Optical Microscopy in the Nano-World

Dieter W. Pohl, Hermann Bach, Martin A. Bopp, Volker Deckert, Pierre Descouts, Rolf Eckert, Hans Joachim Güntherodt, Christian Hafner, Bert Hecht, Harry Heinzelmann, Thomas R Huser, Mark Jobin, Ursula Keller, Thilo Lacoste, Patrick Lambelet, Fabienne Marquis-Weible, Olivier J F Martin, Alfred J. Meixner, Bettina Nechay, Lukas NovotnyMichael Pfeiffer, Claude Philipona, Taras Plakhotnik, Alois Renn, Abdeljalil Sayah, Joao Manuel Segura, Beate Sick, Uwe Siegner, Guido Tarrach, Rüdiger Vahldieck, Urs P. Wild, Dieter Zeisel, Renato Zenobi

Research output: Contribution to journalArticle

5 Scopus citations


Scanning near-field optical microscopy (SNOM) is an optical microscopy whose resolution is not bound to the diffraction limit. It provides chemical information based upon spectral, polarization and/or fluorescence contrast images. Details as small as 20 nm can be recognized. Photophysical and photochemical effects can be studied with SNOM on a similar scale. This article reviews a good deal of the experimental and theoretical work on SNOM in Switzerland. * Correspondence: Dr. D.W. Pohl a).

Original languageEnglish (US)
Pages (from-to)760-767
Number of pages8
Issue number10
Publication statusPublished - 1997
Externally publishedYes


ASJC Scopus subject areas

  • Chemistry(all)

Cite this

Pohl, D. W., Bach, H., Bopp, M. A., Deckert, V., Descouts, P., Eckert, R., ... Zenobi, R. (1997). Optical Microscopy in the Nano-World. Chimia, 51(10), 760-767.