Observation and analysis of near-field optical diffraction

Thomas R Huser, L. Novotny, Th Lacoste, R. Eckert, H. Heinzelmann

Research output: Contribution to journalArticle

24 Citations (Scopus)

Abstract

We present an experimental study of near-field optical interactions between an optical probe and sample objects with different dielectric properties. The interaction strongly affects the radiation emitted at angles beyond the critical angle of total internal reflection in the substrate (the forbidden light regime). Such an effect has been predicted theoretically. Our experimental data show that if a conducting object is close to the optical probe, p-polarized optical fields are deflected away from the object. On the other hand, s-polarized fields are deflected toward dielectric objects. The experimental results show good qualitative agreement with numerical simulations. The described effects have a strong influence on image formation in scanning near-field optical microscopy and thus have to be taken into account for image analysis.

Original languageEnglish (US)
Pages (from-to)141-148
Number of pages8
JournalJournal of the Optical Society of America A: Optics and Image Science, and Vision
Volume16
Issue number1
StatePublished - 1999
Externally publishedYes

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Diffraction
Near field scanning optical microscopy
Dielectric properties
Image analysis
Image processing
Radiation
Computer simulation
Substrates

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Computer Vision and Pattern Recognition
  • Engineering(all)

Cite this

Huser, T. R., Novotny, L., Lacoste, T., Eckert, R., & Heinzelmann, H. (1999). Observation and analysis of near-field optical diffraction. Journal of the Optical Society of America A: Optics and Image Science, and Vision, 16(1), 141-148.

Observation and analysis of near-field optical diffraction. / Huser, Thomas R; Novotny, L.; Lacoste, Th; Eckert, R.; Heinzelmann, H.

In: Journal of the Optical Society of America A: Optics and Image Science, and Vision, Vol. 16, No. 1, 1999, p. 141-148.

Research output: Contribution to journalArticle

Huser, TR, Novotny, L, Lacoste, T, Eckert, R & Heinzelmann, H 1999, 'Observation and analysis of near-field optical diffraction', Journal of the Optical Society of America A: Optics and Image Science, and Vision, vol. 16, no. 1, pp. 141-148.
Huser, Thomas R ; Novotny, L. ; Lacoste, Th ; Eckert, R. ; Heinzelmann, H. / Observation and analysis of near-field optical diffraction. In: Journal of the Optical Society of America A: Optics and Image Science, and Vision. 1999 ; Vol. 16, No. 1. pp. 141-148.
@article{631836e915e843719866288a3911da6d,
title = "Observation and analysis of near-field optical diffraction",
abstract = "We present an experimental study of near-field optical interactions between an optical probe and sample objects with different dielectric properties. The interaction strongly affects the radiation emitted at angles beyond the critical angle of total internal reflection in the substrate (the forbidden light regime). Such an effect has been predicted theoretically. Our experimental data show that if a conducting object is close to the optical probe, p-polarized optical fields are deflected away from the object. On the other hand, s-polarized fields are deflected toward dielectric objects. The experimental results show good qualitative agreement with numerical simulations. The described effects have a strong influence on image formation in scanning near-field optical microscopy and thus have to be taken into account for image analysis.",
author = "Huser, {Thomas R} and L. Novotny and Th Lacoste and R. Eckert and H. Heinzelmann",
year = "1999",
language = "English (US)",
volume = "16",
pages = "141--148",
journal = "Journal of the Optical Society of America. A, Optics and image science",
issn = "1084-7529",
publisher = "The Optical Society",
number = "1",

}

TY - JOUR

T1 - Observation and analysis of near-field optical diffraction

AU - Huser, Thomas R

AU - Novotny, L.

AU - Lacoste, Th

AU - Eckert, R.

AU - Heinzelmann, H.

PY - 1999

Y1 - 1999

N2 - We present an experimental study of near-field optical interactions between an optical probe and sample objects with different dielectric properties. The interaction strongly affects the radiation emitted at angles beyond the critical angle of total internal reflection in the substrate (the forbidden light regime). Such an effect has been predicted theoretically. Our experimental data show that if a conducting object is close to the optical probe, p-polarized optical fields are deflected away from the object. On the other hand, s-polarized fields are deflected toward dielectric objects. The experimental results show good qualitative agreement with numerical simulations. The described effects have a strong influence on image formation in scanning near-field optical microscopy and thus have to be taken into account for image analysis.

AB - We present an experimental study of near-field optical interactions between an optical probe and sample objects with different dielectric properties. The interaction strongly affects the radiation emitted at angles beyond the critical angle of total internal reflection in the substrate (the forbidden light regime). Such an effect has been predicted theoretically. Our experimental data show that if a conducting object is close to the optical probe, p-polarized optical fields are deflected away from the object. On the other hand, s-polarized fields are deflected toward dielectric objects. The experimental results show good qualitative agreement with numerical simulations. The described effects have a strong influence on image formation in scanning near-field optical microscopy and thus have to be taken into account for image analysis.

UR - http://www.scopus.com/inward/record.url?scp=0032607736&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0032607736&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0032607736

VL - 16

SP - 141

EP - 148

JO - Journal of the Optical Society of America. A, Optics and image science

JF - Journal of the Optical Society of America. A, Optics and image science

SN - 1084-7529

IS - 1

ER -