Abstract
Photoexcited defect clusters in the bulk of KH2PO4 crystals are investigated using a microscopic fluorescence imaging system with 1 μm spatial resolution. The observed defect cluster concentration is approximately 104-106 per mm3 depending on the crystal growth method and sector of the crystal. The intensity of the emission clusters varies widely within the image field while a nearly uniformly distributed background is present. Spectroscopic measurements provided information on the emission characteristics of the observed defect population.
Original language | English (US) |
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Pages (from-to) | 3988-3992 |
Number of pages | 5 |
Journal | Journal of Applied Physics |
Volume | 85 |
Issue number | 8 I |
State | Published - Apr 15 1999 |
Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Physics and Astronomy (miscellaneous)