Oblique incidence reflectivity difference as an In Situ probe of Co electrodeposition on polycrystalline Au

W. Schwarzacher, J. Gray, X. D. Zhu

Research output: Contribution to journalArticle

19 Scopus citations

Abstract

We apply a special form of ellipsometry, oblique incidence optical reflectivity difference (OI-RD), which is optimized to detect changes at a surface, to Co electrodeposition on polycrystalline Au. The OI-RD signal shown to be proportional to Co thickness and thus enables the separation of the Co deposition and H2 evolution partial currents. Competition between the two processes gives rise to interesting effects, including the observation of a peak in the Co partial current during both the anodic and cathodic sweeps of a cyclic voltammogram taken after repeated cycles of Co deposition and dissolution.

Original languageEnglish (US)
JournalElectrochemical and Solid-State Letters
Volume6
Issue number5
DOIs
StatePublished - May 2003

ASJC Scopus subject areas

  • Electrochemistry
  • Materials Science(all)

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