Opportunities in phosphorene plasmonic metasurfaces

D. Correas Serrano, Juan Sebastian Gomez Diaz, A. Alvarez-Melcon, A. Alu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We investigate the use of black phosphorus thin films in infrared plasmonics and discuss spatial dispersion effects. For appropriate film thickness, black phosphorus exhibits a moderate bandgap suitable for operation in this frequency band, and the intrinsic anisotropy of its conductivity tensor provides exciting possibilities in metasurfaces/reflectarray design, such as polarization-dependent devices and unusual topological transitions for plasmons induced by electrical or mechanical bias. We study the limits on plasmon confinement and field enhancement imposed by spatial dispersion and demonstrate that these bounds are looser than in graphene. These findings may lead to infrared plasmonic devices enabling light-matter interactions beyond the capabilities of other plasmonic materials, with exciting applications in sensing, thermal imaging, and heat scavenging.

Original languageEnglish (US)
Title of host publication2017 11th European Conference on Antennas and Propagation, EUCAP 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages3900-3902
Number of pages3
ISBN (Electronic)9788890701870
DOIs
StatePublished - May 15 2017
Event11th European Conference on Antennas and Propagation, EUCAP 2017 - Paris, France
Duration: Mar 19 2017Mar 24 2017

Other

Other11th European Conference on Antennas and Propagation, EUCAP 2017
CountryFrance
CityParis
Period3/19/173/24/17

Keywords

  • Black phosphorus
  • metasurfaces
  • plasmonics
  • spatial dispersion

ASJC Scopus subject areas

  • Safety Research
  • Computer Networks and Communications
  • Signal Processing
  • Instrumentation

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  • Cite this

    Serrano, D. C., Gomez Diaz, J. S., Alvarez-Melcon, A., & Alu, A. (2017). Opportunities in phosphorene plasmonic metasurfaces. In 2017 11th European Conference on Antennas and Propagation, EUCAP 2017 (pp. 3900-3902). [7928623] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/EuCAP.2017.7928623