Magnetic domain structures in ultrathin Fe xNi 1-x films on Cu(111): Dependence on film thickness and stoichiometry

Y. Sato; T. F. Johnson; S. Chiang; J. A. Giacomo; X. D. Zhu; D. P. Land; F. Nolting; A. Scholl

doi:10.1116/1.1631295

Magnetic domain structures in ultrathin Fe _xNi _1-x films on Cu(111): Dependence on film thickness and stoichiometry

Y. Sato, T. F. Johnson, S. Chiang, J. A. Giacomo, X. D. Zhu, D. P. Land, F. Nolting, A. Scholl

Physics, Applied Physics

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

The magnetic domain structures in thin Fe _xNi _(1-x) films were investigated. Element-specific information was obtained by photoemission electron microscope. It was found that Fe and Ni formed a good alloy with no evidence of segregation. Results show that domain size is influenced by the thickness and the stoichiometry of the films.

Original language	English (US)
Pages (from-to)	135-139
Number of pages	5
Journal	Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume	22
Issue number	1
DOIs	https://doi.org/10.1116/1.1631295
State	Published - Jan 2004

ASJC Scopus subject areas

Surfaces, Coatings and Films
Surfaces and Interfaces
Physics and Astronomy (miscellaneous)

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Magnetic domain structures in ultrathin Fe _xNi _1-x films on Cu(111) : Dependence on film thickness and stoichiometry. / Sato, Y.; Johnson, T. F.; Chiang, S.; Giacomo, J. A.; Zhu, X. D.; Land, D. P.; Nolting, F.; Scholl, A.

In: Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, Vol. 22, No. 1, 01.2004, p. 135-139.

Research output: Contribution to journal › Article › peer-review

@article{4f3482745b6c415da010a1aeb2f48b6b,

title = "Magnetic domain structures in ultrathin Fe xNi 1-x films on Cu(111): Dependence on film thickness and stoichiometry",

abstract = "The magnetic domain structures in thin Fe xNi (1-x) films were investigated. Element-specific information was obtained by photoemission electron microscope. It was found that Fe and Ni formed a good alloy with no evidence of segregation. Results show that domain size is influenced by the thickness and the stoichiometry of the films.",

author = "Y. Sato and Johnson, {T. F.} and S. Chiang and Giacomo, {J. A.} and Zhu, {X. D.} and Land, {D. P.} and F. Nolting and A. Scholl",

year = "2004",

month = jan,

doi = "10.1116/1.1631295",

language = "English (US)",

volume = "22",

pages = "135--139",

journal = "Journal of Vacuum Science and Technology A",

issn = "0734-2101",

publisher = "AVS Science and Technology Society",

number = "1",

}

TY - JOUR

T1 - Magnetic domain structures in ultrathin Fe xNi 1-x films on Cu(111)

T2 - Dependence on film thickness and stoichiometry

AU - Sato, Y.

AU - Johnson, T. F.

AU - Chiang, S.

AU - Giacomo, J. A.

AU - Zhu, X. D.

AU - Land, D. P.

AU - Nolting, F.

AU - Scholl, A.

PY - 2004/1

Y1 - 2004/1

N2 - The magnetic domain structures in thin Fe xNi (1-x) films were investigated. Element-specific information was obtained by photoemission electron microscope. It was found that Fe and Ni formed a good alloy with no evidence of segregation. Results show that domain size is influenced by the thickness and the stoichiometry of the films.

AB - The magnetic domain structures in thin Fe xNi (1-x) films were investigated. Element-specific information was obtained by photoemission electron microscope. It was found that Fe and Ni formed a good alloy with no evidence of segregation. Results show that domain size is influenced by the thickness and the stoichiometry of the films.

UR - http://www.scopus.com/inward/record.url?scp=1242306895&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=1242306895&partnerID=8YFLogxK

U2 - 10.1116/1.1631295

DO - 10.1116/1.1631295

M3 - Article

AN - SCOPUS:1242306895

VL - 22

SP - 135

EP - 139

JO - Journal of Vacuum Science and Technology A

JF - Journal of Vacuum Science and Technology A

SN - 0734-2101

IS - 1

ER -