Imaging microscopy with x-ray lasers at LLNL

Luiz B. Da Silva, James E. Trebes, Stan J. Mrowka, Brian J. MacGowan, Jeffrey A. Koch, Dennis L Matthews, Troy W. Barbee, Rod Balhorn, Joe W. Gray, Erik H. Anderson, D. Kern, David T. Attwood

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Imaging microscopy with short pulse (200 ps) x-ray lasers offers the opportunity of high resolution three-dimensional imaging of specimens in an aqueous environment without the blurring effects associated with natural motion. As a first step toward this goal we have performed imaging experiments which clearly resolved 500 angstrom features on a gold test pattern. In addition, we have taken images of dried biological specimens as a basis for comparison in future wet specimen imaging. The results of these experiments are described. We also discuss some of the alignment problems involved in doing x-ray microscopy with low repetition rate systems where in situ focusing of the imaging optics is not practical as single shot exposures can alter the specimen.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Place of PublicationBellingham, WA, United States
PublisherPubl by Int Soc for Optical Engineering
Pages154-159
Number of pages6
Volume1741
ISBN (Print)0819409146
StatePublished - 1993
Externally publishedYes
EventSoft X-Ray Microscopy - San Diego, CA, USA
Duration: Jul 19 1992Jul 21 1992

Other

OtherSoft X-Ray Microscopy
CitySan Diego, CA, USA
Period7/19/927/21/92

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

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  • Cite this

    Da Silva, L. B., Trebes, J. E., Mrowka, S. J., MacGowan, B. J., Koch, J. A., Matthews, D. L., Barbee, T. W., Balhorn, R., Gray, J. W., Anderson, E. H., Kern, D., & Attwood, D. T. (1993). Imaging microscopy with x-ray lasers at LLNL. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 1741, pp. 154-159). Publ by Int Soc for Optical Engineering.