Noise-robust coherent diffractive imaging with a single diffraction pattern

A. V. Martin, F. Wang, N. D. Loh, T. Ekeberg, F. R.N.C. Maia, M. Hantke, G. Van Der Schot, C. Y. Hampton, R. G. Sierra, A. Aquila, S. Bajt, M. Barthelmess, C. Bostedt, J. D. Bozek, N. Coppola, S. W. Epp, B. Erk, H. Fleckenstein, L. Foucar, Matthias FrankH. Graafsma, L. Gumprecht, A. Hartmann, R. Hartmann, G. Hauser, H. Hirsemann, P. Holl, S. Kassemeyer, N. Kimmel, M. Liang, L. Lomb, S. Marchesini, K. Nass, E. Pedersoli, C. Reich, D. Rolles, B. Rudek, A. Rudenko, J. Schulz, R. L. Shoeman, H. Soltau, D. Starodub, J. Steinbrener, F. Stellato, L. Strüder, J. Ullrich, G. Weidenspointner, T. A. White, C. B. Wunderer, A. Barty, I. Schlichting, M. J. Bogan, H. N. Chapman

Research output: Contribution to journalArticle

61 Scopus citations

Abstract

The resolution of single-shot coherent diffractive imaging at X-ray free-electron laser facilities is limited by the low signal-to-noise level of diffraction data at high scattering angles. The iterative reconstruction methods, which phase a continuous diffraction pattern to produce an image must be able to extract information from these weak signals to obtain the best quality images. Here we show how to modify iterative reconstruction methods to improve tolerance to noise. The method is demonstrated with the hybrid input-output method on both simulated data and single-shot diffraction patterns taken at the Linac Coherent Light Source.

Original languageEnglish (US)
Pages (from-to)16650-16661
Number of pages12
JournalOptics Express
Volume20
Issue number15
DOIs
StatePublished - Jul 16 2012
Externally publishedYes

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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    Martin, A. V., Wang, F., Loh, N. D., Ekeberg, T., Maia, F. R. N. C., Hantke, M., Van Der Schot, G., Hampton, C. Y., Sierra, R. G., Aquila, A., Bajt, S., Barthelmess, M., Bostedt, C., Bozek, J. D., Coppola, N., Epp, S. W., Erk, B., Fleckenstein, H., Foucar, L., ... Chapman, H. N. (2012). Noise-robust coherent diffractive imaging with a single diffraction pattern. Optics Express, 20(15), 16650-16661. https://doi.org/10.1364/OE.20.016650