Least squares method for analyzing broadened x-ray line shapes

R. H. Howell, Dennis L Matthews

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

A method for obtaining values of the widths and other parameters describing the Gaussian and Lorentzian components of peaks, which have the shape of the convolution of those functions, is described. Results of the method are given for X-ray data containing several peaks with different ratios of the composite widths in separate spectra.

Original languageEnglish (US)
Pages (from-to)513-515
Number of pages3
JournalJournal of Quantitative Spectroscopy and Radiative Transfer
Volume23
Issue number5
DOIs
StatePublished - 1980
Externally publishedYes

Fingerprint

least squares method
Convolution
line shape
X rays
Composite materials
convolution integrals
x rays
composite materials

ASJC Scopus subject areas

  • Spectroscopy
  • Atomic and Molecular Physics, and Optics

Cite this

Least squares method for analyzing broadened x-ray line shapes. / Howell, R. H.; Matthews, Dennis L.

In: Journal of Quantitative Spectroscopy and Radiative Transfer, Vol. 23, No. 5, 1980, p. 513-515.

Research output: Contribution to journalArticle

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