Abstract
A microscopic fluorescence imaging system is used to detect optically active centers located inside a transparent dielectric crystal. Defect centers in the bulk of KH2PO4 crystals are imaged based on their near-infrared emission following photoexcitation. The spatial resolution of the system is 1 μm in the image plane and 25 μm in depth. The experimental results indicate the presence of a large number of optically active defect clusters in different KH2PO4 crystals, whereas the concentration of these clusters depends on the crystal sector and growth method.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 268-270 |
| Number of pages | 3 |
| Journal | Optics Letters |
| Volume | 24 |
| Issue number | 4 |
| State | Published - Feb 15 1999 |
| Externally published | Yes |
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ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
Cite this
Microscopic fluorescence imaging of bulk defect clusters in KH2PO4 crystals. / Demos, S. G.; Staggs, M.; Yan, M.; Radousky, H. B.; De Yoreo, J. J.
In: Optics Letters, Vol. 24, No. 4, 15.02.1999, p. 268-270.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Microscopic fluorescence imaging of bulk defect clusters in KH2PO4 crystals
AU - Demos, S. G.
AU - Staggs, M.
AU - Yan, M.
AU - Radousky, H. B.
AU - De Yoreo, J. J.
PY - 1999/2/15
Y1 - 1999/2/15
N2 - A microscopic fluorescence imaging system is used to detect optically active centers located inside a transparent dielectric crystal. Defect centers in the bulk of KH2PO4 crystals are imaged based on their near-infrared emission following photoexcitation. The spatial resolution of the system is 1 μm in the image plane and 25 μm in depth. The experimental results indicate the presence of a large number of optically active defect clusters in different KH2PO4 crystals, whereas the concentration of these clusters depends on the crystal sector and growth method.
AB - A microscopic fluorescence imaging system is used to detect optically active centers located inside a transparent dielectric crystal. Defect centers in the bulk of KH2PO4 crystals are imaged based on their near-infrared emission following photoexcitation. The spatial resolution of the system is 1 μm in the image plane and 25 μm in depth. The experimental results indicate the presence of a large number of optically active defect clusters in different KH2PO4 crystals, whereas the concentration of these clusters depends on the crystal sector and growth method.
UR - http://www.scopus.com/inward/record.url?scp=0001265873&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0001265873&partnerID=8YFLogxK
M3 - Article
C2 - 18071476
AN - SCOPUS:0001265873
VL - 24
SP - 268
EP - 270
JO - Optics Letters
JF - Optics Letters
SN - 0146-9592
IS - 4
ER -