Improving 351-nm damage performance of large-aperture fused silica and DKDP optics

A. K. Burnham, L. Hackel, P. Wegner, T. Parham, L. Hrubesh, B. Penetrante, P. Whitman, S. Demos, J. Menapace, M. Runkel, M. Fluss, M. Feit, M. Key, T. Biesiada

Research output: Chapter in Book/Report/Conference proceedingConference contribution

51 Scopus citations


A program to identify and eliminate the causes of UV laser-induced damage and growth in fused silica and DKDP has developed methods to extend optics lifetimes for large-aperture, high-peak-power, UV lasers such as the National Ignition Facility (NIF). Issues included polish-related surface damage initiation and growth on fused silica and DKDP, bulk inclusions in fused silica, pinpoint bulk damage in DKDP, and UV-induced surface degradation in fused silica and DKDP in a vacuum. Approaches included an understanding of the mechanism of the damage, incremental improvements to existing fabrication technology, and feasibility studies of non-traditional fabrication technologies. Status and success of these various approaches are reviewed. Improvements were made in reducing surface damage initiation and eliminating growth for fused silica by improved polishing and post-processing steps, and improved analytical techniques are providing insights into mechanisms of DKDP damage. The NIF final optics hardware has been designed to enable easy retrieval, surface-damage mitigation, and recycling of optics.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsG.J. Exarhos, A.H. Guenter, K.L. Lewis, M.J. Soileau, C.J. Stolz
Number of pages13
StatePublished - 2002
Externally publishedYes
EventLaser-Induced Damage in Optical Materials: 2001 - Boulder, CO, United States
Duration: Oct 1 2001Oct 2 2001


OtherLaser-Induced Damage in Optical Materials: 2001
Country/TerritoryUnited States
CityBoulder, CO


  • DKDP
  • Fused silica
  • Laser damage
  • Laser damage growth
  • Laser damage mitigation

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics


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