New Algorithm to Enable Construction and Display of 3D Structures from Scanning Probe Microscopy Images Acquired Layer-by-Layer

William Nanqiao Deng, Shuo Wang, Joao Ventrici De Souza, Tonya L. Kuhl, Gang-yu Liu

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Scanning probe microscopy (SPM), such as atomic force microscopy (AFM), is widely known for high-resolution imaging of surface structures and nanolithography in two dimensions (2D), providing important physical insights into surface science and material science. This work reports a new algorithm to enable construction and display of layer-by-layer 3D structures from SPM images. The algorithm enables alignment of SPM images acquired during layer-by-layer deposition and removal of redundant features and faithfully constructs the deposited 3D structures. The display uses a "see-through" strategy to enable the structure of each layer to be visible. The results demonstrate high spatial accuracy as well as algorithm versatility; users can set parameters for reconstruction and display as per image quality and research needs. To the best of our knowledge, this method represents the first report to enable SPM technology for 3D imaging construction and display. The detailed algorithm is provided to facilitate usage of the same approach in any SPM software. These new capabilities support wide applications of SPM that require 3D image reconstruction and display, such as 3D nanoprinting and 3D additive and subtractive manufacturing and imaging.

Original languageEnglish (US)
Pages (from-to)5756-5763
Number of pages8
JournalJournal of Physical Chemistry A
Volume122
Issue number26
DOIs
StatePublished - Jul 5 2018

Fingerprint

Scanning probe microscopy
Display devices
microscopy
scanning
probes
Imaging techniques
Nanolithography
Materials science
versatility
materials science
image reconstruction
Image reconstruction
Surface structure
Image quality
Atomic force microscopy
manufacturing
alignment
atomic force microscopy
computer programs
high resolution

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry

Cite this

New Algorithm to Enable Construction and Display of 3D Structures from Scanning Probe Microscopy Images Acquired Layer-by-Layer. / Deng, William Nanqiao; Wang, Shuo; Ventrici De Souza, Joao; Kuhl, Tonya L.; Liu, Gang-yu.

In: Journal of Physical Chemistry A, Vol. 122, No. 26, 05.07.2018, p. 5756-5763.

Research output: Contribution to journalArticle

Deng, William Nanqiao ; Wang, Shuo ; Ventrici De Souza, Joao ; Kuhl, Tonya L. ; Liu, Gang-yu. / New Algorithm to Enable Construction and Display of 3D Structures from Scanning Probe Microscopy Images Acquired Layer-by-Layer. In: Journal of Physical Chemistry A. 2018 ; Vol. 122, No. 26. pp. 5756-5763.
@article{4dc29596183b46248e849484281348ca,
title = "New Algorithm to Enable Construction and Display of 3D Structures from Scanning Probe Microscopy Images Acquired Layer-by-Layer",
abstract = "Scanning probe microscopy (SPM), such as atomic force microscopy (AFM), is widely known for high-resolution imaging of surface structures and nanolithography in two dimensions (2D), providing important physical insights into surface science and material science. This work reports a new algorithm to enable construction and display of layer-by-layer 3D structures from SPM images. The algorithm enables alignment of SPM images acquired during layer-by-layer deposition and removal of redundant features and faithfully constructs the deposited 3D structures. The display uses a {"}see-through{"} strategy to enable the structure of each layer to be visible. The results demonstrate high spatial accuracy as well as algorithm versatility; users can set parameters for reconstruction and display as per image quality and research needs. To the best of our knowledge, this method represents the first report to enable SPM technology for 3D imaging construction and display. The detailed algorithm is provided to facilitate usage of the same approach in any SPM software. These new capabilities support wide applications of SPM that require 3D image reconstruction and display, such as 3D nanoprinting and 3D additive and subtractive manufacturing and imaging.",
author = "Deng, {William Nanqiao} and Shuo Wang and {Ventrici De Souza}, Joao and Kuhl, {Tonya L.} and Gang-yu Liu",
year = "2018",
month = "7",
day = "5",
doi = "10.1021/acs.jpca.8b03417",
language = "English (US)",
volume = "122",
pages = "5756--5763",
journal = "Journal of Physical Chemistry A",
issn = "1089-5639",
publisher = "American Chemical Society",
number = "26",

}

TY - JOUR

T1 - New Algorithm to Enable Construction and Display of 3D Structures from Scanning Probe Microscopy Images Acquired Layer-by-Layer

AU - Deng, William Nanqiao

AU - Wang, Shuo

AU - Ventrici De Souza, Joao

AU - Kuhl, Tonya L.

AU - Liu, Gang-yu

PY - 2018/7/5

Y1 - 2018/7/5

N2 - Scanning probe microscopy (SPM), such as atomic force microscopy (AFM), is widely known for high-resolution imaging of surface structures and nanolithography in two dimensions (2D), providing important physical insights into surface science and material science. This work reports a new algorithm to enable construction and display of layer-by-layer 3D structures from SPM images. The algorithm enables alignment of SPM images acquired during layer-by-layer deposition and removal of redundant features and faithfully constructs the deposited 3D structures. The display uses a "see-through" strategy to enable the structure of each layer to be visible. The results demonstrate high spatial accuracy as well as algorithm versatility; users can set parameters for reconstruction and display as per image quality and research needs. To the best of our knowledge, this method represents the first report to enable SPM technology for 3D imaging construction and display. The detailed algorithm is provided to facilitate usage of the same approach in any SPM software. These new capabilities support wide applications of SPM that require 3D image reconstruction and display, such as 3D nanoprinting and 3D additive and subtractive manufacturing and imaging.

AB - Scanning probe microscopy (SPM), such as atomic force microscopy (AFM), is widely known for high-resolution imaging of surface structures and nanolithography in two dimensions (2D), providing important physical insights into surface science and material science. This work reports a new algorithm to enable construction and display of layer-by-layer 3D structures from SPM images. The algorithm enables alignment of SPM images acquired during layer-by-layer deposition and removal of redundant features and faithfully constructs the deposited 3D structures. The display uses a "see-through" strategy to enable the structure of each layer to be visible. The results demonstrate high spatial accuracy as well as algorithm versatility; users can set parameters for reconstruction and display as per image quality and research needs. To the best of our knowledge, this method represents the first report to enable SPM technology for 3D imaging construction and display. The detailed algorithm is provided to facilitate usage of the same approach in any SPM software. These new capabilities support wide applications of SPM that require 3D image reconstruction and display, such as 3D nanoprinting and 3D additive and subtractive manufacturing and imaging.

UR - http://www.scopus.com/inward/record.url?scp=85048540158&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85048540158&partnerID=8YFLogxK

U2 - 10.1021/acs.jpca.8b03417

DO - 10.1021/acs.jpca.8b03417

M3 - Article

AN - SCOPUS:85048540158

VL - 122

SP - 5756

EP - 5763

JO - Journal of Physical Chemistry A

JF - Journal of Physical Chemistry A

SN - 1089-5639

IS - 26

ER -