Abstract
This work is an experimental investigation to evaluate the potential of fluorescence microscopy as a tool to detect surface contamination as well as reveal surface damage precursors on DKDP and SIO 2 optics. To achieve these technical objectives, microscopic imaging systems were built that also incorporated in-situ damage testing capabilities. Fluorescence imaging experiments were performed using 351-nm laser excitation while damage testing was performed at relatively high laser fluences. The experimental results demonstrated the potential of this technique to address the aforementioned technical issues.
| Original language | English (US) |
|---|---|
| Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
| Editors | G.J. Exarhos, A.H. Guenter, K.L. Lewis, M.J. Soileau, C.J. Stolz |
| Pages | 347-359 |
| Number of pages | 13 |
| Volume | 4679 |
| DOIs | |
| State | Published - 2002 |
| Externally published | Yes |
| Event | Laser-Induced Damage in Optical Materials: 2001 - Boulder, CO, United States Duration: Oct 1 2001 → Oct 2 2001 |
Other
| Other | Laser-Induced Damage in Optical Materials: 2001 |
|---|---|
| Country | United States |
| City | Boulder, CO |
| Period | 10/1/01 → 10/2/01 |
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Keywords
- DKDP
- KDP
- Laser-induced damage
- SiO
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics
Cite this
Investigation of fluorescence microscopy as a tool for noninvasive detection and imaging of damage precursors at 351-nm. / Demos, S. G.; Nostrand, M. C.; Staggs, M.; Carr, C. W.; Hahn, D.; Kozlowski, M. R.; Sheehan, L.; Battersby, C.; Burnham, A.
Proceedings of SPIE - The International Society for Optical Engineering. ed. / G.J. Exarhos; A.H. Guenter; K.L. Lewis; M.J. Soileau; C.J. Stolz. Vol. 4679 2002. p. 347-359.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Investigation of fluorescence microscopy as a tool for noninvasive detection and imaging of damage precursors at 351-nm
AU - Demos, S. G.
AU - Nostrand, M. C.
AU - Staggs, M.
AU - Carr, C. W.
AU - Hahn, D.
AU - Kozlowski, M. R.
AU - Sheehan, L.
AU - Battersby, C.
AU - Burnham, A.
PY - 2002
Y1 - 2002
N2 - This work is an experimental investigation to evaluate the potential of fluorescence microscopy as a tool to detect surface contamination as well as reveal surface damage precursors on DKDP and SIO 2 optics. To achieve these technical objectives, microscopic imaging systems were built that also incorporated in-situ damage testing capabilities. Fluorescence imaging experiments were performed using 351-nm laser excitation while damage testing was performed at relatively high laser fluences. The experimental results demonstrated the potential of this technique to address the aforementioned technical issues.
AB - This work is an experimental investigation to evaluate the potential of fluorescence microscopy as a tool to detect surface contamination as well as reveal surface damage precursors on DKDP and SIO 2 optics. To achieve these technical objectives, microscopic imaging systems were built that also incorporated in-situ damage testing capabilities. Fluorescence imaging experiments were performed using 351-nm laser excitation while damage testing was performed at relatively high laser fluences. The experimental results demonstrated the potential of this technique to address the aforementioned technical issues.
KW - DKDP
KW - KDP
KW - Laser-induced damage
KW - SiO
UR - http://www.scopus.com/inward/record.url?scp=0036033904&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0036033904&partnerID=8YFLogxK
U2 - 10.1117/12.461715
DO - 10.1117/12.461715
M3 - Conference contribution
AN - SCOPUS:0036033904
VL - 4679
SP - 347
EP - 359
BT - Proceedings of SPIE - The International Society for Optical Engineering
A2 - Exarhos, G.J.
A2 - Guenter, A.H.
A2 - Lewis, K.L.
A2 - Soileau, M.J.
A2 - Stolz, C.J.
ER -