A microscopic fluorescence imaging system is used to detect optically active centers located inside a transparent dielectric crystal. Defect centers in the bulk of KH2PO4 crystals are imaged based on their near-infrared emission following photoexcitation. The spatial resolution of the system is 1 μm in the image plane and 25 μm in depth. The experimental results indicate the presence of a large number of optically active defect clusters in different KH2PO4 crystals, whereas the concentration of these clusters depends on the crystal sector and growth method.
|Original language||English (US)|
|Number of pages||3|
|State||Published - Feb 15 1999|
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics