Microscopic fluorescence imaging of bulk defect clusters in KH2PO4 crystals

S. G. Demos; M. Staggs; M. Yan; H. B. Radousky; J. J. De Yoreo

Microscopic fluorescence imaging of bulk defect clusters in KH₂PO₄ crystals

S. G. Demos, M. Staggs, M. Yan, H. B. Radousky, J. J. De Yoreo

Research output: Contribution to journal › Article › peer-review

Abstract

A microscopic fluorescence imaging system is used to detect optically active centers located inside a transparent dielectric crystal. Defect centers in the bulk of KH₂PO₄ crystals are imaged based on their near-infrared emission following photoexcitation. The spatial resolution of the system is 1 μm in the image plane and 25 μm in depth. The experimental results indicate the presence of a large number of optically active defect clusters in different KH₂PO₄ crystals, whereas the concentration of these clusters depends on the crystal sector and growth method.

Original language	English (US)
Pages (from-to)	268-270
Number of pages	3
Journal	Optics Letters
Volume	24
Issue number	4
State	Published - Feb 15 1999
Externally published	Yes

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics

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title = "Microscopic fluorescence imaging of bulk defect clusters in KH2PO4 crystals",

abstract = "A microscopic fluorescence imaging system is used to detect optically active centers located inside a transparent dielectric crystal. Defect centers in the bulk of KH2PO4 crystals are imaged based on their near-infrared emission following photoexcitation. The spatial resolution of the system is 1 μm in the image plane and 25 μm in depth. The experimental results indicate the presence of a large number of optically active defect clusters in different KH2PO4 crystals, whereas the concentration of these clusters depends on the crystal sector and growth method.",

author = "Demos, {S. G.} and M. Staggs and M. Yan and Radousky, {H. B.} and {De Yoreo}, {J. J.}",

year = "1999",

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AU - Demos, S. G.

AU - Staggs, M.

AU - Yan, M.

AU - Radousky, H. B.

AU - De Yoreo, J. J.

PY - 1999/2/15

Y1 - 1999/2/15

N2 - A microscopic fluorescence imaging system is used to detect optically active centers located inside a transparent dielectric crystal. Defect centers in the bulk of KH2PO4 crystals are imaged based on their near-infrared emission following photoexcitation. The spatial resolution of the system is 1 μm in the image plane and 25 μm in depth. The experimental results indicate the presence of a large number of optically active defect clusters in different KH2PO4 crystals, whereas the concentration of these clusters depends on the crystal sector and growth method.

AB - A microscopic fluorescence imaging system is used to detect optically active centers located inside a transparent dielectric crystal. Defect centers in the bulk of KH2PO4 crystals are imaged based on their near-infrared emission following photoexcitation. The spatial resolution of the system is 1 μm in the image plane and 25 μm in depth. The experimental results indicate the presence of a large number of optically active defect clusters in different KH2PO4 crystals, whereas the concentration of these clusters depends on the crystal sector and growth method.

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