Microscopic spectral imaging of defect centers in KDP

S. G. Demos, M. Yan, M. Staggs, H. B. Radousky, J. J. De Yoreo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The presence of defect clusters in the bulk of large KH2PO4 (KDP) crystals is investigated using a spectral imaging technique and a microscopic optical system allowing for 1 micron spatial resolution. The observed particle concentration varies between 104-106 per mm3 depending on the crystal growth method and sector of the crystal. Exposure in high power 355 nm, 3 ns laser irradiation leads to a significant reduction of the number of observed defect centers.

Original languageEnglish (US)
Title of host publicationIEEE Nonlinear Optics: Materials, Fundamentals and Applications - Conference Proceedings
Place of PublicationPiscataway, NJ, United States
PublisherIEEE
Pages66-68
Number of pages3
StatePublished - 1998
Externally publishedYes
EventProceedings of the 1998 IEEE Nonlinear Optics Topical Meeting - Princeville, HI, USA
Duration: Aug 10 1998Aug 14 1998

Other

OtherProceedings of the 1998 IEEE Nonlinear Optics Topical Meeting
CityPrinceville, HI, USA
Period8/10/988/14/98

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Demos, S. G., Yan, M., Staggs, M., Radousky, H. B., & De Yoreo, J. J. (1998). Microscopic spectral imaging of defect centers in KDP. In IEEE Nonlinear Optics: Materials, Fundamentals and Applications - Conference Proceedings (pp. 66-68). IEEE.