Observation of photoexcited emission clusters in the bulk of KDP and laser conditioning under 355-nm irradiation

S. G. Demos, M. Staggs, M. Yan, H. B. Radousky, J. J. De Yoreo

Research output: Chapter in Book/Report/Conference proceedingChapter

3 Scopus citations

Abstract

Defect clusters in the bulk of large KDP crystals are revealed using a microscopic fluorescence imaging system and CW laser illumination. Exposure of the crystal to high power 355-nm, 3-ns laser irradiation leads to a significant reduction of the number of observed optically active centers. The initially observed defect cluster concentration is approximately 10 4-10 6 per mm 3 depending on the crystal growth method and sector of the crystal. The number of defect clusters can be reduced by a factor of 10 2 or more under exposure to 355-nm laser irradiation while their average intensities also decreases. Spectroscopic measurements provide information on the electronic structure of the defects.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSociety of Photo-Optical Instrumentation Engineers
Pages509-515
Number of pages7
Volume3578
StatePublished - 1999
Externally publishedYes
EventProceedings of the 1998 30th Annual Boulder Damage Symposium on Optical Materials for High-Power Lasers - 1998 - Boulder, CO, USA
Duration: Sep 28 1998Oct 1 1998

Other

OtherProceedings of the 1998 30th Annual Boulder Damage Symposium on Optical Materials for High-Power Lasers - 1998
CityBoulder, CO, USA
Period9/28/9810/1/98

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

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    Demos, S. G., Staggs, M., Yan, M., Radousky, H. B., & De Yoreo, J. J. (1999). Observation of photoexcited emission clusters in the bulk of KDP and laser conditioning under 355-nm irradiation. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3578, pp. 509-515). Society of Photo-Optical Instrumentation Engineers.