Microscopic spectral imaging of defect centers in KDP

S. G. Demos, M. Yan, M. Staggs, H. B. Radousky, J. J. De Yoreo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The presence of defect clusters in the bulk of large KH2PO4 (KDP) crystals is investigated using a spectral imaging technique and a microscopic optical system allowing for 1 micron spatial resolution. The observed particle concentration varies between 104-106 per mm3 depending on the crystal growth method and sector of the crystal. Exposure in high power 355 nm, 3 ns laser irradiation leads to a significant reduction of the number of observed defect centers.

Original languageEnglish (US)
Title of host publicationIEEE Nonlinear Optics: Materials, Fundamentals and Applications - Conference Proceedings
Place of PublicationPiscataway, NJ, United States
PublisherIEEE
Pages66-68
Number of pages3
StatePublished - 1998
Externally publishedYes
EventProceedings of the 1998 IEEE Nonlinear Optics Topical Meeting - Princeville, HI, USA
Duration: Aug 10 1998Aug 14 1998

Other

OtherProceedings of the 1998 IEEE Nonlinear Optics Topical Meeting
CityPrinceville, HI, USA
Period8/10/988/14/98

Fingerprint

Imaging techniques
Defects
Crystals
Laser beam effects
Crystal growth
Optical systems

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Demos, S. G., Yan, M., Staggs, M., Radousky, H. B., & De Yoreo, J. J. (1998). Microscopic spectral imaging of defect centers in KDP. In IEEE Nonlinear Optics: Materials, Fundamentals and Applications - Conference Proceedings (pp. 66-68). Piscataway, NJ, United States: IEEE.

Microscopic spectral imaging of defect centers in KDP. / Demos, S. G.; Yan, M.; Staggs, M.; Radousky, H. B.; De Yoreo, J. J.

IEEE Nonlinear Optics: Materials, Fundamentals and Applications - Conference Proceedings. Piscataway, NJ, United States : IEEE, 1998. p. 66-68.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Demos, SG, Yan, M, Staggs, M, Radousky, HB & De Yoreo, JJ 1998, Microscopic spectral imaging of defect centers in KDP. in IEEE Nonlinear Optics: Materials, Fundamentals and Applications - Conference Proceedings. IEEE, Piscataway, NJ, United States, pp. 66-68, Proceedings of the 1998 IEEE Nonlinear Optics Topical Meeting, Princeville, HI, USA, 8/10/98.
Demos SG, Yan M, Staggs M, Radousky HB, De Yoreo JJ. Microscopic spectral imaging of defect centers in KDP. In IEEE Nonlinear Optics: Materials, Fundamentals and Applications - Conference Proceedings. Piscataway, NJ, United States: IEEE. 1998. p. 66-68
Demos, S. G. ; Yan, M. ; Staggs, M. ; Radousky, H. B. ; De Yoreo, J. J. / Microscopic spectral imaging of defect centers in KDP. IEEE Nonlinear Optics: Materials, Fundamentals and Applications - Conference Proceedings. Piscataway, NJ, United States : IEEE, 1998. pp. 66-68
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