Abstract
We followed the growth of LaAlO3 (LAO) on TiO2-terminated SrTiO3(001) in situ using a combination of a special monochromatic ellipsometry at photon energy of 1.96 eV and reflection high-energy electron diffraction (RHEED). We find that the phase of the ellipsometric ratio, defined as , changes linearly with the LAO film thickness. From the 4th unit cell (uc) up to the 11th unit cell, the slope of change in Δ is different from that for the initial three unit cells and yet there is no abrupt change in Δ when the LAO thickness increases from 3 uc to 4 uc. We explore structural and electronic processes in the LaAlO3-SrTiO3system that may be responsible for such an in situ observed optical response.
Original language | English (US) |
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Article number | 37006 |
Journal | Europhysics Letters |
Volume | 109 |
Issue number | 3 |
DOIs | |
State | Published - Feb 1 2015 |
ASJC Scopus subject areas
- Physics and Astronomy(all)