Improving 351-nm damage performance of large-aperture fused silica and DKDP optics

A. K. Burnham, L. Hackel, P. Wegner, T. Parham, L. Hrubesh, B. Penetrante, P. Whitman, S. Demos, J. Menapace, M. Runkel, M. Fluss, M. Feit, M. Key, T. Biesiada

Research output: Chapter in Book/Report/Conference proceedingConference contribution

47 Citations (Scopus)

Abstract

A program to identify and eliminate the causes of UV laser-induced damage and growth in fused silica and DKDP has developed methods to extend optics lifetimes for large-aperture, high-peak-power, UV lasers such as the National Ignition Facility (NIF). Issues included polish-related surface damage initiation and growth on fused silica and DKDP, bulk inclusions in fused silica, pinpoint bulk damage in DKDP, and UV-induced surface degradation in fused silica and DKDP in a vacuum. Approaches included an understanding of the mechanism of the damage, incremental improvements to existing fabrication technology, and feasibility studies of non-traditional fabrication technologies. Status and success of these various approaches are reviewed. Improvements were made in reducing surface damage initiation and eliminating growth for fused silica by improved polishing and post-processing steps, and improved analytical techniques are providing insights into mechanisms of DKDP damage. The NIF final optics hardware has been designed to enable easy retrieval, surface-damage mitigation, and recycling of optics.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsG.J. Exarhos, A.H. Guenter, K.L. Lewis, M.J. Soileau, C.J. Stolz
Pages173-185
Number of pages13
Volume4679
DOIs
StatePublished - 2002
Externally publishedYes
EventLaser-Induced Damage in Optical Materials: 2001 - Boulder, CO, United States
Duration: Oct 1 2001Oct 2 2001

Other

OtherLaser-Induced Damage in Optical Materials: 2001
CountryUnited States
CityBoulder, CO
Period10/1/0110/2/01

Fingerprint

Fused silica
Optics
apertures
optics
silicon dioxide
damage
Ignition
ultraviolet lasers
ignition
Fabrication
Laser damage
Polishing
fabrication
Recycling
recycling
Vacuum
polishing
Hardware
retrieval
Degradation

Keywords

  • DKDP
  • Fused silica
  • Laser damage
  • Laser damage growth
  • Laser damage mitigation

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Burnham, A. K., Hackel, L., Wegner, P., Parham, T., Hrubesh, L., Penetrante, B., ... Biesiada, T. (2002). Improving 351-nm damage performance of large-aperture fused silica and DKDP optics. In G. J. Exarhos, A. H. Guenter, K. L. Lewis, M. J. Soileau, & C. J. Stolz (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 4679, pp. 173-185) https://doi.org/10.1117/12.461712

Improving 351-nm damage performance of large-aperture fused silica and DKDP optics. / Burnham, A. K.; Hackel, L.; Wegner, P.; Parham, T.; Hrubesh, L.; Penetrante, B.; Whitman, P.; Demos, S.; Menapace, J.; Runkel, M.; Fluss, M.; Feit, M.; Key, M.; Biesiada, T.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / G.J. Exarhos; A.H. Guenter; K.L. Lewis; M.J. Soileau; C.J. Stolz. Vol. 4679 2002. p. 173-185.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Burnham, AK, Hackel, L, Wegner, P, Parham, T, Hrubesh, L, Penetrante, B, Whitman, P, Demos, S, Menapace, J, Runkel, M, Fluss, M, Feit, M, Key, M & Biesiada, T 2002, Improving 351-nm damage performance of large-aperture fused silica and DKDP optics. in GJ Exarhos, AH Guenter, KL Lewis, MJ Soileau & CJ Stolz (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 4679, pp. 173-185, Laser-Induced Damage in Optical Materials: 2001, Boulder, CO, United States, 10/1/01. https://doi.org/10.1117/12.461712
Burnham AK, Hackel L, Wegner P, Parham T, Hrubesh L, Penetrante B et al. Improving 351-nm damage performance of large-aperture fused silica and DKDP optics. In Exarhos GJ, Guenter AH, Lewis KL, Soileau MJ, Stolz CJ, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 4679. 2002. p. 173-185 https://doi.org/10.1117/12.461712
Burnham, A. K. ; Hackel, L. ; Wegner, P. ; Parham, T. ; Hrubesh, L. ; Penetrante, B. ; Whitman, P. ; Demos, S. ; Menapace, J. ; Runkel, M. ; Fluss, M. ; Feit, M. ; Key, M. ; Biesiada, T. / Improving 351-nm damage performance of large-aperture fused silica and DKDP optics. Proceedings of SPIE - The International Society for Optical Engineering. editor / G.J. Exarhos ; A.H. Guenter ; K.L. Lewis ; M.J. Soileau ; C.J. Stolz. Vol. 4679 2002. pp. 173-185
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