Abstract
We followed the growth of LaAlO3 (LAO) on TiO2-terminated SrTiO3(001) in situ using a combination of a special monochromatic ellipsometry at photon energy of 1.96 eV and reflection high-energy electron diffraction (RHEED). We find that the phase of the ellipsometric ratio, defined as , changes linearly with the LAO film thickness. From the 4th unit cell (uc) up to the 11th unit cell, the slope of change in Δ is different from that for the initial three unit cells and yet there is no abrupt change in Δ when the LAO thickness increases from 3 uc to 4 uc. We explore structural and electronic processes in the LaAlO3-SrTiO3system that may be responsible for such an in situ observed optical response.
| Original language | English (US) |
|---|---|
| Article number | 37006 |
| Journal | Europhysics Letters |
| Volume | 109 |
| Issue number | 3 |
| DOIs | |
| State | Published - Feb 1 2015 |
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ASJC Scopus subject areas
- Physics and Astronomy(all)
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In situ optical characterization of LaAlO3 epitaxy on SrTiO3(001). / Zhu, X. D.; Wicklein, Sebastian; Gunkel, Felix; Xiao, Rui; Dittmann, Regina.
In: Europhysics Letters, Vol. 109, No. 3, 37006, 01.02.2015.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - In situ optical characterization of LaAlO3 epitaxy on SrTiO3(001)
AU - Zhu, X. D.
AU - Wicklein, Sebastian
AU - Gunkel, Felix
AU - Xiao, Rui
AU - Dittmann, Regina
PY - 2015/2/1
Y1 - 2015/2/1
N2 - We followed the growth of LaAlO3 (LAO) on TiO2-terminated SrTiO3(001) in situ using a combination of a special monochromatic ellipsometry at photon energy of 1.96 eV and reflection high-energy electron diffraction (RHEED). We find that the phase of the ellipsometric ratio, defined as , changes linearly with the LAO film thickness. From the 4th unit cell (uc) up to the 11th unit cell, the slope of change in Δ is different from that for the initial three unit cells and yet there is no abrupt change in Δ when the LAO thickness increases from 3 uc to 4 uc. We explore structural and electronic processes in the LaAlO3-SrTiO3system that may be responsible for such an in situ observed optical response.
AB - We followed the growth of LaAlO3 (LAO) on TiO2-terminated SrTiO3(001) in situ using a combination of a special monochromatic ellipsometry at photon energy of 1.96 eV and reflection high-energy electron diffraction (RHEED). We find that the phase of the ellipsometric ratio, defined as , changes linearly with the LAO film thickness. From the 4th unit cell (uc) up to the 11th unit cell, the slope of change in Δ is different from that for the initial three unit cells and yet there is no abrupt change in Δ when the LAO thickness increases from 3 uc to 4 uc. We explore structural and electronic processes in the LaAlO3-SrTiO3system that may be responsible for such an in situ observed optical response.
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U2 - 10.1209/0295-5075/109/37006
DO - 10.1209/0295-5075/109/37006
M3 - Article
VL - 109
JO - Europhysics Letters
JF - Europhysics Letters
SN - 0295-5075
IS - 3
M1 - 37006
ER -