Abstract
The magnetic domain structures in thin Fe xNi (1-x) films were investigated. Element-specific information was obtained by photoemission electron microscope. It was found that Fe and Ni formed a good alloy with no evidence of segregation. Results show that domain size is influenced by the thickness and the stoichiometry of the films.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 135-139 |
| Number of pages | 5 |
| Journal | Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films |
| Volume | 22 |
| Issue number | 1 |
| DOIs | |
| State | Published - Jan 2004 |
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ASJC Scopus subject areas
- Surfaces, Coatings and Films
- Surfaces and Interfaces
- Physics and Astronomy (miscellaneous)
Cite this
Magnetic domain structures in ultrathin Fe xNi 1-x films on Cu(111) : Dependence on film thickness and stoichiometry. / Sato, Y.; Johnson, T. F.; Chiang, S.; Giacomo, J. A.; Zhu, X. D.; Land, D. P.; Nolting, F.; Scholl, A.
In: Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, Vol. 22, No. 1, 01.2004, p. 135-139.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Magnetic domain structures in ultrathin Fe xNi 1-x films on Cu(111)
T2 - Dependence on film thickness and stoichiometry
AU - Sato, Y.
AU - Johnson, T. F.
AU - Chiang, S.
AU - Giacomo, J. A.
AU - Zhu, X. D.
AU - Land, D. P.
AU - Nolting, F.
AU - Scholl, A.
PY - 2004/1
Y1 - 2004/1
N2 - The magnetic domain structures in thin Fe xNi (1-x) films were investigated. Element-specific information was obtained by photoemission electron microscope. It was found that Fe and Ni formed a good alloy with no evidence of segregation. Results show that domain size is influenced by the thickness and the stoichiometry of the films.
AB - The magnetic domain structures in thin Fe xNi (1-x) films were investigated. Element-specific information was obtained by photoemission electron microscope. It was found that Fe and Ni formed a good alloy with no evidence of segregation. Results show that domain size is influenced by the thickness and the stoichiometry of the films.
UR - http://www.scopus.com/inward/record.url?scp=1242306895&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=1242306895&partnerID=8YFLogxK
U2 - 10.1116/1.1631295
DO - 10.1116/1.1631295
M3 - Article
AN - SCOPUS:1242306895
VL - 22
SP - 135
EP - 139
JO - Journal of Vacuum Science and Technology A
JF - Journal of Vacuum Science and Technology A
SN - 0734-2101
IS - 1
ER -