optics

KW - Reflectivity of grooves

KW - Structured silver films

KW - Surface plasmon

KW - Transmissivity

UR - http://www.scopus.com/inward/record.url?scp=0032989594&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0032989594&partnerID=8YFLogxK

U2 - 10.1046/j.1365-2818.1999.00500.x

DO - 10.1046/j.1365-2818.1999.00500.x

M3 - Article

C2 - 11388309

AN - SCOPUS:0032989594

VL - 194

SP - 571

EP - 573

JO - Journal of Microscopy

JF - Journal of Microscopy

SN - 0022-2720

IS - 2-3

ER -