In situ optical characterization of LaAlO3 epitaxy on SrTiO3(001)

X. D. Zhu; Sebastian Wicklein; Felix Gunkel; Rui Xiao; Regina Dittmann

doi:10.1209/0295-5075/109/37006

In situ optical characterization of LaAlO3 epitaxy on SrTiO3(001)

X. D. Zhu, Sebastian Wicklein, Felix Gunkel, Rui Xiao, Regina Dittmann

Physics, Applied Physics

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

We followed the growth of LaAlO₃ (LAO) on TiO₂-terminated SrTiO₃(001) in situ using a combination of a special monochromatic ellipsometry at photon energy of 1.96 eV and reflection high-energy electron diffraction (RHEED). We find that the phase of the ellipsometric ratio, defined as , changes linearly with the LAO film thickness. From the 4th unit cell (uc) up to the 11th unit cell, the slope of change in Δ is different from that for the initial three unit cells and yet there is no abrupt change in Δ when the LAO thickness increases from 3 uc to 4 uc. We explore structural and electronic processes in the LaAlO₃-SrTiO₃system that may be responsible for such an in situ observed optical response.

Original language	English (US)
Article number	37006
Journal	Europhysics Letters
Volume	109
Issue number	3
DOIs	https://doi.org/10.1209/0295-5075/109/37006
State	Published - Feb 1 2015

ASJC Scopus subject areas

Physics and Astronomy(all)

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@article{301f61bcfa614fdfbee6652beec8ed3a,

title = "In situ optical characterization of LaAlO3 epitaxy on SrTiO3(001)",

abstract = "We followed the growth of LaAlO3 (LAO) on TiO2-terminated SrTiO3(001) in situ using a combination of a special monochromatic ellipsometry at photon energy of 1.96 eV and reflection high-energy electron diffraction (RHEED). We find that the phase of the ellipsometric ratio, defined as , changes linearly with the LAO film thickness. From the 4th unit cell (uc) up to the 11th unit cell, the slope of change in Δ is different from that for the initial three unit cells and yet there is no abrupt change in Δ when the LAO thickness increases from 3 uc to 4 uc. We explore structural and electronic processes in the LaAlO3-SrTiO3system that may be responsible for such an in situ observed optical response.",

author = "Zhu, {X. D.} and Sebastian Wicklein and Felix Gunkel and Rui Xiao and Regina Dittmann",

year = "2015",

month = feb,

day = "1",

doi = "10.1209/0295-5075/109/37006",

language = "English (US)",

volume = "109",

journal = "Europhysics Letters",

issn = "0295-5075",

publisher = "IOP Publishing Ltd.",

number = "3",

}

TY - JOUR

T1 - In situ optical characterization of LaAlO3 epitaxy on SrTiO3(001)

AU - Zhu, X. D.

AU - Wicklein, Sebastian

AU - Gunkel, Felix

AU - Xiao, Rui

AU - Dittmann, Regina

PY - 2015/2/1

Y1 - 2015/2/1

N2 - We followed the growth of LaAlO3 (LAO) on TiO2-terminated SrTiO3(001) in situ using a combination of a special monochromatic ellipsometry at photon energy of 1.96 eV and reflection high-energy electron diffraction (RHEED). We find that the phase of the ellipsometric ratio, defined as , changes linearly with the LAO film thickness. From the 4th unit cell (uc) up to the 11th unit cell, the slope of change in Δ is different from that for the initial three unit cells and yet there is no abrupt change in Δ when the LAO thickness increases from 3 uc to 4 uc. We explore structural and electronic processes in the LaAlO3-SrTiO3system that may be responsible for such an in situ observed optical response.

AB - We followed the growth of LaAlO3 (LAO) on TiO2-terminated SrTiO3(001) in situ using a combination of a special monochromatic ellipsometry at photon energy of 1.96 eV and reflection high-energy electron diffraction (RHEED). We find that the phase of the ellipsometric ratio, defined as , changes linearly with the LAO film thickness. From the 4th unit cell (uc) up to the 11th unit cell, the slope of change in Δ is different from that for the initial three unit cells and yet there is no abrupt change in Δ when the LAO thickness increases from 3 uc to 4 uc. We explore structural and electronic processes in the LaAlO3-SrTiO3system that may be responsible for such an in situ observed optical response.

UR - http://www.scopus.com/inward/record.url?scp=84923234039&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84923234039&partnerID=8YFLogxK

U2 - 10.1209/0295-5075/109/37006

DO - 10.1209/0295-5075/109/37006

M3 - Article

AN - SCOPUS:84923234039

VL - 109

JO - Europhysics Letters

JF - Europhysics Letters

SN - 0295-5075

IS - 3

M1 - 37006

ER -