Molecule-specific imaging analysis of carcinogens in breast cancer cells using time-of-flight secondary ion mass spectrometry

J. N. Quong; M. G. Knize; K. S. Kulp; K. J. Wu

doi:10.1016/j.apsusc.2004.03.156

Molecule-specific imaging analysis of carcinogens in breast cancer cells using time-of-flight secondary ion mass spectrometry

J. N. Quong, M. G. Knize, K. S. Kulp, K. J. Wu

Research output: Contribution to journal › Article › peer-review

18 Scopus citations

Abstract

Imaging time-of-flight secondary ion mass spectrometry (TOF-SIMS) was used to study the localization of heterocyclic amines in MCF-7 line of human breast cancer cells. The detection sensitivities of a model rodent mutagen, 2-amino-1-methyl-6-phenylimidazo[4,5-b]pyridine (PhIP), were determined. Following an established criteria for the determination of status of freeze-fracture cells, the distribution of PhIP in the MCF-7 cells was reported.

Original language	English (US)
Pages (from-to)	424-427
Number of pages	4
Journal	Applied Surface Science
Volume	231-232
DOIs	https://doi.org/10.1016/j.apsusc.2004.03.156
State	Published - Jun 15 2004
Externally published	Yes

Keywords

Imaging
MCF-7 cell
TOF-SIMS

ASJC Scopus subject areas

Physical and Theoretical Chemistry
Surfaces, Coatings and Films
Condensed Matter Physics

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@article{0156e14c5f43496ab31139dcce2494f1,

title = "Molecule-specific imaging analysis of carcinogens in breast cancer cells using time-of-flight secondary ion mass spectrometry",

abstract = "Imaging time-of-flight secondary ion mass spectrometry (TOF-SIMS) was used to study the localization of heterocyclic amines in MCF-7 line of human breast cancer cells. The detection sensitivities of a model rodent mutagen, 2-amino-1-methyl-6-phenylimidazo[4,5-b]pyridine (PhIP), were determined. Following an established criteria for the determination of status of freeze-fracture cells, the distribution of PhIP in the MCF-7 cells was reported.",

keywords = "Imaging, MCF-7 cell, TOF-SIMS",

author = "Quong, {J. N.} and Knize, {M. G.} and Kulp, {K. S.} and Wu, {K. J.}",

year = "2004",

month = jun,

day = "15",

doi = "10.1016/j.apsusc.2004.03.156",

language = "English (US)",

volume = "231-232",

pages = "424--427",

journal = "Applied Surface Science",

issn = "0169-4332",

publisher = "Elsevier",

}

TY - JOUR

T1 - Molecule-specific imaging analysis of carcinogens in breast cancer cells using time-of-flight secondary ion mass spectrometry

AU - Quong, J. N.

AU - Knize, M. G.

AU - Kulp, K. S.

AU - Wu, K. J.

PY - 2004/6/15

Y1 - 2004/6/15

N2 - Imaging time-of-flight secondary ion mass spectrometry (TOF-SIMS) was used to study the localization of heterocyclic amines in MCF-7 line of human breast cancer cells. The detection sensitivities of a model rodent mutagen, 2-amino-1-methyl-6-phenylimidazo[4,5-b]pyridine (PhIP), were determined. Following an established criteria for the determination of status of freeze-fracture cells, the distribution of PhIP in the MCF-7 cells was reported.

AB - Imaging time-of-flight secondary ion mass spectrometry (TOF-SIMS) was used to study the localization of heterocyclic amines in MCF-7 line of human breast cancer cells. The detection sensitivities of a model rodent mutagen, 2-amino-1-methyl-6-phenylimidazo[4,5-b]pyridine (PhIP), were determined. Following an established criteria for the determination of status of freeze-fracture cells, the distribution of PhIP in the MCF-7 cells was reported.

KW - Imaging

KW - MCF-7 cell

KW - TOF-SIMS

UR - http://www.scopus.com/inward/record.url?scp=2942534275&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=2942534275&partnerID=8YFLogxK

U2 - 10.1016/j.apsusc.2004.03.156

DO - 10.1016/j.apsusc.2004.03.156

M3 - Article

AN - SCOPUS:2942534275

VL - 231-232

SP - 424

EP - 427

JO - Applied Surface Science

JF - Applied Surface Science

SN - 0169-4332

ER -