Abstract
Soft x-ray microscopy offers the potential of extending imaging system resolutions below 100 nm with less destructive specimen preparation than electron microscopy. Imaging in the wavelength regime between 10 and 100 angstroms has been demonstrated with several techniques including scanning microscopy, imaging zone-plate microscopy, and Gabor or Fourier holography. Good transverse resolution has been demonstrated in these systems ( ι 100 nm) but the longitudinal or depth resolution has been very limited. Our approach to improving depth resolution is to combine multiple views of the object topographically. These systems present unique problems for computational image formation and enhancement.
| Original language | English (US) |
|---|---|
| Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
| Place of Publication | Bellingham, WA, United States |
| Publisher | Publ by Int Soc for Optical Engineering |
| Pages | 234-240 |
| Number of pages | 7 |
| Volume | 1741 |
| ISBN (Print) | 0819409146 |
| State | Published - 1993 |
| Externally published | Yes |
| Event | Soft X-Ray Microscopy - San Diego, CA, USA Duration: Jul 19 1992 → Jul 21 1992 |
Other
| Other | Soft X-Ray Microscopy |
|---|---|
| City | San Diego, CA, USA |
| Period | 7/19/92 → 7/21/92 |
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ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics
Cite this
Image reconstruction for x-ray holographic microscopy. / Brase, James M.; Yorkey, Thomas J.; Trebes, James E.; McNulty, Ian.
Proceedings of SPIE - The International Society for Optical Engineering. Vol. 1741 Bellingham, WA, United States : Publ by Int Soc for Optical Engineering, 1993. p. 234-240.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Image reconstruction for x-ray holographic microscopy
AU - Brase, James M.
AU - Yorkey, Thomas J.
AU - Trebes, James E.
AU - McNulty, Ian
PY - 1993
Y1 - 1993
N2 - Soft x-ray microscopy offers the potential of extending imaging system resolutions below 100 nm with less destructive specimen preparation than electron microscopy. Imaging in the wavelength regime between 10 and 100 angstroms has been demonstrated with several techniques including scanning microscopy, imaging zone-plate microscopy, and Gabor or Fourier holography. Good transverse resolution has been demonstrated in these systems ( ι 100 nm) but the longitudinal or depth resolution has been very limited. Our approach to improving depth resolution is to combine multiple views of the object topographically. These systems present unique problems for computational image formation and enhancement.
AB - Soft x-ray microscopy offers the potential of extending imaging system resolutions below 100 nm with less destructive specimen preparation than electron microscopy. Imaging in the wavelength regime between 10 and 100 angstroms has been demonstrated with several techniques including scanning microscopy, imaging zone-plate microscopy, and Gabor or Fourier holography. Good transverse resolution has been demonstrated in these systems ( ι 100 nm) but the longitudinal or depth resolution has been very limited. Our approach to improving depth resolution is to combine multiple views of the object topographically. These systems present unique problems for computational image formation and enhancement.
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UR - http://www.scopus.com/inward/citedby.url?scp=0027286864&partnerID=8YFLogxK
M3 - Conference contribution
SN - 0819409146
VL - 1741
SP - 234
EP - 240
BT - Proceedings of SPIE - The International Society for Optical Engineering
PB - Publ by Int Soc for Optical Engineering
CY - Bellingham, WA, United States
ER -