In situ optical characterization of LaAlO3 epitaxy on SrTiO3(001)

X. D. Zhu, Sebastian Wicklein, Felix Gunkel, Rui Xiao, Regina Dittmann

Research output: Contribution to journalArticlepeer-review

3 Scopus citations


We followed the growth of LaAlO3 (LAO) on TiO2-terminated SrTiO3(001) in situ using a combination of a special monochromatic ellipsometry at photon energy of 1.96 eV and reflection high-energy electron diffraction (RHEED). We find that the phase of the ellipsometric ratio, defined as , changes linearly with the LAO film thickness. From the 4th unit cell (uc) up to the 11th unit cell, the slope of change in Δ is different from that for the initial three unit cells and yet there is no abrupt change in Δ when the LAO thickness increases from 3 uc to 4 uc. We explore structural and electronic processes in the LaAlO3-SrTiO3system that may be responsible for such an in situ observed optical response.

Original languageEnglish (US)
Article number37006
JournalEurophysics Letters
Issue number3
StatePublished - Feb 1 2015

ASJC Scopus subject areas

  • Physics and Astronomy(all)


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