Abstract
This work is an experimental investigation to evaluate the potential of fluorescence microscopy as a tool to detect surface contamination as well as reveal surface damage precursors on DKDP and SIO 2 optics. To achieve these technical objectives, microscopic imaging systems were built that also incorporated in-situ damage testing capabilities. Fluorescence imaging experiments were performed using 351-nm laser excitation while damage testing was performed at relatively high laser fluences. The experimental results demonstrated the potential of this technique to address the aforementioned technical issues.
Original language | English (US) |
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Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
Editors | G.J. Exarhos, A.H. Guenter, K.L. Lewis, M.J. Soileau, C.J. Stolz |
Pages | 347-359 |
Number of pages | 13 |
Volume | 4679 |
DOIs | |
State | Published - 2002 |
Externally published | Yes |
Event | Laser-Induced Damage in Optical Materials: 2001 - Boulder, CO, United States Duration: Oct 1 2001 → Oct 2 2001 |
Other
Other | Laser-Induced Damage in Optical Materials: 2001 |
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Country/Territory | United States |
City | Boulder, CO |
Period | 10/1/01 → 10/2/01 |
Keywords
- DKDP
- KDP
- Laser-induced damage
- SiO
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics