Performance measurements of CMOS SSPM as PET detector

Purushottam Dokhale, Rohan Nagarkar, Rob Robertson, Mickel McClish, Christopher Stapels, James Christian, Gerald Entine, Michael Squillante, Simon R Cherry, Kanai Shah

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations


We have designed and developed a complementary metal-oxide-semiconductor (CMOS) solid-state photomultiplier (SSPM). We have studied this novel SSPM as a readout of LYSO scintillator for use in positron emission tomography (PET). Here we present energy resolution, coincidence timing resolution, depth of interaction measurements and flood imaging studies with SSPMs coupled to LYSO scintilators. Two different sizes, 3×3 mm2 and 1.5×1.5 mm2 SSPMs were studied. The measured FWHM energy resolution with 511 keV gamma rays was 22% for the detector consisting 3×3 mm2 SSPM coupled to a 3×3×15 mm3 LYSO and 11.2 % for the detector consisting 1.5×1.5 mm2 SSPM coupled to 1.5×1.5×10 mm3 LYSO. The timing resolution measured was 1.8 ns for the 3×3 mm2 detector in coincidence with a detector consisting LSO coupled to PMT. The coincidence timing resolution was 530 ps for 1.5×1.5 mm 2 detector. The measured depth-of-interaction resolution by coupling two 1.5×1.5 mm2 SSPMs on opposite ends of a 1.5×1.5×20 mm3 LYSO scintillator was 2.5 mm. The flood histogram was recorded with a 4×4 LYSO array, each element measuring 1.5×1.5×15 mm3 coupled to a position sensitive SSPM (PS-SSPM) consist of a 4×4 array of SSPM elements. The flood image was distortion free, all 16 elements were clearly visible and well separated from each other.

Original languageEnglish (US)
Title of host publicationIEEE Nuclear Science Symposium Conference Record
Number of pages5
StatePublished - 2007
Event2007 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS-MIC - Honolulu, HI, United States
Duration: Oct 27 2007Nov 3 2007


Other2007 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS-MIC
Country/TerritoryUnited States
CityHonolulu, HI

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Industrial and Manufacturing Engineering


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