Measurement of coincidence timing resolution with CdTe detectors

Y. Shao, H. B. Barber, S. Balzer, Simon R Cherry

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Scopus citations

Abstract

The coincidence timing resolution is a critical performance parameter to determine if direct gamma-ray detection by semiconductor detector materials such as CdTe or CdZnTe may be suitable for use in positron emission tomography (PET) systems. We report experimental results of the coincidence timing resolution measured with a pair of 2×2×10 mm 3 CdTe detectors irradiated by 511 keV gamma rays under conditions that allow good timing resolution and good energy resolution to be obtained simultaneously. The measured coincidence time resolutions ranged from 14 ns (350 keV lower energy threshold) to 24 ns (100 keV lower energy threshold). We also found that the coincidence timing resolution was proportional to the signal rise time, and that both of these were proportional to the electron transit time.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSociety of Photo-Optical Instrumentation Engineers
Pages254-264
Number of pages11
Volume4142
DOIs
StatePublished - 2000
EventPenetrating Radiation Systems and Applications II - San Diego, CA, USA
Duration: Aug 2 2000Aug 3 2000

Other

OtherPenetrating Radiation Systems and Applications II
CitySan Diego, CA, USA
Period8/2/008/3/00

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

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    Shao, Y., Barber, H. B., Balzer, S., & Cherry, S. R. (2000). Measurement of coincidence timing resolution with CdTe detectors. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 4142, pp. 254-264). Society of Photo-Optical Instrumentation Engineers. https://doi.org/10.1117/12.410570