Improving digit span assessment of short-term verbal memory

David L Woods, Mark M. Kishiyama, E. William Yund, Timothy J. Herron, Ben Edwards, Oren Poliva, Robert F. Hink, Bruce R Reed

Research output: Contribution to journalArticle

67 Citations (Scopus)

Abstract

We measured digit span (DS) in two experiments that used computerized presentation of randomized auditory digits with performance-adapted list length adjustment. A new mean span (MS) metric of DS was developed that showed reduced variance, improved test-retest reliability, and higher correlations with the results of other neuropsychological test results when compared to traditional DS measures. The MS metric also enhanced the sensitivity of forward versus backward span comparisons, enabled the development of normative performance criteria with subdigit precision, and elucidated changes in DS performance with age and education level. Computerized stimulus delivery and improved scoring metrics significantly enhance the precision of DS assessments of short-term verbal memory.

Original languageEnglish (US)
Pages (from-to)101-111
Number of pages11
JournalJournal of Clinical and Experimental Neuropsychology
Volume33
Issue number1
DOIs
StatePublished - Jan 2011

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Social Adjustment
Neuropsychological Tests
Short-Term Memory
Reproducibility of Results
Education

Keywords

  • Aging
  • Attention
  • Auditory
  • Computer
  • Digit span
  • Education
  • Executive function
  • Metrics
  • Verbal memory

ASJC Scopus subject areas

  • Clinical Neurology
  • Neurology
  • Clinical Psychology

Cite this

Improving digit span assessment of short-term verbal memory. / Woods, David L; Kishiyama, Mark M.; Yund, E. William; Herron, Timothy J.; Edwards, Ben; Poliva, Oren; Hink, Robert F.; Reed, Bruce R.

In: Journal of Clinical and Experimental Neuropsychology, Vol. 33, No. 1, 01.2011, p. 101-111.

Research output: Contribution to journalArticle

Woods, David L ; Kishiyama, Mark M. ; Yund, E. William ; Herron, Timothy J. ; Edwards, Ben ; Poliva, Oren ; Hink, Robert F. ; Reed, Bruce R. / Improving digit span assessment of short-term verbal memory. In: Journal of Clinical and Experimental Neuropsychology. 2011 ; Vol. 33, No. 1. pp. 101-111.
@article{0d7d0458fc324874b5dfce725b65dd23,
title = "Improving digit span assessment of short-term verbal memory",
abstract = "We measured digit span (DS) in two experiments that used computerized presentation of randomized auditory digits with performance-adapted list length adjustment. A new mean span (MS) metric of DS was developed that showed reduced variance, improved test-retest reliability, and higher correlations with the results of other neuropsychological test results when compared to traditional DS measures. The MS metric also enhanced the sensitivity of forward versus backward span comparisons, enabled the development of normative performance criteria with subdigit precision, and elucidated changes in DS performance with age and education level. Computerized stimulus delivery and improved scoring metrics significantly enhance the precision of DS assessments of short-term verbal memory.",
keywords = "Aging, Attention, Auditory, Computer, Digit span, Education, Executive function, Metrics, Verbal memory",
author = "Woods, {David L} and Kishiyama, {Mark M.} and Yund, {E. William} and Herron, {Timothy J.} and Ben Edwards and Oren Poliva and Hink, {Robert F.} and Reed, {Bruce R}",
year = "2011",
month = "1",
doi = "10.1080/13803395.2010.493149",
language = "English (US)",
volume = "33",
pages = "101--111",
journal = "Journal of Clinical and Experimental Neuropsychology",
issn = "1380-3395",
publisher = "Psychology Press Ltd",
number = "1",

}

TY - JOUR

T1 - Improving digit span assessment of short-term verbal memory

AU - Woods, David L

AU - Kishiyama, Mark M.

AU - Yund, E. William

AU - Herron, Timothy J.

AU - Edwards, Ben

AU - Poliva, Oren

AU - Hink, Robert F.

AU - Reed, Bruce R

PY - 2011/1

Y1 - 2011/1

N2 - We measured digit span (DS) in two experiments that used computerized presentation of randomized auditory digits with performance-adapted list length adjustment. A new mean span (MS) metric of DS was developed that showed reduced variance, improved test-retest reliability, and higher correlations with the results of other neuropsychological test results when compared to traditional DS measures. The MS metric also enhanced the sensitivity of forward versus backward span comparisons, enabled the development of normative performance criteria with subdigit precision, and elucidated changes in DS performance with age and education level. Computerized stimulus delivery and improved scoring metrics significantly enhance the precision of DS assessments of short-term verbal memory.

AB - We measured digit span (DS) in two experiments that used computerized presentation of randomized auditory digits with performance-adapted list length adjustment. A new mean span (MS) metric of DS was developed that showed reduced variance, improved test-retest reliability, and higher correlations with the results of other neuropsychological test results when compared to traditional DS measures. The MS metric also enhanced the sensitivity of forward versus backward span comparisons, enabled the development of normative performance criteria with subdigit precision, and elucidated changes in DS performance with age and education level. Computerized stimulus delivery and improved scoring metrics significantly enhance the precision of DS assessments of short-term verbal memory.

KW - Aging

KW - Attention

KW - Auditory

KW - Computer

KW - Digit span

KW - Education

KW - Executive function

KW - Metrics

KW - Verbal memory

UR - http://www.scopus.com/inward/record.url?scp=78651268183&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=78651268183&partnerID=8YFLogxK

U2 - 10.1080/13803395.2010.493149

DO - 10.1080/13803395.2010.493149

M3 - Article

C2 - 20680884

AN - SCOPUS:78651268183

VL - 33

SP - 101

EP - 111

JO - Journal of Clinical and Experimental Neuropsychology

JF - Journal of Clinical and Experimental Neuropsychology

SN - 1380-3395

IS - 1

ER -