Image reconstruction for x-ray holographic microscopy

James M. Brase, Thomas J. Yorkey, James E. Trebes, Ian McNulty

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations


Soft x-ray microscopy offers the potential of extending imaging system resolutions below 100 nm with less destructive specimen preparation than electron microscopy. Imaging in the wavelength regime between 10 and 100 angstroms has been demonstrated with several techniques including scanning microscopy, imaging zone-plate microscopy, and Gabor or Fourier holography. Good transverse resolution has been demonstrated in these systems ( ι 100 nm) but the longitudinal or depth resolution has been very limited. Our approach to improving depth resolution is to combine multiple views of the object topographically. These systems present unique problems for computational image formation and enhancement.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Place of PublicationBellingham, WA, United States
PublisherPubl by Int Soc for Optical Engineering
Number of pages7
ISBN (Print)0819409146
StatePublished - 1993
Externally publishedYes
EventSoft X-Ray Microscopy - San Diego, CA, USA
Duration: Jul 19 1992Jul 21 1992


OtherSoft X-Ray Microscopy
CitySan Diego, CA, USA

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics


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