In situ optical characterization of LaAlO3 epitaxy on SrTiO3(001)

X. D. Zhu; Sebastian Wicklein; Felix Gunkel; Rui Xiao; Regina Dittmann

doi:10.1209/0295-5075/109/37006

In situ optical characterization of LaAlO3 epitaxy on SrTiO3(001)

X. D. Zhu, Sebastian Wicklein, Felix Gunkel, Rui Xiao, Regina Dittmann

Physics, Applied Physics

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

We followed the growth of LaAlO₃ (LAO) on TiO₂-terminated SrTiO₃(001) in situ using a combination of a special monochromatic ellipsometry at photon energy of 1.96 eV and reflection high-energy electron diffraction (RHEED). We find that the phase of the ellipsometric ratio, defined as , changes linearly with the LAO film thickness. From the 4th unit cell (uc) up to the 11th unit cell, the slope of change in Δ is different from that for the initial three unit cells and yet there is no abrupt change in Δ when the LAO thickness increases from 3 uc to 4 uc. We explore structural and electronic processes in the LaAlO₃-SrTiO₃system that may be responsible for such an in situ observed optical response.

Original language	English (US)
Article number	37006
Journal	Europhysics Letters
Volume	109
Issue number	3
DOIs	https://doi.org/10.1209/0295-5075/109/37006
State	Published - Feb 1 2015

ASJC Scopus subject areas

Physics and Astronomy(all)

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title = "In situ optical characterization of LaAlO3 epitaxy on SrTiO3(001)",

abstract = "We followed the growth of LaAlO3 (LAO) on TiO2-terminated SrTiO3(001) in situ using a combination of a special monochromatic ellipsometry at photon energy of 1.96 eV and reflection high-energy electron diffraction (RHEED). We find that the phase of the ellipsometric ratio, defined as , changes linearly with the LAO film thickness. From the 4th unit cell (uc) up to the 11th unit cell, the slope of change in Δ is different from that for the initial three unit cells and yet there is no abrupt change in Δ when the LAO thickness increases from 3 uc to 4 uc. We explore structural and electronic processes in the LaAlO3-SrTiO3system that may be responsible for such an in situ observed optical response.",

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AU - Zhu, X. D.

AU - Wicklein, Sebastian

AU - Gunkel, Felix

AU - Xiao, Rui

AU - Dittmann, Regina

PY - 2015/2/1

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AB - We followed the growth of LaAlO3 (LAO) on TiO2-terminated SrTiO3(001) in situ using a combination of a special monochromatic ellipsometry at photon energy of 1.96 eV and reflection high-energy electron diffraction (RHEED). We find that the phase of the ellipsometric ratio, defined as , changes linearly with the LAO film thickness. From the 4th unit cell (uc) up to the 11th unit cell, the slope of change in Δ is different from that for the initial three unit cells and yet there is no abrupt change in Δ when the LAO thickness increases from 3 uc to 4 uc. We explore structural and electronic processes in the LaAlO3-SrTiO3system that may be responsible for such an in situ observed optical response.

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In situ optical characterization of LaAlO3 epitaxy on SrTiO3(001)

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