Investigation of fluorescence microscopy as a tool for noninvasive detection and imaging of damage precursors at 351-nm

S. G. Demos; M. C. Nostrand; M. Staggs; C. W. Carr; D. Hahn; M. R. Kozlowski; L. Sheehan; C. Battersby; A. Burnham

doi:10.1117/12.461715

Investigation of fluorescence microscopy as a tool for noninvasive detection and imaging of damage precursors at 351-nm

S. G. Demos, M. C. Nostrand, M. Staggs, C. W. Carr, D. Hahn, M. R. Kozlowski, L. Sheehan, C. Battersby, A. Burnham

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

10 Scopus citations

Abstract

This work is an experimental investigation to evaluate the potential of fluorescence microscopy as a tool to detect surface contamination as well as reveal surface damage precursors on DKDP and SIO ₂ optics. To achieve these technical objectives, microscopic imaging systems were built that also incorporated in-situ damage testing capabilities. Fluorescence imaging experiments were performed using 351-nm laser excitation while damage testing was performed at relatively high laser fluences. The experimental results demonstrated the potential of this technique to address the aforementioned technical issues.

Original language	English (US)
Title of host publication	Proceedings of SPIE - The International Society for Optical Engineering
Editors	G.J. Exarhos, A.H. Guenter, K.L. Lewis, M.J. Soileau, C.J. Stolz
Pages	347-359
Number of pages	13
Volume	4679
DOIs	https://doi.org/10.1117/12.461715
State	Published - 2002
Externally published	Yes
Event	Laser-Induced Damage in Optical Materials: 2001 - Boulder, CO, United States Duration: Oct 1 2001 → Oct 2 2001

Other

Other	Laser-Induced Damage in Optical Materials: 2001
Country/Territory	United States
City	Boulder, CO
Period	10/1/01 → 10/2/01

Keywords

DKDP
KDP
Laser-induced damage
SiO

ASJC Scopus subject areas

Electrical and Electronic Engineering
Condensed Matter Physics

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10.1117/12.461715

Cite this

Demos, S. G., Nostrand, M. C., Staggs, M., Carr, C. W., Hahn, D., Kozlowski, M. R., Sheehan, L., Battersby, C., & Burnham, A. (2002). Investigation of fluorescence microscopy as a tool for noninvasive detection and imaging of damage precursors at 351-nm. In G. J. Exarhos, A. H. Guenter, K. L. Lewis, M. J. Soileau, & C. J. Stolz (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 4679, pp. 347-359) https://doi.org/10.1117/12.461715

Investigation of fluorescence microscopy as a tool for noninvasive detection and imaging of damage precursors at 351-nm. / Demos, S. G.; Nostrand, M. C.; Staggs, M.; Carr, C. W.; Hahn, D.; Kozlowski, M. R.; Sheehan, L.; Battersby, C.; Burnham, A.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / G.J. Exarhos; A.H. Guenter; K.L. Lewis; M.J. Soileau; C.J. Stolz. Vol. 4679 2002. p. 347-359.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Demos, SG, Nostrand, MC, Staggs, M, Carr, CW, Hahn, D, Kozlowski, MR, Sheehan, L, Battersby, C & Burnham, A 2002, Investigation of fluorescence microscopy as a tool for noninvasive detection and imaging of damage precursors at 351-nm. in GJ Exarhos, AH Guenter, KL Lewis, MJ Soileau & CJ Stolz (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 4679, pp. 347-359, Laser-Induced Damage in Optical Materials: 2001, Boulder, CO, United States, 10/1/01. https://doi.org/10.1117/12.461715

Demos SG, Nostrand MC, Staggs M, Carr CW, Hahn D, Kozlowski MR et al. Investigation of fluorescence microscopy as a tool for noninvasive detection and imaging of damage precursors at 351-nm. In Exarhos GJ, Guenter AH, Lewis KL, Soileau MJ, Stolz CJ, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 4679. 2002. p. 347-359 https://doi.org/10.1117/12.461715

Demos, S. G. ; Nostrand, M. C. ; Staggs, M. ; Carr, C. W. ; Hahn, D. ; Kozlowski, M. R. ; Sheehan, L. ; Battersby, C. ; Burnham, A. / Investigation of fluorescence microscopy as a tool for noninvasive detection and imaging of damage precursors at 351-nm. Proceedings of SPIE - The International Society for Optical Engineering. editor / G.J. Exarhos ; A.H. Guenter ; K.L. Lewis ; M.J. Soileau ; C.J. Stolz. Vol. 4679 2002. pp. 347-359

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Investigation of fluorescence microscopy as a tool for noninvasive detection and imaging of damage precursors at 351-nm

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Keywords

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